{"id":"https://openalex.org/W4401567924","doi":"https://doi.org/10.23919/date58400.2024.10546845","title":"Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model","display_name":"Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model","publication_year":2024,"publication_date":"2024-03-25","ids":{"openalex":"https://openalex.org/W4401567924","doi":"https://doi.org/10.23919/date58400.2024.10546845"},"language":"en","primary_location":{"id":"doi:10.23919/date58400.2024.10546845","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date58400.2024.10546845","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086812904","display_name":"S. Lee","orcid":"https://orcid.org/0000-0003-2302-7348"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seunggyu Lee","raw_affiliation_strings":["School of Electrical Engineering, KAIST,Daejeon,Korea,34141"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST,Daejeon,Korea,34141","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001898344","display_name":"Daijoon Hyun","orcid":"https://orcid.org/0000-0002-0576-9666"},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Daijoon Hyun","raw_affiliation_strings":["Sejong University,Department of Semiconductor Systems Engineering,Seoul,Korea,05006"],"affiliations":[{"raw_affiliation_string":"Sejong University,Department of Semiconductor Systems Engineering,Seoul,Korea,05006","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015515520","display_name":"Younggwang Jung","orcid":"https://orcid.org/0000-0003-4850-4059"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Younggwang Jung","raw_affiliation_strings":["School of Electrical Engineering, KAIST,Daejeon,Korea,34141"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST,Daejeon,Korea,34141","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015455698","display_name":"Gangmin Cho","orcid":"https://orcid.org/0000-0001-6788-0880"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gangmin Cho","raw_affiliation_strings":["School of Electrical Engineering, KAIST,Daejeon,Korea,34141"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST,Daejeon,Korea,34141","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091647573","display_name":"Young-Soo Shin","orcid":"https://orcid.org/0000-0003-1030-9979"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngsoo Shin","raw_affiliation_strings":["School of Electrical Engineering, KAIST,Daejeon,Korea,34141"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST,Daejeon,Korea,34141","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5086812904"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1035331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9323999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9323999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9193000197410583,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.573914647102356},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5589402318000793},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5109773874282837},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4637477993965149},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34088659286499023},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21095547080039978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17580941319465637},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13521400094032288}],"concepts":[{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.573914647102356},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5589402318000793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5109773874282837},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4637477993965149},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34088659286499023},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21095547080039978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17580941319465637},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13521400094032288}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date58400.2024.10546845","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date58400.2024.10546845","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W4241196849","https://openalex.org/W2375192119","https://openalex.org/W3211653297","https://openalex.org/W2160426385","https://openalex.org/W2125292608"],"abstract_inverted_index":{"IR-drop":[0,120,165],"analysis":[1,28,73,121],"of":[2,12,57,84,95,104,122,140,185],"analog":[3],"circuits":[4],"is":[5,34,52,62,70,110,116,167],"a":[6],"challenge":[7],"because":[8],"the":[9,27,72,91,161,170],"current":[10,58,181],"waveforms":[11],"target":[13],"transistors,":[14],"with":[15,64,178,191],"connection":[16,69],"to":[17,81,149],"VDD":[18],"or":[19],"VSS,":[20,89],"are":[21,79,134,143],"extracted":[22,168],"through":[23,147],"transistor-level":[24],"simulation,":[25],"and":[26,90,93,131,145],"itself,":[29],"in":[30,66,74,176],"particular":[31],"dynamic":[32],"one,":[33],"computationally":[35],"expensive.":[36],"We":[37],"introduce":[38],"two":[39],"ML":[40],"models":[41],"for":[42,54,71,118,151,180],"high-speed":[43],"analysis.":[44],"(1)":[45],"Recurrent":[46],"synchronized":[47,80],"graph":[48],"convolutional":[49],"network":[50],"(RS-GCN)":[51],"used":[53],"quick":[55],"prediction":[56,108,193],"waveforms.":[59],"Each":[60],"subcircuit":[61],"modeled":[63],"recurrent-GCN,":[65],"which":[67],"recurrent":[68],"discrete":[75],"time":[76],"series.":[77],"Recurrent-GCNs":[78],"take":[82],"account":[83,150],"common":[85],"connections":[86],"including":[87],"VDD,":[88],"inputs":[92],"outputs":[94],"subcircuits.":[96],"Experiments":[97,172],"show":[98],"that":[99,174],"RS-GCN":[100,179],"takes":[101,183],"only":[102],"0.85%":[103],"SPICE":[105],"runtime,":[106],"while":[107],"error":[109],"14%":[111],"on":[112],"average.":[113],"(2)":[114],"Y-Net":[115],"applied":[117],"actual":[119],"small":[123],"layout":[124,153],"partition,":[125],"one":[126,137],"by":[127],"one.":[128],"Pad":[129],"location":[130],"PDN":[132],"resistance":[133],"provided":[135],"as":[136],"2D":[138],"input":[139],"Y-Net;":[141],"they":[142],"encoded":[144],"go":[146],"GCNs":[148],"neighbor":[152],"partitions.":[154],"Current":[155],"map,":[156],"derived":[157],"from":[158,169,187],"RS-GCN,":[159],"becomes":[160],"second":[162],"input.":[163],"Final":[164],"map":[166],"decoder.":[171],"demonstrate":[173],"Y-Net,":[175],"conjunction":[177],"extraction,":[182],"2.5%":[184],"runtime":[186],"popular":[188],"commercial":[189],"solution":[190],"15%":[192],"inaccuracy.":[194]},"counts_by_year":[],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}