{"id":"https://openalex.org/W7163531324","doi":"https://doi.org/10.23919/date69613.2026.11539167","title":"Focus Session: Advanced Hybrid Hardware Fuzzing","display_name":"Focus Session: Advanced Hybrid Hardware Fuzzing","publication_year":2026,"publication_date":"2026-04-20","ids":{"openalex":"https://openalex.org/W7163531324","doi":"https://doi.org/10.23919/date69613.2026.11539167"},"language":null,"primary_location":{"id":"doi:10.23919/date69613.2026.11539167","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539167","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5137816464","display_name":"Chen Chen","orcid":"https://orcid.org/0000-0001-6026-8779"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen Chen","raw_affiliation_strings":["Texas A&M University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A&M University","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137879232","display_name":"Stephen Muttathil","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen Muttathil","raw_affiliation_strings":["Texas A&M University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A&M University","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090473338","display_name":"Mohamadreza Rostami","orcid":"https://orcid.org/0009-0005-7293-2733"},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mohamadreza Rostami","raw_affiliation_strings":["Technische Universität Darmstadt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universität Darmstadt","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065697172","display_name":"Nikhilesh Singh","orcid":"https://orcid.org/0000-0002-2697-1855"},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Nikhilesh Singh","raw_affiliation_strings":["Technische Universität Darmstadt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universität Darmstadt","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045570758","display_name":"Lichao Wu","orcid":"https://orcid.org/0000-0002-7139-732X"},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Lichao Wu","raw_affiliation_strings":["Technische Universität Darmstadt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universität Darmstadt","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079497016","display_name":"Ahmad\u2010Reza Sadeghi","orcid":"https://orcid.org/0000-0001-6833-3598"},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ahmad-Reza Sadeghi","raw_affiliation_strings":["Technische Universität Darmstadt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universität Darmstadt","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104098621","display_name":"Jeyavijayan Rajendran","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeyavijayan Rajendran","raw_affiliation_strings":["Texas A&M University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A&M University","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.2524000108242035,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.2524000108242035,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.11959999799728394,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13292","display_name":"Embedded Systems and FPGA Applications","score":0.04450000077486038,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuzz-testing","display_name":"Fuzz testing","score":0.9944000244140625},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.47209998965263367},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.4018000066280365},{"id":"https://openalex.org/keywords/secure-coding","display_name":"Secure coding","score":0.37279999256134033},{"id":"https://openalex.org/keywords/static-analysis","display_name":"Static analysis","score":0.3393000066280365},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.3174999952316284},{"id":"https://openalex.org/keywords/attack-surface","display_name":"Attack surface","score":0.31290000677108765},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.3100000023841858}],"concepts":[{"id":"https://openalex.org/C111065885","wikidata":"https://www.wikidata.org/wiki/Q1189053","display_name":"Fuzz testing","level":3,"score":0.9944000244140625},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7932999730110168},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.47209998965263367},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.4018000066280365},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.38519999384880066},{"id":"https://openalex.org/C22680326","wikidata":"https://www.wikidata.org/wiki/Q7444867","display_name":"Secure coding","level":5,"score":0.37279999256134033},{"id":"https://openalex.org/C97686452","wikidata":"https://www.wikidata.org/wiki/Q7604153","display_name":"Static analysis","level":2,"score":0.3393000066280365},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.3174999952316284},{"id":"https://openalex.org/C2776576444","wikidata":"https://www.wikidata.org/wiki/Q303569","display_name":"Attack surface","level":2,"score":0.31290000677108765},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.3100000023841858},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.30309998989105225},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30140000581741333},{"id":"https://openalex.org/C195518309","wikidata":"https://www.wikidata.org/wiki/Q13424265","display_name":"Security testing","level":5,"score":0.3012000024318695},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.298799991607666},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.29820001125335693},{"id":"https://openalex.org/C98183937","wikidata":"https://www.wikidata.org/wiki/Q2112188","display_name":"Program analysis","level":2,"score":0.2953999936580658},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2816999852657318},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2775000035762787},{"id":"https://openalex.org/C140547941","wikidata":"https://www.wikidata.org/wiki/Q7797194","display_name":"Threat model","level":2,"score":0.27619999647140503},{"id":"https://openalex.org/C60051680","wikidata":"https://www.wikidata.org/wiki/Q30267","display_name":"Aspect-oriented programming","level":3,"score":0.2671000063419342},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.257099986076355},{"id":"https://openalex.org/C172776598","wikidata":"https://www.wikidata.org/wiki/Q7943570","display_name":"Vulnerability management","level":4,"score":0.25029999017715454}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date69613.2026.11539167","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date69613.2026.11539167","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.522074818611145}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2337480911","https://openalex.org/W2912640545","https://openalex.org/W2936567838","https://openalex.org/W2963311060","https://openalex.org/W3029114445","https://openalex.org/W3154674654","https://openalex.org/W3159043981","https://openalex.org/W3159683949","https://openalex.org/W4389160817","https://openalex.org/W4389163039","https://openalex.org/W4393140672","https://openalex.org/W4401568137","https://openalex.org/W4401568309","https://openalex.org/W4411552346","https://openalex.org/W4413014943","https://openalex.org/W4416429484","https://openalex.org/W4416549086","https://openalex.org/W7083629957","https://openalex.org/W7092182791","https://openalex.org/W7134944108"],"related_works":[],"abstract_inverted_index":{"Modern":[0],"processors":[1],"are":[2],"increasingly":[3],"complex,":[4],"with":[5],"rich":[6],"microarchitectural":[7],"features":[8],"and":[9,18,58,86,92,120,129,176],"heterogeneous":[10],"components.":[11],"This":[12],"complexity":[13],"expands":[14],"the":[15,61,79,101,115,122,134],"attack":[16],"surface":[17],"makes":[19],"security":[20,27],"vulnerabilities":[21,65,94,142],"harder":[22],"to":[23,48,55,67,89,106,127,161,169,183],"detect":[24,91],"using":[25,157],"traditional":[26],"techniques.":[28],"Hardware":[29],"fuzzing":[30,75,108,171,182,185],"has":[31],"emerged":[32],"as":[33],"a":[34],"scalable":[35],"approach":[36],"for":[37],"uncovering":[38],"insecure":[39],"behaviors":[40,132],"in":[41,95,147],"modern":[42],"processors.":[43,96],"However,":[44],"it":[45],"often":[46],"struggles":[47],"(i)":[49,100],"explore":[50],"hard-to-reach":[51,110],"design":[52,68,111,167],"spaces":[53],"due":[54,66],"its":[56],"randomness":[57],"(ii)":[59,121],"locate":[60],"root":[62],"causes":[63],"of":[64,82,103,117,124,140],"complexity.This":[69],"work":[70],"presents":[71],"advanced":[72],"hybrid":[73],"hardware":[74],"techniques":[76],"that":[77,143],"combine":[78],"complementary":[80],"strengths":[81],"fuzzing,":[83],"formal":[84,104],"verification,":[85],"static":[87,125],"analysis":[88,126],"systematically":[90],"localize":[93],"Specifically,":[97],"we":[98,151],"investigate":[99],"use":[102,123],"verification":[105],"guide":[107],"toward":[109],"spaces,":[112],"thereby":[113],"enabling":[114,138],"discovery":[116],"subtle":[118],"vulnerabilities,":[119],"extract":[128],"monitor":[130],"timing":[131,141],"at":[133],"register-transfer":[135],"level":[136],"(RTL),":[137],"localization":[139],"can":[144],"arise":[145],"even":[146],"functionally":[148],"correct":[149],"designs.Finally,":[150],"outline":[152],"future":[153],"research":[154],"directions,":[155],"including":[156],"large":[158],"language":[159],"models":[160],"generate":[162],"expert-informed":[163],"tests,":[164],"leveraging":[165],"prior":[166],"knowledge":[168],"enhance":[170],"effectiveness":[172],"on":[173],"new":[174],"processors,":[175],"transferring":[177],"effective":[178],"strategies":[179],"from":[180],"white-box":[181],"black-box":[184],"environments.":[186]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-06-05T00:00:00"}