{"id":"https://openalex.org/W4391087972","doi":"https://doi.org/10.23919/ofc49934.2023.10116447","title":"Direct Electrostriction Measurement using SPM for Fiber Type Identification","display_name":"Direct Electrostriction Measurement using SPM for Fiber Type Identification","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4391087972","doi":"https://doi.org/10.23919/ofc49934.2023.10116447"},"language":"en","primary_location":{"id":"doi:10.23919/ofc49934.2023.10116447","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/ofc49934.2023.10116447","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Optical Fiber Communications Conference and Exhibition (OFC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091977519","display_name":"Fatima Al-Shaikhli","orcid":null},"institutions":[{"id":"https://openalex.org/I146416000","display_name":"University of Kansas","ror":"https://ror.org/001tmjg57","country_code":"US","type":"education","lineage":["https://openalex.org/I146416000"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Fatima Al-Shaikhli","raw_affiliation_strings":["University of Kansas,Dept. of Electrical Engineering and Computer Science,Lawrence,KS,USA,66045"],"affiliations":[{"raw_affiliation_string":"University of Kansas,Dept. of Electrical Engineering and Computer Science,Lawrence,KS,USA,66045","institution_ids":["https://openalex.org/I146416000"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071217530","display_name":"Maurice O\u2019Sullivan","orcid":"https://orcid.org/0000-0002-8197-9489"},"institutions":[{"id":"https://openalex.org/I4210160469","display_name":"Ciena (Canada)","ror":"https://ror.org/05agqdk49","country_code":"CA","type":"company","lineage":["https://openalex.org/I1295297804","https://openalex.org/I4210160469"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Maurice O'Sullivan","raw_affiliation_strings":["Ciena Corporation,Ottawa,Canada,K2K 0L1"],"affiliations":[{"raw_affiliation_string":"Ciena Corporation,Ottawa,Canada,K2K 0L1","institution_ids":["https://openalex.org/I4210160469"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004656782","display_name":"Rongqing Hui","orcid":"https://orcid.org/0000-0002-0710-3518"},"institutions":[{"id":"https://openalex.org/I146416000","display_name":"University of Kansas","ror":"https://ror.org/001tmjg57","country_code":"US","type":"education","lineage":["https://openalex.org/I146416000"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rongqing Hui","raw_affiliation_strings":["University of Kansas,Dept. of Electrical Engineering and Computer Science,Lawrence,KS,USA,66045"],"affiliations":[{"raw_affiliation_string":"University of Kansas,Dept. of Electrical Engineering and Computer Science,Lawrence,KS,USA,66045","institution_ids":["https://openalex.org/I146416000"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5091977519"],"corresponding_institution_ids":["https://openalex.org/I146416000"],"apc_list":null,"apc_paid":null,"fwci":0.2836,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57363695,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostriction","display_name":"Electrostriction","score":0.9373070001602173},{"id":"https://openalex.org/keywords/fiber","display_name":"Fiber","score":0.5721296668052673},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.5264314413070679},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5148324370384216},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.47731122374534607},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.34066468477249146},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.2413926124572754},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19534257054328918},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07500842213630676}],"concepts":[{"id":"https://openalex.org/C117911374","wikidata":"https://www.wikidata.org/wiki/Q534928","display_name":"Electrostriction","level":3,"score":0.9373070001602173},{"id":"https://openalex.org/C519885992","wikidata":"https://www.wikidata.org/wiki/Q161","display_name":"Fiber","level":2,"score":0.5721296668052673},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.5264314413070679},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5148324370384216},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.47731122374534607},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.34066468477249146},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2413926124572754},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19534257054328918},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07500842213630676},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/ofc49934.2023.10116447","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/ofc49934.2023.10116447","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Optical Fiber Communications Conference and Exhibition (OFC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1667288909","https://openalex.org/W1963660681","https://openalex.org/W1965465747","https://openalex.org/W2068220305","https://openalex.org/W2089621954","https://openalex.org/W2135091927"],"related_works":["https://openalex.org/W2020268719","https://openalex.org/W2020751407","https://openalex.org/W1996622854","https://openalex.org/W3215316049","https://openalex.org/W1969458718","https://openalex.org/W1975904195","https://openalex.org/W1985157690","https://openalex.org/W2082997871","https://openalex.org/W838362001","https://openalex.org/W2135529037"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"simple":[3],"technique":[4],"for":[5],"in-field":[6],"determination":[7],"of":[8,14],"fiber":[9],"types":[10],"through":[11],"the":[12],"measurement":[13],"electrostriction":[15],"effect":[16],"based":[17],"on":[18],"self-phase":[19],"modulation.":[20]},"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}