{"id":"https://openalex.org/W4385213968","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185236","title":"First Study of the Charge Trapping Aggravation Induced by Anti-Ferroelectric Switching in the MFIS Stack","display_name":"First Study of the Charge Trapping Aggravation Induced by Anti-Ferroelectric Switching in the MFIS Stack","publication_year":2023,"publication_date":"2023-06-11","ids":{"openalex":"https://openalex.org/W4385213968","doi":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185236"},"language":"en","primary_location":{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185236","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086756993","display_name":"Zuopu Zhou","orcid":"https://orcid.org/0000-0003-4812-8524"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zuopu Zhou","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005366342","display_name":"Leming Jiao","orcid":"https://orcid.org/0000-0002-2562-7630"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Leming Jiao","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000856188","display_name":"Zijie Zheng","orcid":"https://orcid.org/0000-0001-8265-6019"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zijie Zheng","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089414360","display_name":"Xiaolin Wang","orcid":"https://orcid.org/0000-0002-2131-4178"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Xiaolin Wang","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100366092","display_name":"Dong Zhang","orcid":"https://orcid.org/0000-0002-0821-5538"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Dong Zhang","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075633314","display_name":"Kai Ni","orcid":"https://orcid.org/0000-0002-3628-3431"},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kai Ni","raw_affiliation_strings":["Rochester Institute of Technology,Department of Electrical and Microelectronic Engineering,Rochester,NY,USA,14623"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rochester Institute of Technology,Department of Electrical and Microelectronic Engineering,Rochester,NY,USA,14623","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014399843","display_name":"Xiao Gong","orcid":"https://orcid.org/0000-0002-9243-1937"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Xiao Gong","raw_affiliation_strings":["National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Singapore (NUS),Department of Electrical and Computer Engineering,Singapore,117576","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.953000009059906,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.860149621963501},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.6628565788269043},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6465914249420166},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6212617754936218},{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.617158055305481},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.4943859577178955},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.4458402991294861},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.4111778438091278},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.4081125259399414},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4056793451309204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3312923312187195},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28233009576797485},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2499367892742157},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.13308793306350708},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11864122748374939}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.860149621963501},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.6628565788269043},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6465914249420166},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6212617754936218},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.617158055305481},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.4943859577178955},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.4458402991294861},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.4111778438091278},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4081125259399414},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4056793451309204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3312923312187195},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28233009576797485},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2499367892742157},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.13308793306350708},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11864122748374939},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/vlsitechnologyandcir57934.2023.10185236","is_oa":false,"landing_page_url":"https://doi.org/10.23919/vlsitechnologyandcir57934.2023.10185236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309679","display_name":"Applied Materials","ror":"https://ror.org/04h1q4c89"},{"id":"https://openalex.org/F4320311687","display_name":"Ministry of Education","ror":"https://ror.org/03m01yf64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2007742350","https://openalex.org/W2380576232","https://openalex.org/W2795319754","https://openalex.org/W2937054111","https://openalex.org/W2066223521","https://openalex.org/W2013178899","https://openalex.org/W373327546","https://openalex.org/W1993368695","https://openalex.org/W2245347530","https://openalex.org/W2011451034"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"perform":[4],"systematic":[5],"and":[6,15,26,40,48,91],"deep":[7],"understanding":[8],"of":[9,46,118,126],"the":[10,33,43,52,58,64,106,116,120,124],"interplay":[11],"between":[12],"polarization":[13],"switching":[14,50],"charge":[16],"trapping":[17],"(CT)":[18],"for":[19,123],"both":[20],"ferroelectric":[21],"(FE)":[22],"metal-ferroelectric-insulator-semiconductor":[23],"(MFIS)":[24],"stack":[25],"anti-ferroelectric":[27],"(AFE)":[28],"MFIS":[29],"stack.":[30],"Assisted":[31],"by":[32,63,105],"simulation":[34],"with":[35,110],"a":[36,69,97],"unified":[37],"FE/AFE":[38],"model":[39,72],"CT":[41,53,60,89],"model,":[42],"different":[44],"roles":[45],"FE":[47],"AFE":[49,107,121],"in":[51],"process":[54],"are":[55],"unraveled,":[56],"high-lighting":[57],"aggravated":[59],"effect":[61],"induced":[62],"AFE.":[65],"We":[66],"further":[67],"build":[68],"comprehensive":[70],"FeFET":[71],"considering":[73],"(a)":[74],"phase":[75,108,122],"fluctuation":[76],"among":[77],"FE/AFE/dielectric":[78],"(DE)":[79],"phases,":[80],"(b)":[81],"E":[82],"<inf":[83],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[84],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">C</inf>":[85],"variation,":[86],"(c)":[87],"un-uniform":[88],"process,":[90],"(d)":[92],"channel":[93],"percolation,":[94],"which":[95],"predicts":[96],"more":[98],"severe":[99],"memory":[100],"window":[101],"(MW)":[102],"degradation":[103],"caused":[104],"compared":[109],"DE":[111],"phase.":[112],"The":[113],"results":[114],"emphasize":[115],"necessity":[117],"suppressing":[119],"optimization":[125],"FeFETs.":[127]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}