{"id":"https://openalex.org/W2735708620","doi":"https://doi.org/10.23919/mipro.2017.7973411","title":"FEM analysis and design of a voltage instrument transformer for digital sampling wattmeter","display_name":"FEM analysis and design of a voltage instrument transformer for digital sampling wattmeter","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2735708620","doi":"https://doi.org/10.23919/mipro.2017.7973411","mag":"2735708620"},"language":"en","primary_location":{"id":"doi:10.23919/mipro.2017.7973411","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mipro.2017.7973411","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007093478","display_name":"Martin Dadi\u0107","orcid":"https://orcid.org/0000-0001-7446-0024"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":true,"raw_author_name":"Martin Dadic","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063351794","display_name":"Karlo Petrovi\u0107","orcid":"https://orcid.org/0009-0005-4279-8975"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Karlo Petrovic","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078267585","display_name":"Roman Malari\u0107","orcid":"https://orcid.org/0000-0003-3097-2217"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Roman Malaric","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5007093478"],"corresponding_institution_ids":["https://openalex.org/I181343428"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58673669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"16","issue":null,"first_page":"166","last_page":"170"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multimeter","display_name":"Multimeter","score":0.6273422837257385},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6154093146324158},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5866712927818298},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5564506649971008},{"id":"https://openalex.org/keywords/galvanic-isolation","display_name":"Galvanic isolation","score":0.5123730897903442},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5061895251274109},{"id":"https://openalex.org/keywords/metering-mode","display_name":"Metering mode","score":0.4576306939125061},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.431916207075119},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41067689657211304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38375023007392883}],"concepts":[{"id":"https://openalex.org/C103185065","wikidata":"https://www.wikidata.org/wiki/Q189996","display_name":"Multimeter","level":3,"score":0.6273422837257385},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6154093146324158},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5866712927818298},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5564506649971008},{"id":"https://openalex.org/C70234604","wikidata":"https://www.wikidata.org/wiki/Q780813","display_name":"Galvanic isolation","level":4,"score":0.5123730897903442},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5061895251274109},{"id":"https://openalex.org/C30905978","wikidata":"https://www.wikidata.org/wiki/Q815598","display_name":"Metering mode","level":2,"score":0.4576306939125061},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.431916207075119},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41067689657211304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38375023007392883},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/mipro.2017.7973411","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mipro.2017.7973411","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W579496837","https://openalex.org/W2043453307","https://openalex.org/W2103937464","https://openalex.org/W2110666417","https://openalex.org/W2483046186","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2375147236","https://openalex.org/W2366204932","https://openalex.org/W2387276603","https://openalex.org/W3206226854","https://openalex.org/W1011722972","https://openalex.org/W2032931220","https://openalex.org/W2113376802","https://openalex.org/W2366713371","https://openalex.org/W2362469905","https://openalex.org/W4206232690"],"abstract_inverted_index":{"A":[0],"voltage":[1,7,33],"instrument":[2],"transformer":[3,121],"(VIT)":[4],"or":[5],"a":[6,12,23,60,77,84,105,112],"divider":[8],"is":[9,20,34,87,133],"needed":[10],"if":[11],"National":[13],"Instruments":[14],"PXI":[15],"4461":[16],"Dynamic":[17],"Signal":[18],"Analyzer":[19],"used":[21],"in":[22,69],"digital":[24,106,108],"sampling":[25],"wattmeter":[26],"application.":[27],"They":[28],"assure":[29],"that":[30],"the":[31,37,41,48,74,95,102,117,120,123,129],"input":[32],"lowered":[35],"to":[36],"allowed":[38],"level":[39],"of":[40,56,59,76,119],"acquisition":[42],"card,":[43],"and":[44,64,89,94,111,127],"VIT":[45,61,86],"also":[46],"gives":[47],"galvanic":[49],"isolation.":[50],"This":[51],"paper":[52],"discusses":[53],"possible":[54],"types":[55],"sectionalized":[57],"windings":[58],"with":[62],"primary":[63],"secondary":[65],"interleave,":[66],"which":[67],"result":[68],"lower":[70],"leakage":[71],"inductances.":[72],"On":[73],"basis":[75],"detailed":[78],"finite":[79],"element":[80],"method":[81],"(FEM)":[82],"analysis,":[83],"prototype":[85,103],"designed":[88],"produced.":[90],"The":[91],"ratio":[92],"error":[93,98],"phase":[96],"angle":[97],"are":[99],"measured":[100],"on":[101],"using":[104],"calibrator,":[107],"multimeter":[109],"(DMM)":[110],"phase-angle":[113],"meter.":[114],"As":[115],"well,":[116],"performance":[118],"over":[122],"wider":[124],"frequency":[125],"bandwidth":[126],"under":[128],"harmonically":[130],"rich":[131],"excitation":[132],"experimentally":[134],"investigated.":[135]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}