{"id":"https://openalex.org/W3036280041","doi":"https://doi.org/10.3233/jifs-192039","title":"Research on the fault diagnosis method for high-speed loom using rough set and Bayesian network","display_name":"Research on the fault diagnosis method for high-speed loom using rough set and Bayesian network","publication_year":2020,"publication_date":"2020-06-19","ids":{"openalex":"https://openalex.org/W3036280041","doi":"https://doi.org/10.3233/jifs-192039","mag":"3036280041"},"language":"en","primary_location":{"id":"doi:10.3233/jifs-192039","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-192039","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078883262","display_name":"Yanjun Xiao","orcid":"https://orcid.org/0000-0003-3299-9069"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanjun Xiao","raw_affiliation_strings":["Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087691444","display_name":"Heng Zhang","orcid":"https://orcid.org/0000-0001-7159-9725"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Heng Zhang","raw_affiliation_strings":["Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101436988","display_name":"Wei Zhou","orcid":"https://orcid.org/0000-0002-8477-9597"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhou","raw_affiliation_strings":["Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101839393","display_name":"Feng Wan","orcid":"https://orcid.org/0000-0002-0190-7144"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Wan","raw_affiliation_strings":["Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051679661","display_name":"Zhaozong Meng","orcid":"https://orcid.org/0000-0002-8159-7173"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhaozong Meng","raw_affiliation_strings":["Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Department of Measurement and Control, School of Mechanical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5051679661"],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":null,"apc_paid":null,"fwci":0.7356,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.7044599,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"39","issue":"1","first_page":"1147","last_page":"1161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9749000072479248,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11063","display_name":"Rough Sets and Fuzzy Logic","score":0.9498999714851379,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/loom","display_name":"LOOM","score":0.9115753173828125},{"id":"https://openalex.org/keywords/troubleshooting","display_name":"Troubleshooting","score":0.8060270547866821},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.6408854126930237},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.634468138217926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6162123084068298},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5503149628639221},{"id":"https://openalex.org/keywords/rough-set","display_name":"Rough set","score":0.5089056491851807},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.506928026676178},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5035461783409119},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4633766710758209},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.43070918321609497},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3028155267238617},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22531074285507202},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1391296684741974},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13407349586486816}],"concepts":[{"id":"https://openalex.org/C2778584943","wikidata":"https://www.wikidata.org/wiki/Q6459541","display_name":"LOOM","level":2,"score":0.9115753173828125},{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.8060270547866821},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.6408854126930237},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.634468138217926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6162123084068298},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5503149628639221},{"id":"https://openalex.org/C111012933","wikidata":"https://www.wikidata.org/wiki/Q3137210","display_name":"Rough set","level":2,"score":0.5089056491851807},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.506928026676178},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5035461783409119},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4633766710758209},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.43070918321609497},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3028155267238617},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22531074285507202},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1391296684741974},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13407349586486816},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3233/jifs-192039","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-192039","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W895272228","https://openalex.org/W1597576211","https://openalex.org/W1983638645","https://openalex.org/W1986084750","https://openalex.org/W1991150854","https://openalex.org/W2016931528","https://openalex.org/W2022874469","https://openalex.org/W2046958243","https://openalex.org/W2088448918","https://openalex.org/W2100028154","https://openalex.org/W2127512321","https://openalex.org/W2160617124","https://openalex.org/W2163698787","https://openalex.org/W2252087130","https://openalex.org/W2370500362","https://openalex.org/W2597349510","https://openalex.org/W2606788990","https://openalex.org/W2735118323","https://openalex.org/W2754791660","https://openalex.org/W2892613664","https://openalex.org/W2893747050","https://openalex.org/W2895905696","https://openalex.org/W2896406020","https://openalex.org/W2897079981","https://openalex.org/W2901042650","https://openalex.org/W2920979736","https://openalex.org/W2922879038","https://openalex.org/W2944494995","https://openalex.org/W2944653923","https://openalex.org/W2946250706","https://openalex.org/W2949096490","https://openalex.org/W2952319844","https://openalex.org/W2964481193","https://openalex.org/W2968163613","https://openalex.org/W2981752378"],"related_works":["https://openalex.org/W3013479934","https://openalex.org/W4318325534","https://openalex.org/W4240398146","https://openalex.org/W2467308209","https://openalex.org/W2913357653","https://openalex.org/W1981753479","https://openalex.org/W4312489236","https://openalex.org/W438422761","https://openalex.org/W4238338086","https://openalex.org/W2007305199"],"abstract_inverted_index":{"The":[0,158],"textile":[1,25],"industry":[2,26],"has":[3],"a":[4,8,53,91,130],"long":[5],"history":[6],"and":[7,35,44,62,85,102,119,121,126,138,165],"large":[9],"market":[10],"scale":[11],"around":[12],"the":[13,19,24,28,60,71,114,123,139,149,153,163,168,173],"world.":[14],"High-speed":[15],"loom":[16,55,66,97],"belongs":[17],"to":[18,40,76,112,147],"high-end":[20],"production":[21],"equipment":[22],"of":[23,30,64,73,116,141,167],"with":[27],"characteristics":[29],"high":[31,33,36],"precision,":[32],"speed":[34],"efficiency.":[37],"However,":[38],"due":[39],"its":[41],"expensive":[42],"cost":[43],"complex":[45],"structure,":[46],"there":[47],"might":[48],"be":[49],"significant":[50],"loss":[51],"once":[52],"high-speed":[54,65,96,174],"breaks":[56],"down.":[57],"At":[58],"present,":[59],"monitoring":[61],"troubleshooting":[63],"operation":[67],"mainly":[68],"depend":[69],"on":[70,99],"experience":[72],"maintenance":[74],"people":[75],"carry":[77],"out":[78],"inspections,":[79],"which":[80],"is":[81,105,110,136,145],"inefficient,":[82],"time-consuming,":[83],"laborious":[84],"less":[86],"efficient.":[87],"In":[88],"this":[89],"paper,":[90],"fault":[92,117,132,143],"diagnosis":[93,133,154,170],"method":[94,171],"for":[95,172],"based":[98],"rough":[100],"set":[101,108],"Bayesian":[103,131],"network":[104,134],"investigated.":[106],"Rough":[107],"theory":[109],"applied":[111],"reduce":[113],"attributes":[115],"causes":[118],"results":[120,155,160],"find":[122,148],"minimum":[124],"reduction":[125],"classification":[127],"rules.":[128],"Then,":[129],"model":[135],"built,":[137],"probability":[140],"each":[142],"cause":[144],"calculated":[146],"maximum":[150],"probability.":[151],"Finally,":[152],"are":[156],"obtained.":[157],"experimental":[159],"have":[161],"demonstrated":[162],"reliability":[164],"convenience":[166],"faults":[169],"loom.":[175]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}