{"id":"https://openalex.org/W1497522544","doi":"https://doi.org/10.23919/ecc.2003.7085152","title":"Multiple fault isolation in diagnostics of industrial processes","display_name":"Multiple fault isolation in diagnostics of industrial processes","publication_year":2003,"publication_date":"2003-09-01","ids":{"openalex":"https://openalex.org/W1497522544","doi":"https://doi.org/10.23919/ecc.2003.7085152","mag":"1497522544"},"language":"en","primary_location":{"id":"doi:10.23919/ecc.2003.7085152","is_oa":false,"landing_page_url":"https://doi.org/10.23919/ecc.2003.7085152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 European Control Conference (ECC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000883886","display_name":"Jan Maciej Ko\u015bcielny","orcid":"https://orcid.org/0000-0002-8947-2025"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"J. M. Koscielny","raw_affiliation_strings":["Warsaw University of Technology, Institute of Automatic Control and Robotics, Warsaw, Poland","Warsaw University of Technology Institute of Automatic Control and Robotics"],"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology, Institute of Automatic Control and Robotics, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]},{"raw_affiliation_string":"Warsaw University of Technology Institute of Automatic Control and Robotics","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081920501","display_name":"Micha\u0142 Barty\u015b","orcid":"https://orcid.org/0000-0002-8516-7023"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"M. Bartys","raw_affiliation_strings":["Warsaw University of Technology, Institute of Automatic Control and Robotics, Warsaw, Poland","Warsaw University of Technology Institute of Automatic Control and Robotics"],"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology, Institute of Automatic Control and Robotics, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]},{"raw_affiliation_string":"Warsaw University of Technology Institute of Automatic Control and Robotics","institution_ids":["https://openalex.org/I108403487"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5000883886"],"corresponding_institution_ids":["https://openalex.org/I108403487"],"apc_list":null,"apc_paid":null,"fwci":2.4284,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.8786357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1369","last_page":"1374"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9758999943733215,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9710000157356262,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.8501639366149902},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6836795806884766},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5907909870147705},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5824743509292603},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5274325013160706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25738245248794556},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15527474880218506},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.05760118365287781},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.05485290288925171}],"concepts":[{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.8501639366149902},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6836795806884766},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5907909870147705},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5824743509292603},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5274325013160706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25738245248794556},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15527474880218506},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.05760118365287781},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.05485290288925171},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/ecc.2003.7085152","is_oa":false,"landing_page_url":"https://doi.org/10.23919/ecc.2003.7085152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 European Control Conference (ECC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W945633740","https://openalex.org/W1569191421","https://openalex.org/W1581249620","https://openalex.org/W1592847587","https://openalex.org/W2642579605"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"The":[0,14,38],"paper":[1],"concerns":[2],"the":[3,25],"problems":[4],"of":[5,8,19,32,42],"on-line":[6],"diagnosis":[7],"industrial":[9],"processes":[10],"with":[11],"multiple":[12,20,26,43],"faults.":[13],"authors":[15],"discussed":[16],"some":[17],"hypotheses":[18],"faults":[21,34],"isolation":[22,28,45],"conditions.":[23],"Particularly,":[24],"fault":[27,44],"analysis":[29],"under":[30],"assumption":[31],"single":[33],"hypothesis":[35],"is":[36],"discussed.":[37],"simple,":[39],"practical":[40],"algorithm":[41],"was":[46],"given.":[47]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}