{"id":"https://openalex.org/W4379116002","doi":"https://doi.org/10.23919/date56975.2023.10137200","title":"eF<sup>2</sup>lowSim: System-Level Simulator of eFlash-Based Compute-in-Memory Accelerators for Convolutional Neural Networks","display_name":"eF<sup>2</sup>lowSim: System-Level Simulator of eFlash-Based Compute-in-Memory Accelerators for Convolutional Neural Networks","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379116002","doi":"https://doi.org/10.23919/date56975.2023.10137200"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10137200","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10137200","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060021326","display_name":"Jooho Wang","orcid":"https://orcid.org/0000-0001-6657-5948"},"institutions":[{"id":"https://openalex.org/I4210091929","display_name":"Konkuk University Medical Center","ror":"https://ror.org/00jcx1769","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I24062138","https://openalex.org/I4210091929"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jooho Wang","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering","Department of Electrical and Electronics Engineering, Konkuk University","Memory Business, Samsung Electronics, Inc"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Konkuk University","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100733417","display_name":"Sunwoo Kim","orcid":"https://orcid.org/0000-0002-7055-6587"},"institutions":[{"id":"https://openalex.org/I4210091929","display_name":"Konkuk University Medical Center","ror":"https://ror.org/00jcx1769","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I24062138","https://openalex.org/I4210091929"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunwoo Kim","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering","Department of Electrical and Electronics Engineering, Konkuk University","Memory Business, Samsung Electronics, Inc"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Konkuk University","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101208707","display_name":"Junsu Heo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091929","display_name":"Konkuk University Medical Center","ror":"https://ror.org/00jcx1769","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I24062138","https://openalex.org/I4210091929"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junsu Heo","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering","Department of Electrical and Electronics Engineering, Konkuk University"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Konkuk University","institution_ids":["https://openalex.org/I4210091929"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072573878","display_name":"Chester Sungchung Park","orcid":"https://orcid.org/0000-0003-2009-2814"},"institutions":[{"id":"https://openalex.org/I4210091929","display_name":"Konkuk University Medical Center","ror":"https://ror.org/00jcx1769","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I24062138","https://openalex.org/I4210091929"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chester Sungchung Park","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering","Department of Electrical and Electronics Engineering, Konkuk University"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering","institution_ids":["https://openalex.org/I4210091929"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Konkuk University","institution_ids":["https://openalex.org/I4210091929"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5060021326"],"corresponding_institution_ids":["https://openalex.org/I4210091929"],"apc_list":null,"apc_paid":null,"fwci":0.2678,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52084344,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dataflow","display_name":"Dataflow","score":0.8227211236953735},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6137738227844238},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5742282867431641},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4439709484577179},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37524914741516113},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.32879960536956787},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.25860124826431274}],"concepts":[{"id":"https://openalex.org/C96324660","wikidata":"https://www.wikidata.org/wiki/Q205446","display_name":"Dataflow","level":2,"score":0.8227211236953735},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6137738227844238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5742282867431641},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4439709484577179},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37524914741516113},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.32879960536956787},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.25860124826431274}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10137200","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10137200","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W2094756095","https://openalex.org/W2147800946","https://openalex.org/W2152839228","https://openalex.org/W2194775991","https://openalex.org/W2289252105","https://openalex.org/W2794288888","https://openalex.org/W2808463410","https://openalex.org/W2899641901","https://openalex.org/W2914227483","https://openalex.org/W2966524683","https://openalex.org/W3006244250","https://openalex.org/W3013370926","https://openalex.org/W3118337360","https://openalex.org/W3172612114","https://openalex.org/W3188508394","https://openalex.org/W3190456202","https://openalex.org/W3203265506","https://openalex.org/W3205563597","https://openalex.org/W4214870144","https://openalex.org/W6637373629","https://openalex.org/W6750171416","https://openalex.org/W6796981835"],"related_works":["https://openalex.org/W2293118914","https://openalex.org/W2998381397","https://openalex.org/W4236419692","https://openalex.org/W3167919718","https://openalex.org/W4251718783","https://openalex.org/W2171015181","https://openalex.org/W4239447582","https://openalex.org/W4225271228","https://openalex.org/W1484403103","https://openalex.org/W2915094885"],"abstract_inverted_index":{"A":[0],"new":[1],"system-level":[2,60],"simulator,":[3],"eF":[4,28,51],"<sup":[5,29,52],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[6,30,53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[7,31,54],"lowSim,":[8],"is":[9,98],"proposed":[10],"to":[11,82,107],"estimate":[12],"the":[13,35,40,50,59,84,101,113],"bit-accurate":[14],"and":[15,73,110,118],"cycle-accurate":[16],"performance":[17,61,74],"of":[18,42,62,75,88,103,115],"eFlash":[19,76,90],"compute-in-memory":[20],"(CIM)":[21],"accelerators":[22],"for":[23,93],"convolutional":[24,95],"neural":[25],"networks.":[26],"The":[27,79],"lowSim":[32,55],"can":[33,56],"predict":[34],"inference":[36],"accuracy":[37],"by":[38],"considering":[39],"impact":[41,69],"circuit":[43],"nonideality":[44],"such":[45],"as":[46],"program":[47],"disturbance.":[48],"Moreover,":[49],"also":[57],"evaluate":[58],"dataflow":[63,86],"strategies":[64],"that":[65,100],"have":[66],"a":[67],"significant":[68],"on":[70],"hardware":[71],"area":[72,104],"CIM":[77,91],"accelerators.":[78],"simulator":[80],"helps":[81],"find":[83],"optimal":[85],"strategy":[87],"an":[89],"accelerator":[92],"each":[94],"layer.":[96],"It":[97],"shown":[99],"improvement":[102],"efficiency":[105],"amounts":[106],"26.8%,":[108],"21.2%":[109],"17.9%":[111],"in":[112],"case":[114],"LeNet-5,":[116],"VGG-9":[117],"ResNet-18,":[119],"respectively.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}