{"id":"https://openalex.org/W4410584083","doi":"https://doi.org/10.23919/date64628.2025.10993139","title":"HachiFI: A Lightweight SoC Architecture-Independent Fault-Injection Framework for SEU Impact Evaluation","display_name":"HachiFI: A Lightweight SoC Architecture-Independent Fault-Injection Framework for SEU Impact Evaluation","publication_year":2025,"publication_date":"2025-03-31","ids":{"openalex":"https://openalex.org/W4410584083","doi":"https://doi.org/10.23919/date64628.2025.10993139"},"language":"en","primary_location":{"id":"doi:10.23919/date64628.2025.10993139","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10993139","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation &amp;amp; Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046207386","display_name":"Quan Cheng","orcid":"https://orcid.org/0000-0001-5519-3258"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Quan Cheng","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065071055","display_name":"Wang Liao","orcid":"https://orcid.org/0000-0003-2134-5588"},"institutions":[{"id":"https://openalex.org/I35568498","display_name":"Kochi University of Technology","ror":"https://ror.org/00rghrr56","country_code":"JP","type":"education","lineage":["https://openalex.org/I35568498"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wang Liao","raw_affiliation_strings":["School of Systems Engineering, Kochi University of Technology,Kochi,Japan"],"affiliations":[{"raw_affiliation_string":"School of Systems Engineering, Kochi University of Technology,Kochi,Japan","institution_ids":["https://openalex.org/I35568498"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048881917","display_name":"Ruilin Zhang","orcid":"https://orcid.org/0000-0001-6807-0521"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ruilin Zhang","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115593520","display_name":"Hao Yu","orcid":"https://orcid.org/0009-0008-6002-6276"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Yu","raw_affiliation_strings":["School of Microelectronics, Southern University of Science and Technology,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Southern University of Science and Technology,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021091015","display_name":"Longyang Lin","orcid":"https://orcid.org/0000-0002-4702-737X"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longyang Lin","raw_affiliation_strings":["School of Microelectronics, Southern University of Science and Technology,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Southern University of Science and Technology,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101943307","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-3819-4504"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5046207386"],"corresponding_institution_ids":["https://openalex.org/I22299242"],"apc_list":null,"apc_paid":null,"fwci":1.5927,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.83993287,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7268292903900146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5952805280685425},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5925341844558716},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.519626796245575},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4731803238391876},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.44897547364234924},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4110891819000244},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20616745948791504},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18814778327941895},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1030832827091217}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7268292903900146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5952805280685425},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5925341844558716},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.519626796245575},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4731803238391876},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.44897547364234924},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4110891819000244},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20616745948791504},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18814778327941895},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1030832827091217},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date64628.2025.10993139","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10993139","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation &amp;amp; Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G522892186","display_name":null,"funder_award_id":"24H00073","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2109207645","https://openalex.org/W2141068710","https://openalex.org/W2150025103","https://openalex.org/W2903175372","https://openalex.org/W2998449462","https://openalex.org/W3013072087","https://openalex.org/W3101271453","https://openalex.org/W3129330586","https://openalex.org/W3166646190","https://openalex.org/W3186796872","https://openalex.org/W3206524228","https://openalex.org/W3215987657","https://openalex.org/W3217233231","https://openalex.org/W3217417534","https://openalex.org/W4302376252","https://openalex.org/W4360993865","https://openalex.org/W4385832274"],"related_works":["https://openalex.org/W2038503502","https://openalex.org/W3142211975","https://openalex.org/W2099271569","https://openalex.org/W1879443270","https://openalex.org/W2018912978","https://openalex.org/W2130914040","https://openalex.org/W2119122672","https://openalex.org/W4292904049","https://openalex.org/W2136848245","https://openalex.org/W2118050502"],"abstract_inverted_index":{"Single-Event":[0],"Upsets":[1],"(SEUs),":[2],"triggered":[3],"by":[4,24],"energetic":[5],"particles,":[6],"manifest":[7],"as":[8,51],"unexpected":[9],"bit-flips":[10],"in":[11,20],"memory":[12,92],"cells":[13],"or":[14],"registers,":[15],"potentially":[16],"causing":[17],"significant":[18],"anomalies":[19],"electronic":[21,39],"devices.":[22],"Driven":[23],"the":[25,35,98],"needs":[26],"of":[27,37,100],"safety-critical":[28],"applications,":[29],"it":[30],"is":[31],"crucial":[32],"to":[33,63],"evaluate":[34],"reliability":[36,47,117],"these":[38,75],"devices":[40],"before":[41],"they":[42],"are":[43,54],"deployed.":[44],"However,":[45],"traditional":[46],"analysis":[48],"techniques,":[49],"such":[50],"irradiation":[52,138],"experiments,":[53,139],"costly,":[55],"while":[56],"fault":[57,86,109],"injection":[58,87,110],"(FI)":[59],"simulations":[60],"often":[61],"fail":[62],"provide":[64],"full":[65],"coverage":[66,90],"and":[67,71,93,96,115,128,137],"have":[68],"limited":[69],"effectiveness":[70],"accuracy.":[72],"To":[73],"address":[74],"issues,":[76],"we":[77,121],"introduce":[78],"HachiFI,":[79,120],"a":[80,123,129,142],"lightweight,":[81],"architecture-independent":[82],"framework":[83],"that":[84],"automates":[85],"with":[88],"100%":[89],"via":[91],"scan-chain":[94],"accesses":[95],"simulates":[97],"behavior":[99],"SEUs":[101],"based":[102],"on":[103,141],"specific":[104],"cross-sections.":[105],"HachiFI":[106],"supports":[107],"configurable":[108],"patterns":[111],"for":[112],"both":[113],"system-level":[114],"module-level":[116],"analysis.":[118],"Using":[119],"demonstrate":[122],"low":[124],"hardware":[125],"overhead":[126],"(<2%)":[127],"high":[130],"match":[131],"(R<sup":[132],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[133],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>=0.984)":[134],"between":[135],"FI":[136],"verified":[140],"22nm":[143],"edge-AI":[144],"chip.":[145]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2025-10-10T00:00:00"}