{"id":"https://openalex.org/W4302774828","doi":"https://doi.org/10.23919/sice56594.2022.9905865","title":"Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry","display_name":"Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry","publication_year":2022,"publication_date":"2022-09-06","ids":{"openalex":"https://openalex.org/W4302774828","doi":"https://doi.org/10.23919/sice56594.2022.9905865"},"language":"en","primary_location":{"id":"doi:10.23919/sice56594.2022.9905865","is_oa":false,"landing_page_url":"https://doi.org/10.23919/sice56594.2022.9905865","pdf_url":null,"source":{"id":"https://openalex.org/S4363608498","display_name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109085860","display_name":"Akio Ito","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I88100897","display_name":"Yokogawa Electric (Japan)","ror":"https://ror.org/04bdy7914","country_code":"JP","type":"company","lineage":["https://openalex.org/I88100897"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akio Ito","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","FDT Group, Heverlee, Belgium","Industrial Automation Forum Control Layer Information Cooperation","Yokogawa Electric Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"FDT Group, Heverlee, Belgium","institution_ids":[]},{"raw_affiliation_string":"Industrial Automation Forum Control Layer Information Cooperation","institution_ids":[]},{"raw_affiliation_string":"Yokogawa Electric Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I88100897"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031597066","display_name":"Akira Sakaino","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Sakaino","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","NTT Communications Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"NTT Communications Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028584174","display_name":"Shinichiro Chino","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinichiro Chino","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","FDT Group, Heverlee, Belgium","Industrial Automation Forum Control Layer Information Cooperation","Mitsubishi Electric Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"FDT Group, Heverlee, Belgium","institution_ids":[]},{"raw_affiliation_string":"Industrial Automation Forum Control Layer Information Cooperation","institution_ids":[]},{"raw_affiliation_string":"Mitsubishi Electric Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113616476","display_name":"Takashi Horikoshi","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Horikoshi","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","NTT Communications Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"NTT Communications Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036922677","display_name":"Mitsushiro Fujishima","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsushiro Fujishima","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","FDT Group, Heverlee, Belgium","Industrial Automation Forum Control Layer Information Cooperation","Mitsubishi Electric Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"FDT Group, Heverlee, Belgium","institution_ids":[]},{"raw_affiliation_string":"Industrial Automation Forum Control Layer Information Cooperation","institution_ids":[]},{"raw_affiliation_string":"Mitsubishi Electric Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039407557","display_name":"Shuichi Ogawa","orcid":"https://orcid.org/0000-0002-6625-7904"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I4210160071","display_name":"Endress+Hauser (Switzerland)","ror":"https://ror.org/05gcc9f60","country_code":"CH","type":"company","lineage":["https://openalex.org/I4210160071"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Shuichi Ogawa","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","Endress+Hauser, Reinach, Switzerland","FDT Group, Heverlee, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Endress+Hauser, Reinach, Switzerland","institution_ids":["https://openalex.org/I4210160071"]},{"raw_affiliation_string":"FDT Group, Heverlee, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010884052","display_name":"Tetsuo Takeuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]},{"id":"https://openalex.org/I88100897","display_name":"Yokogawa Electric (Japan)","ror":"https://ror.org/04bdy7914","country_code":"JP","type":"company","lineage":["https://openalex.org/I88100897"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuo Takeuchi","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University","FDT Group, Heverlee, Belgium","Industrial Automation Forum Control Layer Information Cooperation","Yokogawa Electric Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"FDT Group, Heverlee, Belgium","institution_ids":[]},{"raw_affiliation_string":"Industrial Automation Forum Control Layer Information Cooperation","institution_ids":[]},{"raw_affiliation_string":"Yokogawa Electric Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I88100897"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050391979","display_name":"Yoshiharu AMANO","orcid":"https://orcid.org/0000-0003-3480-6777"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiharu Amano","raw_affiliation_strings":["Industrial Open-Network Laboratory in Waseda University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Open-Network Laboratory in Waseda University","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4143,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55197752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"17","last_page":"24"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.972100019454956,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.972100019454956,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9412000179290771,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.7891075611114502},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5852506756782532},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.524304986000061},{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.5169945955276489},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5126551985740662},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47285938262939453},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.45800256729125977},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45493751764297485},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.4202050268650055},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40306609869003296},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.36303627490997314},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3211931884288788},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.3200052082538605},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.23793286085128784},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10111552476882935}],"concepts":[{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.7891075611114502},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5852506756782532},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.524304986000061},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.5169945955276489},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5126551985740662},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47285938262939453},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.45800256729125977},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45493751764297485},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.4202050268650055},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40306609869003296},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.36303627490997314},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3211931884288788},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.3200052082538605},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.23793286085128784},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10111552476882935},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/sice56594.2022.9905865","is_oa":false,"landing_page_url":"https://doi.org/10.23919/sice56594.2022.9905865","pdf_url":null,"source":{"id":"https://openalex.org/S4363608498","display_name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2769043638","https://openalex.org/W3101684042","https://openalex.org/W3104572429","https://openalex.org/W3206295768","https://openalex.org/W6802711274"],"related_works":["https://openalex.org/W2384486034","https://openalex.org/W2325500789","https://openalex.org/W602415246","https://openalex.org/W2370405293","https://openalex.org/W583571217","https://openalex.org/W4210295735","https://openalex.org/W2567211024","https://openalex.org/W2754952496","https://openalex.org/W2141261139","https://openalex.org/W4388916722"],"abstract_inverted_index":{"We":[0,36,59,103],"started":[1],"investigation":[2],"of":[3,26,85],"a":[4,61],"proving":[5,62,87],"test":[6,63,88],"equipment":[7,64,89],"development":[8],"which":[9,56,113],"corresponds":[10],"to":[11,21,108],"field":[12,27],"device":[13,28,115],"tool":[14],"(FDT\u00ae,":[15],"IEC62453)":[16],"ver.":[17],"3.0":[18],"(FDT":[19],"3.0)":[20],"study":[22,83],"theoretically":[23],"the":[24,51,86,110],"issues":[25],"level":[29],"requirements":[30],"for":[31,66,90],"industrial":[32],"smart":[33],"system":[34,43,55],"design.":[35],"select":[37],"carbon":[38],"emission":[39],"data":[40,116],"international":[41],"trade":[42],"using":[44],"European":[45],"secure":[46],"data-sharing":[47],"platform":[48],"GAIA-X":[49],"as":[50],"target":[52],"future":[53],"production":[54],"utilizes":[57,114],"FDT3.0.":[58],"created":[60],"architecture":[65],"all":[67],"automation":[68,73,77],"industry":[69],"domain":[70],"including":[71],"process":[72],"(PA)":[74],"and":[75,95],"factory":[76],"(FA).":[78],"Manufacturing":[79],"Execution":[80],"Systems":[81],"(MES)":[82],"part":[84],"FA":[91],"side":[92],"is":[93],"constructed":[94],"demonstrated":[96],"at":[97],"IIFES2022":[98],"in":[99],"collaboration":[100],"with":[101],"IAF.":[102],"will":[104],"continue":[105],"our":[106],"research":[107],"show":[109],"use":[111],"cases":[112],"effectively.":[117]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}