{"id":"https://openalex.org/W4389946288","doi":"https://doi.org/10.23919/sice59929.2023.10354111","title":"Moving Object Extraction Based on the Accumulative Differences of Image Intensities and Gradient Orientations","display_name":"Moving Object Extraction Based on the Accumulative Differences of Image Intensities and Gradient Orientations","publication_year":2023,"publication_date":"2023-09-06","ids":{"openalex":"https://openalex.org/W4389946288","doi":"https://doi.org/10.23919/sice59929.2023.10354111"},"language":"en","primary_location":{"id":"doi:10.23919/sice59929.2023.10354111","is_oa":false,"landing_page_url":"https://doi.org/10.23919/sice59929.2023.10354111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 62nd Annual Conference of the Society of Instrument and Control Engineers (SICE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033967217","display_name":"Kittikhun Sirinaksomboon","orcid":null},"institutions":[{"id":"https://openalex.org/I108108428","display_name":"Thammasat University","ror":"https://ror.org/002yp7f20","country_code":"TH","type":"education","lineage":["https://openalex.org/I108108428"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Kittikhun Sirinaksomboon","raw_affiliation_strings":["Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","institution_ids":["https://openalex.org/I108108428"]},{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand","institution_ids":["https://openalex.org/I108108428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031147512","display_name":"Poraneepan Tantawanich","orcid":null},"institutions":[{"id":"https://openalex.org/I108108428","display_name":"Thammasat University","ror":"https://ror.org/002yp7f20","country_code":"TH","type":"education","lineage":["https://openalex.org/I108108428"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Poraneepan Tantawanich","raw_affiliation_strings":["Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","institution_ids":["https://openalex.org/I108108428"]},{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand","institution_ids":["https://openalex.org/I108108428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086272286","display_name":"Thanyamon Pattanapisont","orcid":"https://orcid.org/0009-0006-0527-0220"},"institutions":[{"id":"https://openalex.org/I108108428","display_name":"Thammasat University","ror":"https://ror.org/002yp7f20","country_code":"TH","type":"education","lineage":["https://openalex.org/I108108428"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Thanyamon Pattanapisont","raw_affiliation_strings":["Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","institution_ids":["https://openalex.org/I108108428"]},{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand","institution_ids":["https://openalex.org/I108108428"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060305629","display_name":"Toshiaki Kondo","orcid":"https://orcid.org/0000-0001-7491-4356"},"institutions":[{"id":"https://openalex.org/I108108428","display_name":"Thammasat University","ror":"https://ror.org/002yp7f20","country_code":"TH","type":"education","lineage":["https://openalex.org/I108108428"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Toshiaki Kondo","raw_affiliation_strings":["Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University,Pathum Thani,Thailand","institution_ids":["https://openalex.org/I108108428"]},{"raw_affiliation_string":"Sirindhorn International Institute of Technology, Thammasat University, Pathum Thani, Thailand","institution_ids":["https://openalex.org/I108108428"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28893395,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"516","last_page":"521"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7720245122909546},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6706843376159668},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.623001754283905},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.6013057231903076},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5381928086280823},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5303127765655518},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.4440213441848755},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.42897939682006836}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7720245122909546},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6706843376159668},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.623001754283905},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.6013057231903076},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5381928086280823},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5303127765655518},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.4440213441848755},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.42897939682006836},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/sice59929.2023.10354111","is_oa":false,"landing_page_url":"https://doi.org/10.23919/sice59929.2023.10354111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 62nd Annual Conference of the Society of Instrument and Control Engineers (SICE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323439","display_name":"Thammasat University","ror":"https://ror.org/002yp7f20"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1975306494","https://openalex.org/W2091250708","https://openalex.org/W2102124806","https://openalex.org/W2104783059","https://openalex.org/W2117082993","https://openalex.org/W2120458963","https://openalex.org/W2120516655","https://openalex.org/W2133059825","https://openalex.org/W2566030665","https://openalex.org/W2580549736","https://openalex.org/W2793586828","https://openalex.org/W2910418392","https://openalex.org/W4251229830","https://openalex.org/W6658568426"],"related_works":["https://openalex.org/W115686965","https://openalex.org/W2768918307","https://openalex.org/W2110031805","https://openalex.org/W2040020606","https://openalex.org/W4362659915","https://openalex.org/W2113071088","https://openalex.org/W2321543601","https://openalex.org/W1990016983","https://openalex.org/W2972861887","https://openalex.org/W2393930098"],"abstract_inverted_index":{"The":[0],"foreground":[1],"extraction":[2],"from":[3,15],"the":[4,26,61,69,74,77,80,85],"stationary":[5],"background":[6],"can":[7],"be":[8],"achieved":[9],"by":[10,24],"accumulating":[11],"difference":[12],"images":[13,43],"(ADI)":[14],"a":[16,21],"video":[17],"sequence.":[18],"We":[19,46],"propose":[20],"novel":[22],"method":[23],"applying":[25],"ADI":[27],"technique":[28],"to":[29,59],"not":[30],"only":[31],"image":[32],"intensities":[33],"(INT)":[34],"but":[35],"also":[36],"unit":[37],"gradient":[38],"vectors":[39],"(UGV)":[40],"of":[41,76,79],"gray-scale":[42],"over":[44],"time.":[45],"describe":[47],"how":[48,58],"these":[49],"two":[50,81],"approaches":[51,82],"are":[52,66],"fused.":[53],"In":[54],"addition,":[55],"we":[56],"discuss":[57],"select":[60],"proper":[62],"threshold":[63],"values":[64],"that":[65],"necessary":[67],"for":[68],"ADI.":[70],"Experimental":[71],"results":[72],"show":[73],"benefit":[75],"fusion":[78],"based":[83],"on":[84],"F1":[86],"and":[87],"F2":[88],"scores.":[89]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}