{"id":"https://openalex.org/W2885028736","doi":"https://doi.org/10.23919/mixdes.2018.8436929","title":"Integration and Testing of Large Scale Diagnostic Systems","display_name":"Integration and Testing of Large Scale Diagnostic Systems","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2885028736","doi":"https://doi.org/10.23919/mixdes.2018.8436929","mag":"2885028736"},"language":"en","primary_location":{"id":"doi:10.23919/mixdes.2018.8436929","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2018.8436929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083362028","display_name":"Pawe\u0142 Plewi\u0144ski","orcid":null},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Pawel Plewinski","raw_affiliation_strings":["Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012321334","display_name":"Dariusz Makowski","orcid":"https://orcid.org/0000-0002-6392-090X"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Dariusz Makowski","raw_affiliation_strings":["Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015508212","display_name":"Piotr Perek","orcid":"https://orcid.org/0000-0002-7531-2960"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Piotr Perek","raw_affiliation_strings":["Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085564117","display_name":"Andrzej Napieralski","orcid":"https://orcid.org/0000-0002-3844-3435"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Napieralski","raw_affiliation_strings":["Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics and Computer Science, Lodz University of Technology, L\u00f3d\u017a Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5083362028"],"corresponding_institution_ids":["https://openalex.org/I188884621"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0310073,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"85","last_page":"88"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10346","display_name":"Magnetic confinement fusion research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10346","display_name":"Magnetic confinement fusion research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.7341881990432739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6657990217208862},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.6053284406661987},{"id":"https://openalex.org/keywords/system-integration","display_name":"System integration","score":0.5957289338111877},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.558032751083374},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.5465899705886841},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5079954266548157},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.5054948329925537},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44302356243133545},{"id":"https://openalex.org/keywords/system-integration-testing","display_name":"System integration testing","score":0.42722684144973755},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4152531027793884},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3370705544948578},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.32926511764526367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24246758222579956},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.14881131052970886},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.11362156271934509},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09087821841239929},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.07813012599945068},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07645100355148315}],"concepts":[{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.7341881990432739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6657990217208862},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.6053284406661987},{"id":"https://openalex.org/C19527686","wikidata":"https://www.wikidata.org/wiki/Q1665453","display_name":"System integration","level":2,"score":0.5957289338111877},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.558032751083374},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.5465899705886841},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5079954266548157},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.5054948329925537},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44302356243133545},{"id":"https://openalex.org/C111524372","wikidata":"https://www.wikidata.org/wiki/Q7663718","display_name":"System integration testing","level":5,"score":0.42722684144973755},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4152531027793884},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3370705544948578},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.32926511764526367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24246758222579956},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.14881131052970886},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.11362156271934509},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09087821841239929},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.07813012599945068},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07645100355148315},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/mixdes.2018.8436929","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2018.8436929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5799999833106995,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1472797944","https://openalex.org/W2077503404","https://openalex.org/W2085900316","https://openalex.org/W2147650196","https://openalex.org/W2296020468","https://openalex.org/W2373572252","https://openalex.org/W2425866569","https://openalex.org/W2564417847","https://openalex.org/W2571012311","https://openalex.org/W2595305573","https://openalex.org/W2790682225","https://openalex.org/W3196907566","https://openalex.org/W6800672979"],"related_works":["https://openalex.org/W1531907780","https://openalex.org/W1603792055","https://openalex.org/W1988901622","https://openalex.org/W2886756146","https://openalex.org/W2063289013","https://openalex.org/W2386397602","https://openalex.org/W176978548","https://openalex.org/W347522661","https://openalex.org/W3214776400","https://openalex.org/W2361097260"],"abstract_inverted_index":{"The":[0,39],"design":[1],"of":[2,22,24,41,58,66,89,114,121,130],"the":[3,42,68,74,81,85,90,108,112,119],"modern":[4],"Instrumentation":[5],"and":[6,27,37,60,71,87,92,101,123],"Control":[7],"(I&C)":[8],"systems":[9],"in":[10,98,104],"large-scale":[11],"projects":[12],"such":[13,51],"as":[14],"ITER":[15,131],"is":[16,48,62,78,139],"technically":[17],"challenging.":[18],"They":[19],"often":[20],"consist":[21],"dozens":[23],"various":[25],"complex":[26],"distributed":[28],"systems,":[29],"which":[30],"are":[31],"developed":[32],"by":[33],"numerous":[34],"independent":[35],"organizations":[36],"companies.":[38],"integration":[40,61,125],"sub-systems":[43],"into":[44],"a":[45,63,99],"coherent":[46],"system":[47,91,124,137],"critical":[49],"for":[50],"projects.":[52],"System":[53],"testing":[54,122,138],"at":[55],"all":[56,84],"stages":[57],"development":[59],"common":[64],"method":[65],"ensuring":[67],"proper":[69],"quality":[70],"adherence":[72],"to":[73,106,135],"accepted":[75],"standards.":[76],"It":[77],"necessary":[79],"that":[80,93],"tests":[82],"cover":[83],"requirements":[86],"functionality":[88],"they":[94],"can":[95],"be":[96],"executed":[97],"repeatable":[100],"error-proof":[102],"way":[103],"order":[105],"maximize":[107],"gains":[109],"obtained":[110],"from":[111],"use":[113],"testing.":[115],"This":[116],"paper":[117],"presents":[118],"strategies":[120],"illustrated":[126],"with":[127],"an":[128],"example":[129],"project.":[132],"An":[133],"approach":[134],"automated":[136],"also":[140],"proposed.":[141]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}