{"id":"https://openalex.org/W4385212565","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185360","title":"Self-Referenced Design-Agnostic Laser Voltage Probing Attack Detection with 100% Protection Coverage, 58% Area Overhead for Automated Design","display_name":"Self-Referenced Design-Agnostic Laser Voltage Probing Attack Detection with 100% Protection Coverage, 58% Area Overhead for Automated Design","publication_year":2023,"publication_date":"2023-06-11","ids":{"openalex":"https://openalex.org/W4385212565","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185360"},"language":"en","primary_location":{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185360","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185360","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100323571","display_name":"Hui Zhang","orcid":"https://orcid.org/0009-0003-9546-6208"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Hui Zhang","raw_affiliation_strings":["National University of Singapore,Singapore","National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore,Singapore","institution_ids":["https://openalex.org/I165932596"]},{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021091015","display_name":"Longyang Lin","orcid":"https://orcid.org/0000-0002-4702-737X"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longyang Lin","raw_affiliation_strings":["Presently with Southern University of Science and Technology,Shenzhen,China","Presently with Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Presently with Southern University of Science and Technology,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]},{"raw_affiliation_string":"Presently with Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077468706","display_name":"Qiang Fang","orcid":"https://orcid.org/0000-0002-4569-9893"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Qiang Fang","raw_affiliation_strings":["National University of Singapore,Singapore","National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore,Singapore","institution_ids":["https://openalex.org/I165932596"]},{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092532772","display_name":"Udara Samurdhi Harshanga Kalingage","orcid":null},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Udara Samurdhi Harshanga Kalingage","raw_affiliation_strings":["National University of Singapore,Singapore","National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore,Singapore","institution_ids":["https://openalex.org/I165932596"]},{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052037141","display_name":"Massimo Alioto","orcid":"https://orcid.org/0000-0002-4127-8258"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Massimo Alioto","raw_affiliation_strings":["National University of Singapore,Singapore","National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore,Singapore","institution_ids":["https://openalex.org/I165932596"]},{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100323571"],"corresponding_institution_ids":["https://openalex.org/I165932596"],"apc_list":null,"apc_paid":null,"fwci":0.5224,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.64187511,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.8033552169799805},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6814783811569214},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6232964992523193},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.46002665162086487},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4203435182571411},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18133851885795593},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12413781881332397}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.8033552169799805},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6814783811569214},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6232964992523193},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46002665162086487},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4203435182571411},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18133851885795593},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12413781881332397},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185360","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185360","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W4386582991"],"abstract_inverted_index":{"A":[0],"self-referenced":[1],"distributed":[2],"on-chip":[3],"scheme":[4],"is":[5],"introduced":[6],"to":[7,44],"achieve":[8],"continuous":[9],"detection":[10],"of":[11],"laser":[12],"voltage":[13],"probing":[14],"(LVP)":[15],"attacks":[16],"against":[17],"digital":[18],"IPs":[19],"with":[20],"full-area":[21],"coverage":[22],"via":[23],"temperature":[24],"sensing.":[25],"Calibration-free,":[26],"automated":[27],"and":[28],"design-agnostic":[29],"adoption":[30],"are":[31],"enabled":[32],"by":[33],"a":[34,38],"stdcell-based":[35],"approach,":[36],"offering":[37],"2.5X":[39],"area":[40],"overhead":[41],"reduction":[42],"compared":[43],"prior":[45],"art.":[46]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}
