{"id":"https://openalex.org/W2887638934","doi":"https://doi.org/10.23919/mixdes.2018.8436642","title":"Topology-Driven Reliability Assessment of Integrated Circuits","display_name":"Topology-Driven Reliability Assessment of Integrated Circuits","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2887638934","doi":"https://doi.org/10.23919/mixdes.2018.8436642","mag":"2887638934"},"language":"en","primary_location":{"id":"doi:10.23919/mixdes.2018.8436642","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2018.8436642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054389827","display_name":"Theodor Hillebrand","orcid":"https://orcid.org/0000-0003-0234-6884"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Theodor Hillebrand","raw_affiliation_strings":["University of Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101959993","display_name":"Steffen Paul","orcid":"https://orcid.org/0000-0003-3392-0471"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Steffen Paul","raw_affiliation_strings":["University of Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074802539","display_name":"Dagmar Peters- Drolshagen","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dagmar Peters- Drolshagen","raw_affiliation_strings":["University of Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5054389827"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07789144,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"198","last_page":"203"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6464817523956299},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6030792593955994},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.533112645149231},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5249985456466675},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.509926438331604},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4856451749801636},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.475673109292984},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.4620823860168457},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44604694843292236},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28374749422073364},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24175047874450684},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.16159731149673462},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10158038139343262}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6464817523956299},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6030792593955994},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.533112645149231},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5249985456466675},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.509926438331604},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4856451749801636},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.475673109292984},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4620823860168457},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44604694843292236},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28374749422073364},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24175047874450684},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.16159731149673462},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10158038139343262},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/mixdes.2018.8436642","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2018.8436642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W597664373","https://openalex.org/W653191948","https://openalex.org/W2027751729","https://openalex.org/W2344193394","https://openalex.org/W2485848341","https://openalex.org/W2497595099"],"related_works":["https://openalex.org/W2137676555","https://openalex.org/W2372403409","https://openalex.org/W2515605785","https://openalex.org/W4245326239","https://openalex.org/W4242726756","https://openalex.org/W1507225775","https://openalex.org/W2106294750","https://openalex.org/W2183644323","https://openalex.org/W2133170110","https://openalex.org/W3215142653"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"a":[3,41],"structured":[4],"method":[5,27,50],"is":[6],"presented":[7],"which":[8],"optimizes":[9],"integrated":[10],"analogue":[11],"circuits":[12],"in":[13,25],"terms":[14],"of":[15,20,40,48],"aging.":[16,63],"The":[17],"aging":[18,38],"analyses":[19],"each":[21],"sub":[22],"block":[23],"used":[24,34],"the":[26,37,45,49],"are":[28,33,51],"presented.":[29],"Subsequently,":[30],"these":[31],"blocks":[32],"to":[35,62],"improve":[36],"behavior":[39],"two-stage":[42],"Miller-OTA.":[43],"Moreover,":[44],"whole":[46],"capabilities":[47],"evaluated":[52],"constructing":[53],"an":[54],"aging-compensated":[55],"amplifier":[56],"from":[57],"scratch":[58],"being":[59],"virtually":[60],"immune":[61]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}