{"id":"https://openalex.org/W4379115925","doi":"https://doi.org/10.23919/date56975.2023.10137326","title":"Center-of-delay: a new metric to drive timing margin against spatial variation in complex SOCs","display_name":"Center-of-delay: a new metric to drive timing margin against spatial variation in complex SOCs","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379115925","doi":"https://doi.org/10.23919/date56975.2023.10137326"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10137326","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10137326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051698194","display_name":"Christian L\u00fctkemeyer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154351","display_name":"Marvell (United States)","ror":"https://ror.org/04wmff902","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351"]},{"id":"https://openalex.org/I64003239","display_name":"Marvell (Israel)","ror":"https://ror.org/01484hw40","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351","https://openalex.org/I64003239"]}],"countries":["IL","US"],"is_corresponding":true,"raw_author_name":"Christian L\u00fctkemeyer","raw_affiliation_strings":["Marvell Semiconductor, Inc.,Irvine,CA,USA","Marvell Semiconductor, Inc., Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Marvell Semiconductor, Inc.,Irvine,CA,USA","institution_ids":["https://openalex.org/I64003239"]},{"raw_affiliation_string":"Marvell Semiconductor, Inc., Irvine, CA, USA","institution_ids":["https://openalex.org/I4210154351"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026813811","display_name":"Anton Belov","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Anton Belov","raw_affiliation_strings":["Synopsys, Inc.,Dublin,Ireland","Synopsys, Inc., Dublin, Ireland"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc.,Dublin,Ireland","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc., Dublin, Ireland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051698194"],"corresponding_institution_ids":["https://openalex.org/I4210154351","https://openalex.org/I64003239"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04687102,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6577960848808289},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.6349689364433289},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5772221684455872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5698935389518738},{"id":"https://openalex.org/keywords/diagonal","display_name":"Diagonal","score":0.5567867755889893},{"id":"https://openalex.org/keywords/bounding-overwatch","display_name":"Bounding overwatch","score":0.5378732681274414},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.506862461566925},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5006618499755859},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.4836646020412445},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.45021066069602966},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.4119825065135956},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3569766879081726},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34882187843322754},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.26103460788726807},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.2417522370815277},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2082482874393463},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19065424799919128},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1316891312599182},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.08168208599090576}],"concepts":[{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6577960848808289},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.6349689364433289},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5772221684455872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5698935389518738},{"id":"https://openalex.org/C130367717","wikidata":"https://www.wikidata.org/wiki/Q189791","display_name":"Diagonal","level":2,"score":0.5567867755889893},{"id":"https://openalex.org/C63584917","wikidata":"https://www.wikidata.org/wiki/Q333286","display_name":"Bounding overwatch","level":2,"score":0.5378732681274414},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.506862461566925},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5006618499755859},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.4836646020412445},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.45021066069602966},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.4119825065135956},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3569766879081726},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34882187843322754},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.26103460788726807},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.2417522370815277},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2082482874393463},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19065424799919128},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1316891312599182},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.08168208599090576},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10137326","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10137326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1508076293","https://openalex.org/W1693570377","https://openalex.org/W1969797388","https://openalex.org/W1997790667","https://openalex.org/W2080826304","https://openalex.org/W2136328167","https://openalex.org/W2160859600","https://openalex.org/W3145643822","https://openalex.org/W3145747011","https://openalex.org/W6637338991","https://openalex.org/W6680337182"],"related_works":["https://openalex.org/W2100329931","https://openalex.org/W2145535176","https://openalex.org/W2158805860","https://openalex.org/W4229446324","https://openalex.org/W1570180536","https://openalex.org/W2117925677","https://openalex.org/W3140640533","https://openalex.org/W2110367374","https://openalex.org/W2014777185","https://openalex.org/W4386492228"],"abstract_inverted_index":{"Complex":[0],"VLSI":[1],"SOCs":[2,10],"are":[3],"manufactured":[4],"on":[5,63],"large":[6],"300mm":[7],"wafers.":[8],"Individual":[9],"can":[11],"show":[12],"significant":[13],"spatial":[14],"performance":[15,81],"gradients":[16,82],"in":[17,31,50],"the":[18,41,44,48,64,67,90,101],"order":[19],"of":[20,43,66,69],"10%":[21],"per":[22],"10mm.":[23],"The":[24],"traditional":[25],"approach":[26,61,77,92],"to":[27],"handling":[28],"this":[29,55,75],"variation":[30],"STA":[32],"tools":[33],"is":[34,93],"a":[35,51,59,70],"margin":[36],"look-up":[37],"table":[38],"indexed":[39],"by":[40],"diagonal":[42],"bounding":[45],"box":[46],"around":[47],"gates":[49],"timing":[52,71],"path.":[53,72],"In":[54],"paper":[56],"we":[57],"propose":[58],"new":[60,76,91],"based":[62],"concept":[65],"Center-of-Delay":[68],"We":[73],"justify":[74],"theoretically":[78],"for":[79],"linear":[80],"and":[83,96],"present":[84],"experimental":[85],"data":[86],"that":[87,89],"shows":[88],"both":[94],"safe,":[95],"significantly":[97],"less":[98],"pessimistic":[99],"than":[100],"existing":[102],"method.":[103]},"counts_by_year":[],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-10-10T00:00:00"}