{"id":"https://openalex.org/W4382562296","doi":"https://doi.org/10.23919/mipro57284.2023.10159811","title":"Stress-Dependent MOSFET Model for Use in Circuit Simulations","display_name":"Stress-Dependent MOSFET Model for Use in Circuit Simulations","publication_year":2023,"publication_date":"2023-05-22","ids":{"openalex":"https://openalex.org/W4382562296","doi":"https://doi.org/10.23919/mipro57284.2023.10159811"},"language":"en","primary_location":{"id":"doi:10.23919/mipro57284.2023.10159811","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mipro57284.2023.10159811","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 46th MIPRO ICT and Electronics Convention (MIPRO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016892199","display_name":"Andro \u017damboki","orcid":null},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":true,"raw_author_name":"Andro \u017damboki","raw_affiliation_strings":["University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","institution_ids":["https://openalex.org/I181343428"]},{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047211630","display_name":"Leo Go\u010dan","orcid":null},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Leo Go\u010dan","raw_affiliation_strings":["University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","institution_ids":["https://openalex.org/I181343428"]},{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087900596","display_name":"Josip Mikuli\u0107","orcid":"https://orcid.org/0000-0001-6399-0847"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Josip Mikuli\u0107","raw_affiliation_strings":["ams-OSRAM AG,Premstaetten,Austria","ams-OSRAM AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams-OSRAM AG,Premstaetten,Austria","institution_ids":["https://openalex.org/I154481106"]},{"raw_affiliation_string":"ams-OSRAM AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076920858","display_name":"Niko Bako","orcid":"https://orcid.org/0000-0001-6768-4433"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Niko Bako","raw_affiliation_strings":["ams-OSRAM AG,Premstaetten,Austria","ams-OSRAM AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams-OSRAM AG,Premstaetten,Austria","institution_ids":["https://openalex.org/I154481106"]},{"raw_affiliation_string":"ams-OSRAM AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041976550","display_name":"Gregor Schatzberger","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Gregor Schatzberger","raw_affiliation_strings":["ams-OSRAM AG,Premstaetten,Austria","ams-OSRAM AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams-OSRAM AG,Premstaetten,Austria","institution_ids":["https://openalex.org/I154481106"]},{"raw_affiliation_string":"ams-OSRAM AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074127540","display_name":"Tomislav Markovi\u0107","orcid":"https://orcid.org/0000-0002-9645-5565"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Tomislav Markovi\u0107","raw_affiliation_strings":["University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","institution_ids":["https://openalex.org/I181343428"]},{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021811907","display_name":"Adrijan Bari\u0107","orcid":"https://orcid.org/0000-0001-5642-3086"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Adrijan Bari\u0107","raw_affiliation_strings":["University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia","institution_ids":["https://openalex.org/I181343428"]},{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5016892199"],"corresponding_institution_ids":["https://openalex.org/I181343428"],"apc_list":null,"apc_paid":null,"fwci":0.9382,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.74267895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"184","last_page":"189"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.7199438810348511},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6661596298217773},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5875694751739502},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5707231760025024},{"id":"https://openalex.org/keywords/transistor-model","display_name":"Transistor model","score":0.5489889979362488},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5045000314712524},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.45617955923080444},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4501393735408783},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42676737904548645},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.42322638630867004},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39821240305900574},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23647403717041016},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2184481918811798},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.19195690751075745},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.15367576479911804},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08214825391769409}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7199438810348511},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6661596298217773},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5875694751739502},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5707231760025024},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.5489889979362488},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5045000314712524},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.45617955923080444},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4501393735408783},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42676737904548645},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.42322638630867004},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39821240305900574},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23647403717041016},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2184481918811798},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.19195690751075745},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.15367576479911804},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08214825391769409},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/mipro57284.2023.10159811","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mipro57284.2023.10159811","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 46th MIPRO ICT and Electronics Convention (MIPRO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6600000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2038798773","https://openalex.org/W2055904072","https://openalex.org/W2061821008","https://openalex.org/W2112874751","https://openalex.org/W2159310815","https://openalex.org/W2169471935","https://openalex.org/W2212758293","https://openalex.org/W2792583625","https://openalex.org/W2969281644","https://openalex.org/W3159537207"],"related_works":["https://openalex.org/W2548594263","https://openalex.org/W4386066422","https://openalex.org/W2966234605","https://openalex.org/W2540368402","https://openalex.org/W2965486524","https://openalex.org/W2150725458","https://openalex.org/W1591186069","https://openalex.org/W2533036699","https://openalex.org/W1927754086","https://openalex.org/W2172415194"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,37,86,98],"stress-dependent":[4,87],"MOSFET":[5,88],"model":[6,89,121],"based":[7],"on":[8,72,130],"existing":[9,94],"transistor":[10,95,108],"models.":[11],"The":[12],"encapsulation":[13,33],"of":[14,40,70],"chips":[15],"is":[16,90],"often":[17],"made":[18],"from":[19],"polymers":[20],"(such":[21],"as":[22],"epoxy)":[23],"which":[24,47],"are":[25],"poured":[26],"over":[27],"the":[28,32,45,54,58,68,127],"silicon":[29],"chips.":[30],"When":[31],"cools,":[34],"it":[35],"generates":[36],"significant":[38],"amount":[39],"static":[41],"mechanical":[42],"stress":[43,71,77,128],"in":[44,113],"ICs":[46],"changes":[48],"their":[49,73],"performance.":[50],"To":[51],"compensate":[52],"for":[53],"offsets":[55],"caused":[56],"by":[57,92],"stress,":[59],"chip":[60],"designers":[61],"need":[62],"to":[63,66,125,133],"be":[64,111,123],"able":[65],"simulate":[67,126],"effects":[69,129],"circuits":[74,131],"and":[75,79,97,106,132,135],"design":[76,134],"sensors":[78],"active":[80],"stress-compensating":[81,137],"circuits.":[82,138],"In":[83,101],"this":[84,102,120],"paper,":[85],"implemented":[91],"combining":[93],"models":[96],"Verilog-A":[99],"cell.":[100],"way,":[103],"temperature,":[104],"corner":[105],"other":[107],"variations":[109],"can":[110,122],"simulated":[112],"combination":[114],"with":[115],"stress.":[116],"Simulations":[117],"show":[118],"that":[119],"used":[124],"optimize":[136]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}