{"id":"https://openalex.org/W4379115891","doi":"https://doi.org/10.23919/date56975.2023.10137286","title":"Two-Stream Neural Network for Post-Layout Waveform Prediction","display_name":"Two-Stream Neural Network for Post-Layout Waveform Prediction","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379115891","doi":"https://doi.org/10.23919/date56975.2023.10137286"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10137286","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10137286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110984711","display_name":"Sanghwi Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]},{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Sanghwi Kim","raw_affiliation_strings":["DRAM Design Team, SK Hynix,Icheon,Korea","DRAM Design Team, SK Hynix, Icheon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DRAM Design Team, SK Hynix,Icheon,Korea","institution_ids":["https://openalex.org/I10654025"]},{"raw_affiliation_string":"DRAM Design Team, SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102016352","display_name":"Hye\u2010Jin Shin","orcid":"https://orcid.org/0000-0002-2266-0005"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]},{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Hyejin Shin","raw_affiliation_strings":["DRAM Design Team, SK Hynix,Icheon,Korea","DRAM Design Team, SK Hynix, Icheon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DRAM Design Team, SK Hynix,Icheon,Korea","institution_ids":["https://openalex.org/I10654025"]},{"raw_affiliation_string":"DRAM Design Team, SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103609704","display_name":"Hyunkyu Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]},{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Hyunkyu Kim","raw_affiliation_strings":["DRAM Design Team, SK Hynix,Icheon,Korea","DRAM Design Team, SK Hynix, Icheon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DRAM Design Team, SK Hynix,Icheon,Korea","institution_ids":["https://openalex.org/I10654025"]},{"raw_affiliation_string":"DRAM Design Team, SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04575299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8999993801116943},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7422374486923218},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.6761025786399841},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6242467761039734},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5356936454772949},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42418766021728516},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4171645939350128},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32511889934539795},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32193344831466675},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18693950772285461},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13519158959388733}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8999993801116943},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7422374486923218},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.6761025786399841},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6242467761039734},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5356936454772949},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42418766021728516},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4171645939350128},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32511889934539795},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32193344831466675},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18693950772285461},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13519158959388733},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10137286","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10137286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2070953140","https://openalex.org/W3091933103","https://openalex.org/W3092098889","https://openalex.org/W6667916691"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W4401568740","https://openalex.org/W2098207691","https://openalex.org/W3148568549","https://openalex.org/W1648516568","https://openalex.org/W361036515","https://openalex.org/W2269474412","https://openalex.org/W4211178602","https://openalex.org/W2433923775","https://openalex.org/W2348795485"],"abstract_inverted_index":{"The":[0,79,109],"gap":[1],"between":[2],"pre-":[3],"and":[4,60],"post-simulation,":[5],"as":[6,8],"well":[7],"the":[9,14,17,36,49,54,68,73,96,113,118,121,140],"considerable":[10],"layout":[11],"time,":[12],"increases":[13],"significance":[15],"of":[16,57,72,85,91,103,105,107],"post-layout":[18,32,125,137],"waveform":[19,126],"prediction":[20,33],"in":[21,120],"dynamic":[22],"random":[23],"access":[24],"memory":[25],"(DRAM)":[26],"design.":[27],"This":[28],"study":[29],"develops":[30],"a":[31,42,62,130],"model":[34,81,110],"using":[35,53,149],"following":[37],"two-stream":[38],"neural":[39,45,64],"network:":[40],"(1)":[41],"multi-layer":[43],"perceptron":[44],"network":[46,65],"to":[47,66,135],"calculate":[48],"coupling":[50],"noise":[51],"by":[52,75,116],"physical":[55],"properties":[56],"global":[58],"interconnects,":[59],"(2)":[61],"convolutional":[63],"compute":[67],"time":[69],"series":[70],"trends":[71],"waveforms":[74,138,144],"referencing":[76],"adjacent":[77],"signals.":[78],"proposed":[80,151],"trains":[82],"two":[83],"types":[84],"heterogeneous":[86],"data":[87],"such":[88],"that":[89],"accuracy":[90],"95.5%":[92],"is":[93],"achieved":[94],"on":[95],"1b":[97],"DRAM":[98],"process":[99],"16Gb":[100],"DDR5":[101],"composed":[102],"hundreds":[104],"millions":[106],"transistors.":[108],"significantly":[111],"improves":[112],"design":[114,142],"completeness":[115],"pre-detecting":[117],"deterioration":[119],"signal":[122],"quality":[123],"via":[124],"prediction.":[127],"Generally,":[128],"although":[129],"few":[131],"weeks":[132],"are":[133],"required":[134],"obtain":[136],"after":[139],"circuit":[141],"process,":[143],"can":[145],"be":[146],"instantly":[147],"predicted":[148],"our":[150],"model.":[152]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}