{"id":"https://openalex.org/W4385213418","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185322","title":"A 3-320 fJ/conv.step Continuous Time Level Crossing ADC with Dynamic Self-Biasing Comparators Achieving 61.4 dB-SNDR","display_name":"A 3-320 fJ/conv.step Continuous Time Level Crossing ADC with Dynamic Self-Biasing Comparators Achieving 61.4 dB-SNDR","publication_year":2023,"publication_date":"2023-06-11","ids":{"openalex":"https://openalex.org/W4385213418","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185322"},"language":"en","primary_location":{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185322","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185322","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004374867","display_name":"Martijn Timmermans","orcid":"https://orcid.org/0009-0005-4286-7475"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Martijn Timmermans","raw_affiliation_strings":["Eindhoven University of Technology,Eindhoven,the Netherlands","Eindhoven University of Technology, Eindhoven, the Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology,Eindhoven,the Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, the Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073904718","display_name":"Marco Fattori","orcid":"https://orcid.org/0000-0001-6357-7614"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Marco Fattori","raw_affiliation_strings":["Eindhoven University of Technology,Eindhoven,the Netherlands","Eindhoven University of Technology, Eindhoven, the Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology,Eindhoven,the Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, the Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010280308","display_name":"Pieter Harpe","orcid":"https://orcid.org/0000-0002-6542-0001"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Pieter Harpe","raw_affiliation_strings":["Eindhoven University of Technology,Eindhoven,the Netherlands","Eindhoven University of Technology, Eindhoven, the Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology,Eindhoven,the Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, the Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014768168","display_name":"Yao\u2010Hong Liu","orcid":"https://orcid.org/0000-0002-3256-6741"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Yao-Hong Liu","raw_affiliation_strings":["Imec-Netherlands,Eindhoven,the Netherlands","Imec-Netherlands, Eindhoven, the Netherlands"],"affiliations":[{"raw_affiliation_string":"Imec-Netherlands,Eindhoven,the Netherlands","institution_ids":["https://openalex.org/I196972281"]},{"raw_affiliation_string":"Imec-Netherlands, Eindhoven, the Netherlands","institution_ids":["https://openalex.org/I196972281"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051691710","display_name":"Eugenio Cantatore","orcid":"https://orcid.org/0000-0002-9646-7232"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Eugenio Cantatore","raw_affiliation_strings":["Eindhoven University of Technology,Eindhoven,the Netherlands","Eindhoven University of Technology, Eindhoven, the Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology,Eindhoven,the Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, the Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5004374867"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":0.7694,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.67499854,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.9080538153648376},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.6441975831985474},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5406162142753601},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5087702870368958},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.505624532699585},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4899546205997467},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4835386276245117},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2943720519542694},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28249186277389526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24001652002334595},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11737772822380066}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.9080538153648376},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.6441975831985474},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5406162142753601},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5087702870368958},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.505624532699585},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4899546205997467},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4835386276245117},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2943720519542694},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28249186277389526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24001652002334595},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11737772822380066},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185322","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185322","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire_cris_publications/5bb50925-29d7-4da3-9d38-3ac4ee12d491","is_oa":false,"landing_page_url":"https://www.scopus.com/pages/publications/85167612885","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Timmermans, M, Fattori, M, Harpe, P, Liu, Y-H & Cantatore, E 2023, A 3-320 fJ/conv.step Continuous Time Level Crossing ADC with Dynamic Self-Biasing Comparators Achieving 61.4 dB-SNDR. in 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023., 10185322, Institute of Electrical and Electronics Engineers, 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023, Kyoto, Japan, 11/06/23. https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185322","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:pure.tue.nl:publications/5bb50925-29d7-4da3-9d38-3ac4ee12d491","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/5bb50925-29d7-4da3-9d38-3ac4ee12d491","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Timmermans, M, Fattori, M, Harpe, P, Liu, Y-H & Cantatore, E 2023, A 3-320 fJ/conv.step Continuous Time Level Crossing ADC with Dynamic Self-Biasing Comparators Achieving 61.4 dB-SNDR. in 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023., 10185322, Institute of Electrical and Electronics Engineers, 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023, Kyoto, Japan, 11/06/23. https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185322","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2773332960","https://openalex.org/W1554546639","https://openalex.org/W2039094674","https://openalex.org/W2102547785","https://openalex.org/W2922086473","https://openalex.org/W2083432647","https://openalex.org/W1777188466","https://openalex.org/W2040573219","https://openalex.org/W2041057635","https://openalex.org/W3155667228"],"abstract_inverted_index":{"This":[0,32],"paper":[1],"presents":[2],"a":[3,29,48,55],"level":[4],"crossing":[5],"ADC":[6,12],"(LC-ADC)":[7],"for":[8,66],"biomedical":[9],"applications.":[10],"The":[11],"uses":[13],"dynamically":[14],"biased":[15],"comparators,":[16],"which":[17],"require":[18],"minimal":[19],"power":[20,37],"when":[21,43],"the":[22,52],"input":[23,68],"voltage":[24],"is":[25],"far":[26],"away":[27],"from":[28],"decision":[30],"threshold.":[31],"results":[33],"in":[34,60],">10x":[35],"better":[36],"efficiency":[38,62],"compared":[39],"to":[40],"prior":[41],"LC-ADCs":[42],"converting":[44],"sparse":[45,67],"signals.":[46,69],"In":[47],"16":[49],"kHz":[50],"bandwidth,":[51],"LC-ADC":[53],"achieves":[54],"61.4":[56],"dB":[57],"SNDR":[58],"resulting":[59],"an":[61],"of":[63],"3":[64],"fJ/conv.step":[65]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}