{"id":"https://openalex.org/W4410583925","doi":"https://doi.org/10.23919/date64628.2025.10993125","title":"Compute-in-Memory Array Design Using Stacked Hybrid IGZO/Si eDRAM cells","display_name":"Compute-in-Memory Array Design Using Stacked Hybrid IGZO/Si eDRAM cells","publication_year":2025,"publication_date":"2025-03-31","ids":{"openalex":"https://openalex.org/W4410583925","doi":"https://doi.org/10.23919/date64628.2025.10993125"},"language":"en","primary_location":{"id":"doi:10.23919/date64628.2025.10993125","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10993125","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072306970","display_name":"Munhyeon Kim","orcid":"https://orcid.org/0000-0003-0177-8933"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Munhyeon Kim","raw_affiliation_strings":["Seoul National University,Electrical and Computer Engineering,Seoul,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Electrical and Computer Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012718779","display_name":"Yulhwa Kim","orcid":"https://orcid.org/0000-0003-3735-821X"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yulhwa Kim","raw_affiliation_strings":["Sungkyunkwan University,Semiconductor Systems Engineering,Suwon-Si,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sungkyunkwan University,Semiconductor Systems Engineering,Suwon-Si,South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003219699","display_name":"Jae\u2010Joon Kim","orcid":"https://orcid.org/0000-0001-5175-8258"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Joon Kim","raw_affiliation_strings":["Seoul National University,Electrical and Computer Engineering,Seoul,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Electrical and Computer Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4704,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.86578781,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.58207768201828},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5496736764907837},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4693300127983093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4535059928894043},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40890175104141235},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32698312401771545},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3222799301147461},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18519872426986694}],"concepts":[{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.58207768201828},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5496736764907837},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4693300127983093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4535059928894043},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40890175104141235},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32698312401771545},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3222799301147461},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18519872426986694}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date64628.2025.10993125","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10993125","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F1009347708","display_name":"BK21 FOUR Future Veterinary Medicine Leading Education and Research Center, College of Veterinary Medicine, Seoul National University","ror":null},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2002293402","https://openalex.org/W2059100750","https://openalex.org/W2117539524","https://openalex.org/W2160815625","https://openalex.org/W2161091390","https://openalex.org/W2194775991","https://openalex.org/W2289252105","https://openalex.org/W2618530766","https://openalex.org/W2792893539","https://openalex.org/W2920326572","https://openalex.org/W2944441642","https://openalex.org/W2966285227","https://openalex.org/W3006170651","https://openalex.org/W3006600764","https://openalex.org/W3015432327","https://openalex.org/W3026786299","https://openalex.org/W3099871312","https://openalex.org/W3108565132","https://openalex.org/W3135701542","https://openalex.org/W4226115116","https://openalex.org/W4285306539","https://openalex.org/W4286571707","https://openalex.org/W4386764212","https://openalex.org/W4391594512","https://openalex.org/W4391622552","https://openalex.org/W4401881203","https://openalex.org/W4404133850","https://openalex.org/W6605323724","https://openalex.org/W6637373629","https://openalex.org/W6755207826"],"related_works":["https://openalex.org/W584199711","https://openalex.org/W2531015657","https://openalex.org/W1657895706","https://openalex.org/W4245252736","https://openalex.org/W4387409287","https://openalex.org/W2233659135","https://openalex.org/W2120454729","https://openalex.org/W2132321654","https://openalex.org/W2004369723","https://openalex.org/W2611005572"],"abstract_inverted_index":{"To":[0],"effectively":[1],"accelerate":[2],"neural":[3,88],"networks":[4],"in":[5,196],"compute-in-memory":[6],"(CIM)":[7],"based":[8,96],"systems,":[9],"higher":[10,119,133],"memory":[11,32],"cell":[12,56,70,121,178],"density":[13,122,134],"is":[14,34,102],"essential":[15],"to":[16,53,63,107,124,136,148],"handle":[17],"the":[18,41,169,174,214,220,230],"increasing":[19],"computational":[20],"workload":[21],"and":[22,58,71,83,129,145,151,162,180,200,225],"number":[23],"of":[24,176,222,232],"parameters.":[25],"While":[26],"CMOS":[27,149],"embedded":[28],"dynamic":[29],"random":[30],"access":[31],"(eDRAM)":[33],"being":[35],"explored":[36],"as":[37],"an":[38],"alternative,":[39],"improving":[40],"short":[42],"retention":[43,181,187],"time$(t_{ret})$($t_{ret}$(>":[44],"100":[45,103],"s),":[46],"but":[47],"additional":[48],"improvements":[49],"are":[50],"needed":[51],"due":[52],"its":[54],"substantial":[55],"variability":[57,146,179],"slower":[59],"operating":[60],"speed":[61],"compared":[62,106,123,135],"CMOS-based":[64,137],"cells.":[65],"This":[66],"paper":[67],"proposes":[68],"a":[69,85,116,130,212],"array":[72],"design":[73],"for":[74,160,189],"CIM":[75,171,191,218,227],"using":[76,168],"3T-based":[77],"stacked":[78],"hybrid":[79],"IGZO/Si":[80],"eDRAM":[81,110,139,150,217],"(Hybrid-3T)":[82],"performs":[84],"system-level":[86,184],"deep":[87],"network":[89],"(DNN)":[90],"evaluation.":[91],"The":[92,112,186],"Hybrid-3T":[93,114,197,216],"cell,":[94],"designed":[95],"on":[97,183],"7-nm":[98],"FinFET":[99],"technology,":[100],"achieves$t_{ret}$that":[101],"s":[104],"longer":[105,195,207],"IGZO-based":[108],"3T":[109,138],"(IGZO-3T).":[111],"proposed":[113,170,215],"offers":[115],"3.4":[117],"\u00d7":[118,132,206],"bit":[120,127],"8T":[125],"SRAM":[126],"cells":[128],"2":[131],"(CMOS-3T),":[140],"while":[141],"demonstrating":[142],"similar":[143],"throughput":[144],"levels":[147],"SRAM-based":[152],"systems.":[153,235],"Furthermore,":[154],"we":[155],"evaluate":[156],"DNN":[157],"inference":[158],"accuracy":[159],"vision":[161],"natural":[163],"language":[164],"processing":[165],"(NLP)":[166],"tasks":[167],"design,":[172],"examining":[173],"impact":[175],"improved":[177],"time":[182,188],"characteristics.":[185],"ensuring":[190],"operation":[192],"accuracy$(t_{ret,CIM})$is":[193],"108times":[194],"than":[198,204,208],"CMOS-3T,":[199],"the$t_{ret,CIM}$considering":[201],"variability$(t_{ret,CIM_{v}})$is":[202],"more":[203],"3":[205],"IGZO-3T":[209,226],"eDRAM.":[210],"As":[211],"result,":[213],"leverages":[219],"advantages":[221],"both":[223],"CMOS-3T":[224],"designs,":[228],"enabling":[229],"development":[231],"high-performance,":[233],"reliable":[234]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}