{"id":"https://openalex.org/W4245253734","doi":"https://doi.org/10.3166/ejc.13.416-418","title":"Discussion on: Digital Control of Interferometric Metrology Lines","display_name":"Discussion on: Digital Control of Interferometric Metrology Lines","publication_year":2007,"publication_date":"2007-08-30","ids":{"openalex":"https://openalex.org/W4245253734","doi":"https://doi.org/10.3166/ejc.13.416-418"},"language":"en","primary_location":{"id":"doi:10.3166/ejc.13.416-418","is_oa":false,"landing_page_url":"https://doi.org/10.3166/ejc.13.416-418","pdf_url":null,"source":{"id":"https://openalex.org/S21401918","display_name":"European Journal of Control","issn_l":"0947-3580","issn":["0947-3580","1435-5671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"European Journal of Control","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102401965","display_name":"Michele Basso","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Michele Basso","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5058663513","display_name":"Donatello Materassi","orcid":"https://orcid.org/0000-0002-4736-8377"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Donatello Materassi","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102401965"],"corresponding_institution_ids":[],"apc_list":{"value":2850,"currency":"USD","value_usd":2850},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.60738556,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":"4","first_page":"416","last_page":"418"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9772999882698059,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9772999882698059,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.965399980545044,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8414270281791687},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.6513340473175049},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33473363518714905},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33120232820510864},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27438634634017944},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.27087146043777466}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8414270281791687},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6513340473175049},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33473363518714905},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33120232820510864},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27438634634017944},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.27087146043777466}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3166/ejc.13.416-418","is_oa":false,"landing_page_url":"https://doi.org/10.3166/ejc.13.416-418","pdf_url":null,"source":{"id":"https://openalex.org/S21401918","display_name":"European Journal of Control","issn_l":"0947-3580","issn":["0947-3580","1435-5671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"European Journal of Control","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2392646414","https://openalex.org/W2174860717","https://openalex.org/W1988809445","https://openalex.org/W2590542424","https://openalex.org/W2180015210","https://openalex.org/W2110528520"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}