{"id":"https://openalex.org/W7163533076","doi":"https://doi.org/10.23919/date69613.2026.11539702","title":"Ramen: Radiation-Aware Modeling Framework for PDK-Enabled Design and Library Characterization","display_name":"Ramen: Radiation-Aware Modeling Framework for PDK-Enabled Design and Library Characterization","publication_year":2026,"publication_date":"2026-04-20","ids":{"openalex":"https://openalex.org/W7163533076","doi":"https://doi.org/10.23919/date69613.2026.11539702"},"language":null,"primary_location":{"id":"doi:10.23919/date69613.2026.11539702","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation &amp;amp; Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046207386","display_name":"Quan Cheng","orcid":"https://orcid.org/0000-0001-5519-3258"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quan Cheng","raw_affiliation_strings":["Southern University of Science and Technology,School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology,School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037091235","display_name":"H. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haoyuan Li","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050853199","display_name":"Zhenzhe Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zhenzhe Chen","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137877670","display_name":"Wang Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I35568498","display_name":"Kochi University of Technology","ror":"https://ror.org/00rghrr56","country_code":"JP","type":"education","lineage":["https://openalex.org/I35568498"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wang Liao","raw_affiliation_strings":["Kochi University of Technology,School of Systems Engineering,Kochi,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kochi University of Technology,School of Systems Engineering,Kochi,Japan","institution_ids":["https://openalex.org/I35568498"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110204273","display_name":"Jing-Jia Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jing-Jia Liou","raw_affiliation_strings":["National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137863597","display_name":"Masanori Hashimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5137811034","display_name":"Longyang Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longyang Lin","raw_affiliation_strings":["Southern University of Science and Technology,School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology,School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.33970001339912415,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.33970001339912415,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.0706000030040741,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.04149999842047691,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.390500009059906},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.3750999867916107},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.3727000057697296},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.30230000615119934},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.2928999960422516}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.572700023651123},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.390500009059906},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.3750999867916107},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.3727000057697296},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.30230000615119934},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.2928999960422516},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.2865000069141388},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.26840001344680786},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.26100000739097595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25760000944137573}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date69613.2026.11539702","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation &amp;amp; Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4095853567123413,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1593408479","https://openalex.org/W1990105819","https://openalex.org/W2079248771","https://openalex.org/W2100824756","https://openalex.org/W2103902557","https://openalex.org/W2105923269","https://openalex.org/W2131271035","https://openalex.org/W2167263655","https://openalex.org/W2168565720","https://openalex.org/W2333137665","https://openalex.org/W2611992610","https://openalex.org/W2778631497","https://openalex.org/W3159800694","https://openalex.org/W4376606355","https://openalex.org/W4386737295","https://openalex.org/W4399110696","https://openalex.org/W4405180044","https://openalex.org/W4412965863"],"related_works":[],"abstract_inverted_index":{"Radiation-induced":[0],"degradation":[1],"poses":[2],"a":[3,48,149],"critical":[4],"challenge":[5],"to":[6,88,119,136],"the":[7,20,102,159,173],"reliability":[8,174],"of":[9,175],"space-grade":[10],"integrated":[11],"circuits":[12],"(ICs).":[13],"Existing":[14],"radiation-aware":[15,38,50,103,121,178],"models":[16,104],"largely":[17],"remain":[18],"at":[19,79],"device":[21,51],"level":[22],"and":[23,71,82,99,130,143,169],"lack":[24],"direct":[25],"integration":[26],"with":[27,58,95],"circuit":[28,81,109],"or":[29],"system":[30,83],"design":[31],"flows,":[32,101],"limiting":[33],"their":[34],"practical":[35],"use":[36],"in":[37,139],"IC":[39,179],"design.":[40,180],"To":[41],"address":[42],"this,":[43],"this":[44],"work":[45],"proposes":[46],"Ramen,":[47],"non-invasive":[49],"modeling":[52],"framework":[53,161],"that":[54,158],"is":[55],"fully":[56],"compatible":[57],"commercial":[59],"Process":[60],"Design":[61],"Kits":[62],"(PDKs).":[63],"Ramen":[64,176],"accurately":[65],"captures":[66],"total":[67],"ionizing":[68],"dose":[69,74],"(TID)":[70],"displacement":[72],"damage":[73],"(DDD),":[75],"enabling":[76],"early-stage":[77],"evaluation":[78],"both":[80,167],"levels":[84],"without":[85],"requiring":[86],"modifications":[87],"existing":[89],"PDK":[90],"structures.":[91],"By":[92],"seamlessly":[93],"integrating":[94],"standard":[96,115],"analog,":[97],"mixed-signal,":[98],"digital":[100],"not":[105],"only":[106],"support":[107],"SPICE-based":[108],"simulation":[110,164],"but":[111],"also":[112],"feed":[113],"into":[114],"library":[116],"characterization":[117],"tools":[118],"generate":[120],"Liberty":[122],"libraries.":[123],"These":[124],"libraries":[125],"encode":[126],"dose-dependent":[127],"timing,":[128],"leakage,":[129],"power":[131],"information,":[132],"allowing":[133],"radiation":[134,155],"effects":[135],"be":[137],"captured":[138],"synthesis,":[140],"timing":[141],"analysis,":[142],"back-end":[144],"implementation.":[145],"Experimental":[146],"validation":[147],"on":[148],"180":[150],"nm":[151],"CMOS":[152],"imager":[153],"under":[154],"stress":[156],"shows":[157],"proposed":[160],"achieves":[162],"<15%":[163],"errors":[165],"for":[166,177],"analog":[168],"logic":[170],"circuit,":[171],"confirming":[172]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-06-05T00:00:00"}