{"id":"https://openalex.org/W7163517070","doi":"https://doi.org/10.23919/date69613.2026.11539186","title":"Unlocking Hidden Secrets: Leveraging SRAM Aging Imprints for Sensitive Data Recovery","display_name":"Unlocking Hidden Secrets: Leveraging SRAM Aging Imprints for Sensitive Data Recovery","publication_year":2026,"publication_date":"2026-04-20","ids":{"openalex":"https://openalex.org/W7163517070","doi":"https://doi.org/10.23919/date69613.2026.11539186"},"language":null,"primary_location":{"id":"doi:10.23919/date69613.2026.11539186","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539186","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098922967","display_name":"Zakia Tamanna Tisha","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zakia Tamanna Tisha","raw_affiliation_strings":["Auburn University,Department of Electrical and Computer Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Auburn University,Department of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098922966","display_name":"Gaines Odom","orcid":"https://orcid.org/0009-0006-3454-2555"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gaines Odom","raw_affiliation_strings":["Auburn University,Department of Electrical and Computer Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Auburn University,Department of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083246460","display_name":"Biswajit Ray","orcid":"https://orcid.org/0000-0002-5890-1368"},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Biswajit Ray","raw_affiliation_strings":["Colorado State University,Department of Electrical and Computer Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Colorado State University,Department of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079601863","display_name":"Ujjwal Guin","orcid":"https://orcid.org/0000-0002-4819-8728"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ujjwal Guin","raw_affiliation_strings":["Auburn University,Department of Electrical and Computer Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Auburn University,Department of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":18.0163,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.98600451,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.45579999685287476,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.45579999685287476,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.04450000077486038,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11800","display_name":"User Authentication and Security Systems","score":0.03999999910593033,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/data-recovery","display_name":"Data recovery","score":0.424699991941452},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.3822999894618988},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.3537999987602234},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.2890999913215637},{"id":"https://openalex.org/keywords/data-collection","display_name":"Data collection","score":0.28769999742507935},{"id":"https://openalex.org/keywords/data-loss","display_name":"Data loss","score":0.28519999980926514}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6244999766349792},{"id":"https://openalex.org/C529754248","wikidata":"https://www.wikidata.org/wiki/Q1054772","display_name":"Data recovery","level":2,"score":0.424699991941452},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.3822999894618988},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.3537999987602234},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31130000948905945},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.30070000886917114},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.2890999913215637},{"id":"https://openalex.org/C133462117","wikidata":"https://www.wikidata.org/wiki/Q4929239","display_name":"Data collection","level":2,"score":0.28769999742507935},{"id":"https://openalex.org/C193519340","wikidata":"https://www.wikidata.org/wiki/Q891179","display_name":"Data loss","level":2,"score":0.28519999980926514},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.28439998626708984},{"id":"https://openalex.org/C2989281035","wikidata":"https://www.wikidata.org/wiki/Q120811","display_name":"Signal recovery","level":3,"score":0.2700999975204468},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2662999927997589},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.2533000111579895}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date69613.2026.11539186","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539186","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2099101940","https://openalex.org/W2167021379","https://openalex.org/W2949793452","https://openalex.org/W4214699800","https://openalex.org/W4226024093","https://openalex.org/W4243195860","https://openalex.org/W4317461470","https://openalex.org/W4402288733","https://openalex.org/W4405440300","https://openalex.org/W4407693240"],"related_works":[],"abstract_inverted_index":{"Long-term":[0],"data":[1,39,71,120,135],"remanence":[2,40,72],"in":[3,45,137],"SRAMs":[4,51,67],"can":[5,26,75],"pose":[6],"serious":[7],"security":[8],"risks":[9],"when":[10],"ICs":[11,33],"containing":[12],"sensitive":[13],"information":[14,25],"are":[15,34,68],"discarded":[16],"at":[17,171],"the":[18,100],"end":[19],"of":[20,109,141,168],"their":[21],"operational":[22],"life.":[23],"Sensitive":[24],"fall":[27],"into":[28],"unauthorized":[29],"hands":[30],"if":[31],"these":[32],"not":[35,125],"sanitized":[36],"properly.":[37],"Traditionally,":[38],"has":[41],"been":[42,53],"addressed":[43],"primarily":[44],"DRAM":[46],"and":[47,82],"flash":[48],"memories,":[49],"while":[50],"have":[52],"overlooked":[54],"due":[55],"to":[56,70,128,151],"very":[57],"short":[58],"retention":[59],"periods.":[60],"Hovanes":[61],"et":[62],"al.":[63],"[1]":[64],"demonstrated":[65,162],"that":[66,123],"vulnerable":[69],"attacks,":[73],"which":[74],"retrieve":[76],"static":[77],"data,":[78],"such":[79],"as":[80],"firmware":[81],"keys.":[83],"Their":[84],"method":[85,105,132],"exploits":[86,134],"aging-induced":[87],"imprints":[88],"on":[89,155],"power-up":[90,112,145],"states,":[91,146],"enabling":[92],"partial":[93],"recovery":[94,121,164],"by":[95],"comparing":[96],"aged":[97],"states":[98],"with":[99],"originals.":[101],"Although":[102],"effective,":[103],"this":[104,115],"requires":[106],"maintaining":[107],"records":[108],"all":[110],"initial":[111,144],"states.":[113],"In":[114],"paper,":[116],"we":[117,147],"propose":[118],"a":[119,159],"approach":[122],"does":[124],"require":[126],"access":[127],"prior":[129],"information.":[130],"Our":[131],"also":[133],"imprinting":[136],"SRAMs,":[138],"but":[139],"instead":[140],"using":[142,173],"actual":[143],"employ":[148],"controlled":[149,169],"aging":[150,170],"reconstruct":[152],"them.":[153],"Experiments":[154],"SRAM":[156],"chips":[157],"storing":[158],"binary":[160],"image":[161],"near-complete":[163],"after":[165],"12":[166],"hours":[167],"100\u25e6C":[172],"32":[174],"copies.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-06-05T00:00:00"}