{"id":"https://openalex.org/W3029590232","doi":"https://doi.org/10.3233/jifs-192071","title":"Neighborhood preserving perceptual fidelity aware MSE for visual inspection of industrial flat surface products","display_name":"Neighborhood preserving perceptual fidelity aware MSE for visual inspection of industrial flat surface products","publication_year":2020,"publication_date":"2020-05-26","ids":{"openalex":"https://openalex.org/W3029590232","doi":"https://doi.org/10.3233/jifs-192071","mag":"3029590232"},"language":"en","primary_location":{"id":"doi:10.3233/jifs-192071","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-192071","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087621158","display_name":"Mustafa Ameen","orcid":null},"institutions":[{"id":"https://openalex.org/I159247623","display_name":"Mansoura University","ror":"https://ror.org/01k8vtd75","country_code":"EG","type":"education","lineage":["https://openalex.org/I159247623"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Mustafa Ameen","raw_affiliation_strings":["Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt","institution_ids":["https://openalex.org/I159247623"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115604088","display_name":"Mohammed Alrahmawy","orcid":"https://orcid.org/0009-0009-2719-3096"},"institutions":[{"id":"https://openalex.org/I159247623","display_name":"Mansoura University","ror":"https://ror.org/01k8vtd75","country_code":"EG","type":"education","lineage":["https://openalex.org/I159247623"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohammed Alrahmawy","raw_affiliation_strings":["Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt","institution_ids":["https://openalex.org/I159247623"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022833707","display_name":"Amal Aboueleneen","orcid":"https://orcid.org/0000-0001-9046-6813"},"institutions":[{"id":"https://openalex.org/I159247623","display_name":"Mansoura University","ror":"https://ror.org/01k8vtd75","country_code":"EG","type":"education","lineage":["https://openalex.org/I159247623"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Amal AbouEleneen","raw_affiliation_strings":["Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt","institution_ids":["https://openalex.org/I159247623"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103065774","display_name":"Ahmad A. Tolba","orcid":"https://orcid.org/0000-0003-0658-3553"},"institutions":[{"id":"https://openalex.org/I159247623","display_name":"Mansoura University","ror":"https://ror.org/01k8vtd75","country_code":"EG","type":"education","lineage":["https://openalex.org/I159247623"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ahmad Tolba","raw_affiliation_strings":["Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt","institution_ids":["https://openalex.org/I159247623"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5087621158"],"corresponding_institution_ids":["https://openalex.org/I159247623"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07191648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"39","issue":"1","first_page":"1183","last_page":"1196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7418720126152039},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7191230654716492},{"id":"https://openalex.org/keywords/extreme-learning-machine","display_name":"Extreme learning machine","score":0.7141299247741699},{"id":"https://openalex.org/keywords/gabor-filter","display_name":"Gabor filter","score":0.6124889254570007},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5573787689208984},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5564920902252197},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5417227745056152},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5416396856307983},{"id":"https://openalex.org/keywords/gabor-wavelet","display_name":"Gabor wavelet","score":0.4955099821090698},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.426962673664093},{"id":"https://openalex.org/keywords/high-fidelity","display_name":"High fidelity","score":0.42343127727508545},{"id":"https://openalex.org/keywords/perception","display_name":"Perception","score":0.4196082353591919},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.3125337064266205},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.28147485852241516},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.27113449573516846},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.14698725938796997},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.11618012189865112},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10269626975059509}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7418720126152039},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7191230654716492},{"id":"https://openalex.org/C2780150128","wikidata":"https://www.wikidata.org/wiki/Q21948731","display_name":"Extreme learning machine","level":3,"score":0.7141299247741699},{"id":"https://openalex.org/C2779883129","wikidata":"https://www.wikidata.org/wiki/Q2447890","display_name":"Gabor filter","level":3,"score":0.6124889254570007},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5573787689208984},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5564920902252197},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5417227745056152},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5416396856307983},{"id":"https://openalex.org/C136902061","wikidata":"https://www.wikidata.org/wiki/Q16981559","display_name":"Gabor wavelet","level":5,"score":0.4955099821090698},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.426962673664093},{"id":"https://openalex.org/C113364801","wikidata":"https://www.wikidata.org/wiki/Q26674","display_name":"High fidelity","level":2,"score":0.42343127727508545},{"id":"https://openalex.org/C26760741","wikidata":"https://www.wikidata.org/wiki/Q160402","display_name":"Perception","level":2,"score":0.4196082353591919},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.3125337064266205},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.28147485852241516},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.27113449573516846},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.14698725938796997},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.11618012189865112},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10269626975059509},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3233/jifs-192071","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-192071","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W172260869","https://openalex.org/W211198884","https://openalex.org/W1965895201","https://openalex.org/W1974136523","https://openalex.org/W1975920834","https://openalex.org/W1976606301","https://openalex.org/W1981605153","https://openalex.org/W1988963939","https://openalex.org/W1989830484","https://openalex.org/W2021158839","https://openalex.org/W2022977549","https://openalex.org/W2025285970","https://openalex.org/W2028418063","https://openalex.org/W2031821661","https://openalex.org/W2033890762","https://openalex.org/W2082265779","https://openalex.org/W2109782017","https://openalex.org/W2125238125","https://openalex.org/W2152057649","https://openalex.org/W2159479423","https://openalex.org/W2163251482","https://openalex.org/W2182957842","https://openalex.org/W2344428106","https://openalex.org/W2418691539","https://openalex.org/W2434005075","https://openalex.org/W2468676150","https://openalex.org/W2514405712","https://openalex.org/W2528999066","https://openalex.org/W2588050146","https://openalex.org/W2589306531","https://openalex.org/W2592902783","https://openalex.org/W2791709739","https://openalex.org/W2898089303","https://openalex.org/W2909546924","https://openalex.org/W2912589244"],"related_works":["https://openalex.org/W2070838085","https://openalex.org/W2374740620","https://openalex.org/W2495360253","https://openalex.org/W1811332408","https://openalex.org/W1560071024","https://openalex.org/W2518455383","https://openalex.org/W2559560477","https://openalex.org/W2009069257","https://openalex.org/W2228937159","https://openalex.org/W37053142"],"abstract_inverted_index":{"Automated":[0],"visual":[1],"inspection":[2,16,69],"is":[3,21,91,96],"becoming":[4],"an":[5],"important":[6],"field":[7],"of":[8,17,25,40,72,114,141],"computer":[9],"vision":[10],"in":[11,27,110,143],"many":[12,130],"industries.":[13],"The":[14,86,106,135],"real-time":[15],"flat":[18,74],"surface":[19,75],"products":[20],"a":[22,63],"task":[23],"full":[24],"challenges":[26],"industrial":[28,73],"aspects":[29],"that":[30,125],"requires":[31],"fast":[32,64],"and":[33,38,44,54,65,70,119,147],"accurate":[34,66],"algorithms":[35],"for":[36,68,93,103],"detection":[37,112,133],"localisation":[39],"defects.":[41,105],"Structural,":[42],"statistical":[43],"filter-based":[45],"approaches,":[46],"such":[47],"as":[48],"Gabor":[49],"Filter":[50],"Banks,":[51],"Log-Gabor":[52],"filter":[53],"Wavelets,":[55],"have":[56],"high":[57],"computational":[58],"complexity.":[59],"This":[60],"paper":[61],"introduces":[62],"model":[67,108,128],"localization":[71],"products:":[76],"Neighborhood":[77],"Preserving":[78],"Perceptual":[79],"Fidelity":[80],"Aware":[81],"Mean":[82],"Squared":[83],"Error":[84],"(NP-PAMSE).":[85],"Extreme":[87],"Learning":[88],"Machine":[89],"(ELM)":[90],"used":[92],"classification.":[94],"ELM":[95,142],"found":[97],"to":[98],"be":[99],"the":[100,126,139],"perfect":[101],"classifier":[102],"detecting":[104],"proposed":[107,127],"resulted":[109],"defect":[111,132],"accuracy":[113],"99.86%,":[115],"with":[116],"98.16%":[117],"sensitivity,":[118],"99.90%":[120],"specificity.":[121],"These":[122],"results":[123],"show":[124],"outperforms":[129],"existing":[131],"approaches.":[134],"discriminant":[136],"power":[137],"displays":[138],"efficiency":[140],"differentiation":[144],"between":[145],"normal":[146],"abnormal":[148],"surfaces.":[149]},"counts_by_year":[],"updated_date":"2026-02-07T06:11:34.122080","created_date":"2025-10-10T00:00:00"}