{"id":"https://openalex.org/W4417004422","doi":"https://doi.org/10.23919/date69613.2026.11539279","title":"Near-Memory Architecture for Threshold-Ordinal Surface-Based Corner Detection of Event Cameras","display_name":"Near-Memory Architecture for Threshold-Ordinal Surface-Based Corner Detection of Event Cameras","publication_year":2026,"publication_date":"2026-04-20","ids":{"openalex":"https://openalex.org/W4417004422","doi":"https://doi.org/10.23919/date69613.2026.11539279"},"language":null,"primary_location":{"id":"doi:10.23919/date69613.2026.11539279","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["arxiv","crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2512.02346","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104300709","display_name":"Hongyang Shang","orcid":null},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Hongyang Shang","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102866148","display_name":"An Guo","orcid":"https://orcid.org/0009-0004-5993-4278"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"An Guo","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100305904","display_name":"Shuai Dong","orcid":"https://orcid.org/0000-0002-7728-4537"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Shuai Dong","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001439194","display_name":"Junyi Yang","orcid":"https://orcid.org/0000-0002-5867-4943"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Junyi Yang","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040004789","display_name":"Ye Ke","orcid":"https://orcid.org/0000-0001-6467-3448"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Ye Ke","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002380437","display_name":"Arindam Basu","orcid":"https://orcid.org/0000-0003-1035-8770"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Arindam Basu","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I168719708"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00484486,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.5645999908447266,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.5645999908447266,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.32739999890327454,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.011599999852478504,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.569599986076355},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47269999980926514},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.45489999651908875},{"id":"https://openalex.org/keywords/corner-detection","display_name":"Corner detection","score":0.4307999908924103},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.42910000681877136},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.41519999504089355},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.3977000117301941},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.39500001072883606},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.39089998602867126}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6015999913215637},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.569599986076355},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47269999980926514},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.45489999651908875},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.43549999594688416},{"id":"https://openalex.org/C39499422","wikidata":"https://www.wikidata.org/wiki/Q697320","display_name":"Corner detection","level":3,"score":0.4307999908924103},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.42910000681877136},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.41519999504089355},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.3977000117301941},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.39500001072883606},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.39089998602867126},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.3725000023841858},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3691999912261963},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.3677999973297119},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.35670000314712524},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3555000126361847},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.35350000858306885},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.33239999413490295},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33149999380111694},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.31520000100135803},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.303600013256073},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29820001125335693},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.2892000079154968},{"id":"https://openalex.org/C120415902","wikidata":"https://www.wikidata.org/wiki/Q462383","display_name":"Zero crossing","level":3,"score":0.2827000021934509},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.27630001306533813},{"id":"https://openalex.org/C117525741","wikidata":"https://www.wikidata.org/wiki/Q775654","display_name":"Signal edge","level":4,"score":0.275299996137619},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26350000500679016},{"id":"https://openalex.org/C46637626","wikidata":"https://www.wikidata.org/wiki/Q6693015","display_name":"Low latency (capital markets)","level":2,"score":0.26159998774528503},{"id":"https://openalex.org/C178693496","wikidata":"https://www.wikidata.org/wiki/Q911691","display_name":"Clock rate","level":3,"score":0.26100000739097595},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.2599000036716461},{"id":"https://openalex.org/C2779466677","wikidata":"https://www.wikidata.org/wiki/Q7301084","display_name":"Real Time Digital Simulator","level":4,"score":0.2578999996185303}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.23919/date69613.2026.11539279","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2512.02346","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2512.02346","pdf_url":"https://arxiv.org/pdf/2512.02346","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.2512.02346","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2512.02346","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2512.02346","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2512.02346","pdf_url":"https://arxiv.org/pdf/2512.02346","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Event-based":[0],"Cameras":[1],"(EBCs)":[2],"are":[3,22],"widely":[4],"utilized":[5],"in":[6,26],"surveillance":[7],"and":[8,17,30,90,101,104,110,161,182],"autonomous":[9],"driving":[10],"applications":[11],"due":[12],"to":[13,114],"their":[14],"high":[15],"speed":[16,94],"low":[18],"power":[19,109],"consumption.":[20],"Corners":[21],"essential":[23],"low-level":[24],"features":[25],"event-driven":[27],"computer":[28],"vision,":[29],"novel":[31],"algorithms":[32,52],"utilizing":[33],"event-based":[34],"representations,":[35],"such":[36],"as":[37],"Threshold-Ordinal":[38],"Surface":[39],"(TOS),":[40],"have":[41],"been":[42],"developed":[43],"for":[44,74,187],"corner":[45],"detection.":[46],"However,":[47],"the":[48,63],"implementation":[49],"of":[50,65,180],"these":[51],"on":[53,133],"resource-constrained":[54],"edge":[55],"devices":[56],"is":[57,79],"hindered":[58],"by":[59,122],"significant":[60],"latency,":[61],"undermining":[62],"advantages":[64],"EBCs.":[66],"To":[67],"address":[68],"this":[69],"challenge,":[70],"a":[71,84],"near-memory":[72],"architecture":[73,82,119],"efficient":[75],"TOS":[76],"updates":[77],"(NM-TOS)":[78],"proposed.":[80],"This":[81],"employs":[83],"read-write":[85],"decoupled":[86],"8T":[87],"SRAM":[88],"cell":[89],"optimizes":[91],"patch":[92],"update":[93],"through":[95],"pipelining.":[96],"Hardware-software":[97],"co-optimized":[98],"peripheral":[99],"circuits":[100],"dynamic":[102],"voltage":[103],"frequency":[105],"scaling":[106],"(DVFS)":[107],"enable":[108],"latency":[111],"reductions.":[112],"Compared":[113],"traditional":[115],"digital":[116],"implementations,":[117],"our":[118],"reduces":[120],"latency/energy":[121],"24.7\u00d7/1.2\u00d7":[123],"at":[124,129,149,158,163,184],"Vdd=1.2":[125],"V":[126,131,160,186],"or":[127],"1.93\u00d7/6.6\u00d7":[128],"Vdd=0.6":[130],"based":[132],"65nm":[134],"CMOS":[135],"process.":[136],"Monte":[137],"Carlo":[138],"simulations":[139],"confirm":[140],"robust":[141],"circuit":[142],"operation,":[143],"demonstrating":[144],"zero":[145],"bit":[146],"error":[147],"rate":[148],"operating":[150],"voltages":[151],"above":[152],"0.62":[153],"V,":[154],"with":[155],"only":[156],"0.2%":[157],"0.61":[159],"2.5%":[162],"0.6":[164,185],"V.":[165],"Corner":[166],"detection":[167],"evaluation":[168],"using":[169],"precision-recall":[170],"area":[171],"under":[172],"curve":[173],"(AUC)":[174],"metrics":[175],"reveals":[176],"minor":[177],"AUC":[178],"reductions":[179],"0.027":[181],"0.015":[183],"two":[188],"popular":[189],"EBC":[190],"datasets.":[191]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-12-04T00:00:00"}