{"id":"https://openalex.org/W2136592535","doi":"https://doi.org/10.3217/jucs-005-11-0765","title":"Matrix Method to Detect Logic Hazards in Combinational Circuits with EX-OR Gates","display_name":"Matrix Method to Detect Logic Hazards in Combinational Circuits with EX-OR Gates","publication_year":2020,"publication_date":"2020-04-07","ids":{"openalex":"https://openalex.org/W2136592535","doi":"https://doi.org/10.3217/jucs-005-11-0765","mag":"2136592535"},"language":"en","primary_location":{"id":"pmh:oai:zenodo.org:6995744","is_oa":true,"landing_page_url":"https://zenodo.org/record/6995744","pdf_url":"https://zenodo.org/record/6995744","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"JUCS - Journal of Universal Computer Science 5((11)) 765-776","raw_type":"info:eu-repo/semantics/article"},"type":"article","indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/6995744","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009074814","display_name":"Eng Chong Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"E. C. Tan","raw_affiliation_strings":["Nanyang Technological University"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057747097","display_name":"Minhtri Ho","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. H. Ho","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5009074814"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.2357,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.44281484,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13292","display_name":"Embedded Systems and FPGA Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6683682799339294},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4679647386074066},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.4410150945186615},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4300176203250885},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4018663763999939},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37463921308517456},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23109745979309082},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15925249457359314},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.12122252583503723}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6683682799339294},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4679647386074066},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.4410150945186615},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4300176203250885},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4018663763999939},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37463921308517456},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23109745979309082},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15925249457359314},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.12122252583503723},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"pmh:oai:zenodo.org:6995744","is_oa":true,"landing_page_url":"https://zenodo.org/record/6995744","pdf_url":"https://zenodo.org/record/6995744","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"JUCS - Journal of Universal Computer Science 5((11)) 765-776","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.103.3296","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.103.3296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.jucs.org/jucs_5_11/matrix_method_to_detect/Tan_E_C.pdf","raw_type":"text"},{"id":"doi:10.3217/jucs-005-11-0765","is_oa":true,"landing_page_url":"https://doi.org/10.3217/jucs-005-11-0765","pdf_url":null,"source":{"id":"https://openalex.org/S4306400660","display_name":"TUGraz OPEN Library (Graz University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4092182","host_organization_name":"Graz University of Technology","host_organization_lineage":["https://openalex.org/I4092182"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:6995744","is_oa":true,"landing_page_url":"https://zenodo.org/record/6995744","pdf_url":"https://zenodo.org/record/6995744","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"JUCS - Journal of Universal Computer Science 5((11)) 765-776","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2136592535.pdf","grobid_xml":"https://content.openalex.org/works/W2136592535.grobid-xml"},"referenced_works_count":13,"referenced_works":["https://openalex.org/W254333124","https://openalex.org/W1551512938","https://openalex.org/W1604154703","https://openalex.org/W1643036023","https://openalex.org/W1966493931","https://openalex.org/W2015937883","https://openalex.org/W2038539185","https://openalex.org/W2065863941","https://openalex.org/W2078865425","https://openalex.org/W2102535682","https://openalex.org/W2120688461","https://openalex.org/W2143806343","https://openalex.org/W2160776998"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W3167886223","https://openalex.org/W2098694303","https://openalex.org/W2544423928","https://openalex.org/W2052122378","https://openalex.org/W2053286651","https://openalex.org/W2074526596","https://openalex.org/W2169337913","https://openalex.org/W4242010157"],"abstract_inverted_index":{"A":[0],"matrix":[1],"method":[2,21],"is":[3],"extended":[4],"to":[5,55],"include":[6],"the":[7,20,44,47,57],"detection":[8],"of":[9,30,37,46,59],"logic":[10,14],"hazards":[11],"in":[12,33],"combinational":[13],"circuits":[15],"involving":[16],"EX-OR":[17],"gates.":[18],"Essentially,":[19],"generates":[22],"0-":[23],"and":[24,28],"1-sets,":[25],"or":[26,61],"P-":[27],"S-sets,":[29],"all":[31],"nodes":[32],"each":[34],"gate":[35],"level":[36],"a":[38],"circuit":[39],"progressively":[40],"until":[41],"it":[42],"reaches":[43],"output":[45],"circuit.":[48],"The":[49],"sets":[50],"generated":[51],"are":[52],"subsequently":[53],"used":[54],"determine":[56],"existence":[58],"static":[60],"dynamic":[62],"hazards.":[63]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}