{"id":"https://openalex.org/W2744606061","doi":"https://doi.org/10.23919/mixdes.2017.8005170","title":"Improvements in Qucs-S equation-defined modelling of semiconductor devices and IC's","display_name":"Improvements in Qucs-S equation-defined modelling of semiconductor devices and IC's","publication_year":2017,"publication_date":"2017-06-01","ids":{"openalex":"https://openalex.org/W2744606061","doi":"https://doi.org/10.23919/mixdes.2017.8005170","mag":"2744606061"},"language":"en","primary_location":{"id":"doi:10.23919/mixdes.2017.8005170","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2017.8005170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 MIXDES - 24th International Conference \"Mixed Design of Integrated Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004419729","display_name":"Mike Brinson","orcid":null},"institutions":[{"id":"https://openalex.org/I126193024","display_name":"London Metropolitan University","ror":"https://ror.org/00ae33288","country_code":"GB","type":"education","lineage":["https://openalex.org/I126193024"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Mike Brinson","raw_affiliation_strings":["Centre for Communications Technology, London Metropolitan University, London, UK"],"affiliations":[{"raw_affiliation_string":"Centre for Communications Technology, London Metropolitan University, London, UK","institution_ids":["https://openalex.org/I126193024"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028332207","display_name":"Vadim Kuznetsov","orcid":"https://orcid.org/0000-0002-5738-555X"},"institutions":[{"id":"https://openalex.org/I177537411","display_name":"Bauman Moscow State Technical University","ror":"https://ror.org/00pb8h375","country_code":"RU","type":"education","lineage":["https://openalex.org/I177537411"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Vadim Kuznetsov","raw_affiliation_strings":["Bauman Moscow Technical University Kaluga Branch, Moscow, Russia"],"affiliations":[{"raw_affiliation_string":"Bauman Moscow Technical University Kaluga Branch, Moscow, Russia","institution_ids":["https://openalex.org/I177537411"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5004419729"],"corresponding_institution_ids":["https://openalex.org/I126193024"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.09690435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"137","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.7772729396820068},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6896341443061829},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6227788329124451},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.6193660497665405},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4746171534061432},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.468874454498291},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.4627625346183777},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.4569632411003113},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.29095572233200073},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24540701508522034},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20879361033439636},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.13364338874816895},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12221911549568176},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12186625599861145},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07362157106399536}],"concepts":[{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.7772729396820068},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6896341443061829},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6227788329124451},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.6193660497665405},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4746171534061432},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.468874454498291},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.4627625346183777},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.4569632411003113},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.29095572233200073},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24540701508522034},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20879361033439636},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.13364338874816895},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12221911549568176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12186625599861145},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07362157106399536},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/mixdes.2017.8005170","is_oa":false,"landing_page_url":"https://doi.org/10.23919/mixdes.2017.8005170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 MIXDES - 24th International Conference \"Mixed Design of Integrated Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.londonmet.ac.uk:1320","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400141","display_name":"London Met Repository (London Metropolitan University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126193024","host_organization_name":"London Metropolitan University","host_organization_lineage":["https://openalex.org/I126193024"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2120735010","https://openalex.org/W2336576266","https://openalex.org/W2420940523","https://openalex.org/W4239254584","https://openalex.org/W4243169588"],"related_works":["https://openalex.org/W3173836265","https://openalex.org/W2049242586","https://openalex.org/W1863793630","https://openalex.org/W303902570","https://openalex.org/W2543651872","https://openalex.org/W1571872413","https://openalex.org/W2143147482","https://openalex.org/W3023293678","https://openalex.org/W1947179951","https://openalex.org/W2041301450"],"abstract_inverted_index":{"The":[0],"Qucs":[1,59],"Equation-Defined":[2,62,103],"Device":[3],"was":[4],"introduce":[5],"roughly":[6],"ten":[7],"years":[8],"ago":[9],"as":[10],"a":[11,66],"versatile":[12],"behavioural":[13],"simulation":[14,44,80,98],"component":[15,34],"for":[16,40,53],"modelling":[17,57,91,114],"the":[18,70,74,111,120],"non-linear":[19],"static":[20],"and":[21,29,55,97,135,141],"dynamic":[22],"properties":[23,49],"of":[24,69,76,102,119],"passive":[25],"components,":[26],"semiconductor":[27,79],"devices":[28],"IC":[30],"macromodels.":[31],"Today,":[32],"this":[33],"has":[35],"become":[36],"an":[37,116],"established":[38],"element":[39],"building":[41],"experimental":[42],"device":[43,54],"models.":[45,81],"It's":[46],"inherent":[47],"interactive":[48],"make":[50],"it":[51],"ideal":[52],"circuit":[56],"via":[58],"schematics.":[60],"Moreover,":[61],"Devices":[63,104],"often":[64],"promote":[65],"clearer":[67],"understanding":[68],"factors":[71],"involved":[72],"in":[73,89],"construction":[75,96],"complex":[77],"compact":[78],"This":[82],"paper":[83],"is":[84],"concerned":[85],"with":[86,129,139],"recent":[87],"advances":[88],"Qucs-S/Ngspice/XSPICE":[90],"capabilities":[92],"that":[93],"improve":[94],"model":[95,107,127],"run":[99],"time":[100],"performance":[101,137],"using":[105],"XSPICE":[106,117],"syntheses.":[108],"To":[109],"illustrate":[110],"new":[112],"Qucs-S":[113,140],"techniques":[115],"version":[118],"EPFL":[121],"EKV":[122],"v2.6":[123],"long":[124],"channel":[125],"transistor":[126],"together":[128],"other":[130],"illustrative":[131],"examples":[132],"are":[133],"described":[134],"their":[136],"simulated":[138],"Ngspice.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}