{"id":"https://openalex.org/W2765331392","doi":"https://doi.org/10.3233/jcm-170774","title":"Optical properties of AlxIn1-xP ternary semiconductor alloys","display_name":"Optical properties of AlxIn1-xP ternary semiconductor alloys","publication_year":2017,"publication_date":"2017-10-17","ids":{"openalex":"https://openalex.org/W2765331392","doi":"https://doi.org/10.3233/jcm-170774","mag":"2765331392"},"language":"en","primary_location":{"id":"doi:10.3233/jcm-170774","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jcm-170774","pdf_url":null,"source":{"id":"https://openalex.org/S2765058733","display_name":"Journal of Computational Methods in Sciences and Engineering","issn_l":"1472-7978","issn":["1472-7978","1875-8983"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computational Methods in Sciences and Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008832550","display_name":"F. Mezrag","orcid":"https://orcid.org/0000-0001-6970-3191"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Fadila Mezrag","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5010651448","display_name":"N. Bouarissa","orcid":"https://orcid.org/0000-0003-0520-4099"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nadir Bouarissa","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5008832550"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.183,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58224995,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"18","issue":"1","first_page":"299","last_page":"305"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ternary-operation","display_name":"Ternary operation","score":0.7883730530738831},{"id":"https://openalex.org/keywords/pseudopotential","display_name":"Pseudopotential","score":0.7763758301734924},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.7558857202529907},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.7034133672714233},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6576350331306458},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6018972992897034},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.5951274633407593},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.46603792905807495},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.4464768171310425},{"id":"https://openalex.org/keywords/direct-and-indirect-band-gaps","display_name":"Direct and indirect band gaps","score":0.4452096223831177},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3940775394439697},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1686098873615265},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07335397601127625},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.058506548404693604}],"concepts":[{"id":"https://openalex.org/C64452783","wikidata":"https://www.wikidata.org/wiki/Q1524945","display_name":"Ternary operation","level":2,"score":0.7883730530738831},{"id":"https://openalex.org/C132378524","wikidata":"https://www.wikidata.org/wiki/Q769463","display_name":"Pseudopotential","level":2,"score":0.7763758301734924},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.7558857202529907},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.7034133672714233},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6576350331306458},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6018972992897034},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.5951274633407593},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.46603792905807495},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4464768171310425},{"id":"https://openalex.org/C193154288","wikidata":"https://www.wikidata.org/wiki/Q959336","display_name":"Direct and indirect band gaps","level":3,"score":0.4452096223831177},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3940775394439697},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1686098873615265},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07335397601127625},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.058506548404693604},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3233/jcm-170774","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jcm-170774","pdf_url":null,"source":{"id":"https://openalex.org/S2765058733","display_name":"Journal of Computational Methods in Sciences and Engineering","issn_l":"1472-7978","issn":["1472-7978","1875-8983"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computational Methods in Sciences and Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1598288026","https://openalex.org/W1799135963","https://openalex.org/W1977359474","https://openalex.org/W1993606885","https://openalex.org/W1993749918","https://openalex.org/W2000248752","https://openalex.org/W2002462912","https://openalex.org/W2006271366","https://openalex.org/W2016007691","https://openalex.org/W2023872575","https://openalex.org/W2035528728","https://openalex.org/W2037049830","https://openalex.org/W2059927111","https://openalex.org/W2064512419","https://openalex.org/W2068209615","https://openalex.org/W2071696576","https://openalex.org/W2076530968","https://openalex.org/W2088940560","https://openalex.org/W2101486074","https://openalex.org/W2106835007","https://openalex.org/W2132156663","https://openalex.org/W2140254237","https://openalex.org/W2163671698","https://openalex.org/W3102118310","https://openalex.org/W3161767227","https://openalex.org/W6668182928"],"related_works":["https://openalex.org/W1989182097","https://openalex.org/W2055755449","https://openalex.org/W2981512754","https://openalex.org/W4307348244","https://openalex.org/W3116928923","https://openalex.org/W4205669266","https://openalex.org/W2570194526","https://openalex.org/W2767392553","https://openalex.org/W2601377822","https://openalex.org/W3153563196"],"abstract_inverted_index":{"We":[0],"report":[1],"a":[2],"study":[3],"of":[4,22],"optical":[5,9],"properties,":[6],"namely":[7],"the":[8,12,16,38],"band":[10],"gaps,":[11],"refractive":[13],"index":[14],"and":[15,18],"high-frequency":[17],"static":[19],"dielectric":[20],"constants":[21],"zinc-blende":[23],"Al":[24],"x":[25],"In":[26],"1-x":[27],"P":[28],"ternary":[29],"semiconductor":[30],"alloys.":[31],"The":[32],"calculations":[33],"are":[34],"mainly":[35],"based":[36],"on":[37],"pse":[39]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-22T06:01:30.510260","created_date":"2025-10-10T00:00:00"}