{"id":"https://openalex.org/W4410583690","doi":"https://doi.org/10.23919/date64628.2025.10992904","title":"Transistor Aging and Circuit Reliability at Cryogenic Temperatures","display_name":"Transistor Aging and Circuit Reliability at Cryogenic Temperatures","publication_year":2025,"publication_date":"2025-03-31","ids":{"openalex":"https://openalex.org/W4410583690","doi":"https://doi.org/10.23919/date64628.2025.10992904"},"language":"en","primary_location":{"id":"doi:10.23919/date64628.2025.10992904","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10992904","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056827862","display_name":"J. Diaz-Fortuny","orcid":"https://orcid.org/0000-0002-8186-071X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Javier Diaz-Fortuny","raw_affiliation_strings":["Advanced Reliability, Robustness and Test, imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Advanced Reliability, Robustness and Test, imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085206994","display_name":"Vishal Nayar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Vishal Nayar","raw_affiliation_strings":["Advanced Reliability, Robustness and Test, imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Advanced Reliability, Robustness and Test, imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5056827862"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.7428,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.72268723,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7072317600250244},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7012017965316772},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5422616004943848},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5216308236122131},{"id":"https://openalex.org/keywords/cryogenic-temperature","display_name":"Cryogenic temperature","score":0.49401384592056274},{"id":"https://openalex.org/keywords/cryogenics","display_name":"Cryogenics","score":0.4477510452270508},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4176813066005707},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40123844146728516},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.391561359167099},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38120022416114807},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3771839439868927},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23532181978225708},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1607028841972351},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1409500241279602},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.0795537531375885},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.06577277183532715}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7072317600250244},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7012017965316772},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5422616004943848},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5216308236122131},{"id":"https://openalex.org/C2985130431","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenic temperature","level":2,"score":0.49401384592056274},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.4477510452270508},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4176813066005707},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40123844146728516},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.391561359167099},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38120022416114807},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3771839439868927},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23532181978225708},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1607028841972351},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1409500241279602},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0795537531375885},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.06577277183532715},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date64628.2025.10992904","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date64628.2025.10992904","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Design, Automation & Test in Europe Conference (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2102352834","https://openalex.org/W2108661028","https://openalex.org/W2996946661","https://openalex.org/W3020771783","https://openalex.org/W3039772691","https://openalex.org/W3160393719","https://openalex.org/W3195839992","https://openalex.org/W4317793303","https://openalex.org/W4367044174","https://openalex.org/W4376606809","https://openalex.org/W4379033988","https://openalex.org/W4393141584","https://openalex.org/W4399491335"],"related_works":["https://openalex.org/W4244225764","https://openalex.org/W2080652734","https://openalex.org/W2017432886","https://openalex.org/W1970616762","https://openalex.org/W1973617994","https://openalex.org/W2160424718","https://openalex.org/W2164592883","https://openalex.org/W4211113447","https://openalex.org/W4385363489","https://openalex.org/W4240289148"],"abstract_inverted_index":{"The":[0,93],"increasing":[1],"interest":[2],"in":[3,86,123],"cryogenic":[4,25,55,116,159],"circuits":[5,100,143],"is":[6],"driven":[7],"by":[8],"their":[9,111],"transformative":[10],"potential":[11],"across":[12],"high-performance":[13],"computing,":[14],"medical":[15],"devices,":[16],"space":[17],"exploration,":[18],"and":[19,31,43,81,137],"quantum":[20],"technologies.":[21],"Operating":[22],"transistors":[23],"at":[24,54,69,115,138,144,157],"temperatures,":[26,56],"such":[27],"as":[28],"77":[29,139],"K":[30,140],"below,":[32],"yields":[33],"substantial":[34],"improvements,":[35],"including":[36],"increased":[37],"ON":[38],"current,":[39,42],"reduced":[40],"OFF":[41],"enhanced":[44],"sub-threshold":[45],"slope.":[46],"While":[47],"recent":[48],"studies":[49],"have":[50],"explored":[51],"device-level":[52],"reliability":[53],"circuit-level":[57],"reliability-particularly":[58],"under":[59],"bias":[60],"temperature":[61,134],"instability":[62],"(BTI)-remains":[63],"underexamined,":[64],"leaving":[65],"critical":[66],"aging":[67,106,154],"mechanisms":[68],"these":[70],"temperatures":[71],"not":[72],"well":[73],"understood.":[74],"To":[75],"bridge":[76],"this":[77],"gap,":[78],"we":[79,119],"designed":[80],"fabricated":[82],"a":[83,87,124],"customized":[84],"chip":[85,94],"commercial":[88],"HKMG":[89],"28":[90],"nm":[91],"technology.":[92],"integrates":[95],"several":[96],"ring":[97],"oscillator":[98],"(RO)":[99],"for":[101],"precise":[102],"characterization":[103],"of":[104,110,152],"accelerated":[105],"effects,":[107],"enabling":[108],"evaluation":[109],"impact":[112],"on":[113],"performance":[114],"temperatures.":[117,160],"Finally,":[118],"project":[120],"technology":[121],"degradation":[122],"10-year":[125],"future":[126],"comparing,":[127],"the":[128,145,149],"achieved":[129],"wear":[130],"out":[131],"between":[132],"room":[133],"(298":[135],"K)":[136],"when":[141,155],"operating":[142,156],"nominal":[146],"voltage,":[147],"revealing":[148],"significant":[150],"mitigation":[151],"BTI":[153],"affordable":[158]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}