{"id":"https://openalex.org/W4385216994","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185328","title":"A Low-Voltage Area-Efficient TSV I/O for HBM with Data Rate up to 15Gb/s Featuring Overlapped Multiplexing Driver, ISI Compensators and QEC","display_name":"A Low-Voltage Area-Efficient TSV I/O for HBM with Data Rate up to 15Gb/s Featuring Overlapped Multiplexing Driver, ISI Compensators and QEC","publication_year":2023,"publication_date":"2023-06-11","ids":{"openalex":"https://openalex.org/W4385216994","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185328"},"language":"en","primary_location":{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185328","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185328","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052655035","display_name":"Taeryeong Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I2801047068","display_name":"University Health System","ror":"https://ror.org/01d9cs377","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2801047068"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Taeryeong Kim","raw_affiliation_strings":["Yonsei University,VLSI System Lab","VLSI System Lab, Yonsei University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,VLSI System Lab","institution_ids":["https://openalex.org/I2801047068","https://openalex.org/I4210160791"]},{"raw_affiliation_string":"VLSI System Lab, Yonsei University","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100420165","display_name":"Ji Young Kim","orcid":"https://orcid.org/0000-0002-4523-6047"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I2801047068","display_name":"University Health System","ror":"https://ror.org/01d9cs377","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2801047068"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Ji-Young Kim","raw_affiliation_strings":["Yonsei University,VLSI System Lab","VLSI System Lab, Yonsei University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,VLSI System Lab","institution_ids":["https://openalex.org/I2801047068","https://openalex.org/I4210160791"]},{"raw_affiliation_string":"VLSI System Lab, Yonsei University","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002210592","display_name":"Jeonghyeok You","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I2801047068","display_name":"University Health System","ror":"https://ror.org/01d9cs377","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2801047068"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Jeonghyeok You","raw_affiliation_strings":["Yonsei University,VLSI System Lab","VLSI System Lab, Yonsei University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,VLSI System Lab","institution_ids":["https://openalex.org/I2801047068","https://openalex.org/I4210160791"]},{"raw_affiliation_string":"VLSI System Lab, Yonsei University","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112966088","display_name":"Hohyun Chae","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I2801047068","display_name":"University Health System","ror":"https://ror.org/01d9cs377","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2801047068"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Hohyun Chae","raw_affiliation_strings":["Yonsei University,VLSI System Lab","VLSI System Lab, Yonsei University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,VLSI System Lab","institution_ids":["https://openalex.org/I2801047068","https://openalex.org/I4210160791"]},{"raw_affiliation_string":"VLSI System Lab, Yonsei University","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079699243","display_name":"Byoung Mo Moon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byoung Mo Moon","raw_affiliation_strings":["Samsung Electronics Co., Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Co., Ltd","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050861404","display_name":"Kyomin Sohn","orcid":"https://orcid.org/0000-0002-8094-9843"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyomin Sohn","raw_affiliation_strings":["Samsung Electronics Co., Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Co., Ltd","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037010076","display_name":"Seong\u2010Ook Jung","orcid":"https://orcid.org/0000-0003-0757-2581"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I2801047068","display_name":"University Health System","ror":"https://ror.org/01d9cs377","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2801047068"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Seong-Ook Jung","raw_affiliation_strings":["Yonsei University,VLSI System Lab","VLSI System Lab, Yonsei University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,VLSI System Lab","institution_ids":["https://openalex.org/I2801047068","https://openalex.org/I4210160791"]},{"raw_affiliation_string":"VLSI System Lab, Yonsei University","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4909,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63345603,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiplexing","display_name":"Multiplexing","score":0.6197349429130554},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5713693499565125},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5445828437805176},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5347238183021545},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48218217492103577},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.47264331579208374},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36396539211273193},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29564642906188965},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08955404162406921}],"concepts":[{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.6197349429130554},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5713693499565125},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5445828437805176},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5347238183021545},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48218217492103577},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.47264331579208374},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36396539211273193},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29564642906188965},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08955404162406921}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185328","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185328","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2038858740","https://openalex.org/W2109445684","https://openalex.org/W2081082331"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"low-voltage":[4],"area-efficient":[5],"through-silicon":[6],"via":[7],"(TSV)":[8],"I/O":[9,33],"for":[10],"the":[11],"high-bandwidth":[12],"memory":[13],"utilizing":[14],"overlapped":[15],"multiplexing":[16],"driver,":[17],"ISI":[18],"compensators":[19],"(hybrid":[20],"equalizer,":[21],"direct":[22],"feedback":[23],"1-tap":[24],"DFE)":[25],"and":[26,51],"quadrature":[27],"error":[28],"corrector.":[29],"The":[30],"proposed":[31],"TSV":[32],"is":[34],"implemented":[35],"in":[36],"65nm":[37],"CMOS":[38],"process":[39],"with":[40,55,62],"emulated":[41],"12-stacked":[42],"TSV.":[43],"Measurement":[44],"results":[45],"show":[46],"energy":[47],"efficiency":[48],"of":[49],"0.145pJ/b/pF":[50],"30%":[52],"timing":[53],"margin":[54],"BER":[56],"$\\lt":[57],"10":[58],"^{-12}$":[59],"at":[60],"15Gb/s":[61],"PRBS-31.":[63]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}