{"id":"https://openalex.org/W4401568188","doi":"https://doi.org/10.23919/date58400.2024.10546741","title":"Fast Estimation for Electromigration Nucleation Time Based on Random Activation Energy Model","display_name":"Fast Estimation for Electromigration Nucleation Time Based on Random Activation Energy Model","publication_year":2024,"publication_date":"2024-03-25","ids":{"openalex":"https://openalex.org/W4401568188","doi":"https://doi.org/10.23919/date58400.2024.10546741"},"language":"en","primary_location":{"id":"doi:10.23919/date58400.2024.10546741","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date58400.2024.10546741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029730419","display_name":"Jingyu Jia","orcid":"https://orcid.org/0009-0001-6027-4842"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyu Jia","raw_affiliation_strings":["School of Integrated Circuits, Beijing University of Posts and Telecommunications,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Beijing University of Posts and Telecommunications,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016813457","display_name":"Jianwang Zhai","orcid":"https://orcid.org/0000-0002-1581-3536"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwang Zhai","raw_affiliation_strings":["School of Integrated Circuits, Beijing University of Posts and Telecommunications,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Beijing University of Posts and Telecommunications,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101638624","display_name":"Kang Zhao","orcid":"https://orcid.org/0000-0001-5611-0995"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kang Zhao","raw_affiliation_strings":["School of Integrated Circuits, Beijing University of Posts and Telecommunications,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Beijing University of Posts and Telecommunications,China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139759216"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25928951,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9322999715805054,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9322999715805054,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9758089780807495},{"id":"https://openalex.org/keywords/nucleation","display_name":"Nucleation","score":0.8082882165908813},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.5259979963302612},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4353964924812317},{"id":"https://openalex.org/keywords/activation-energy","display_name":"Activation energy","score":0.42586496472358704},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41584187746047974},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3502679467201233},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.16464680433273315},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13374575972557068},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1330307424068451},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10773420333862305},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09279853105545044}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9758089780807495},{"id":"https://openalex.org/C61048295","wikidata":"https://www.wikidata.org/wiki/Q909022","display_name":"Nucleation","level":2,"score":0.8082882165908813},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.5259979963302612},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4353964924812317},{"id":"https://openalex.org/C95121573","wikidata":"https://www.wikidata.org/wiki/Q190474","display_name":"Activation energy","level":2,"score":0.42586496472358704},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41584187746047974},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3502679467201233},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.16464680433273315},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13374575972557068},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1330307424068451},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10773420333862305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09279853105545044},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date58400.2024.10546741","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date58400.2024.10546741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5029165634","display_name":null,"funder_award_id":"4244107","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"},{"id":"https://openalex.org/G5212839174","display_name":null,"funder_award_id":"4244107","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2081786181","https://openalex.org/W2499331057","https://openalex.org/W2536650897","https://openalex.org/W2587645287","https://openalex.org/W2791362638","https://openalex.org/W3034235312","https://openalex.org/W3149694916","https://openalex.org/W4206741961","https://openalex.org/W4232263905","https://openalex.org/W4353031946"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2542708587","https://openalex.org/W4229007131","https://openalex.org/W2364197307","https://openalex.org/W4381800218","https://openalex.org/W2034853009","https://openalex.org/W2381557379","https://openalex.org/W2004712986"],"abstract_inverted_index":{"Electromigration":[0],"(EM)":[1],"has":[2],"attracted":[3],"significant":[4],"interest":[5],"in":[6,87],"recent":[7],"years,":[8],"because":[9],"the":[10,23,29,32,61,76,92],"current":[11],"density":[12],"of":[13,31],"on-chip":[14],"power":[15],"delivery":[16],"networks":[17],"(PDNs)":[18],"is":[19,26],"always":[20],"increasing.":[21],"However,":[22],"EM":[24,44,56],"phenomenon":[25],"affected":[27],"by":[28],"randomness":[30],"annealing":[33],"process":[34],"during":[35],"nanofabrication,":[36],"which":[37],"requires":[38],"more":[39],"reliable":[40],"statistical":[41],"models":[42],"for":[43,55],"analysis.":[45],"In":[46],"this":[47],"work,":[48],"we":[49],"propose":[50],"a":[51],"fast":[52],"estimation":[53,88],"method":[54,70],"nucleation":[57,77],"time":[58,78],"based":[59],"on":[60],"random":[62,81],"activation":[63],"energy":[64],"model.":[65],"Experiments":[66],"demonstrate":[67],"that":[68],"our":[69],"can":[71],"accurately":[72],"and":[73,83],"efficiently":[74],"analyze":[75],"distribution":[79],"under":[80],"processes,":[82],"achieve":[84],"39.1%":[85],"improvement":[86],"speed":[89],"compared":[90],"with":[91],"previous":[93],"work.":[94]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}