{"id":"https://openalex.org/W4379116099","doi":"https://doi.org/10.23919/date56975.2023.10137146","title":"Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack","display_name":"Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379116099","doi":"https://doi.org/10.23919/date56975.2023.10137146"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10137146","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10137146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100409523","display_name":"Qiang Liu","orcid":"https://orcid.org/0000-0003-1375-0508"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiang Liu","raw_affiliation_strings":["School of Microelectronics, Tianjin University,Tianjin,China","School of Microelectronics, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Tianjin University,Tianjin,China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"School of Microelectronics, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101230019","display_name":"Longtao Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longtao Guo","raw_affiliation_strings":["School of Microelectronics, Tianjin University,Tianjin,China","School of Microelectronics, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Tianjin University,Tianjin,China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"School of Microelectronics, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073832612","display_name":"Honghui Tang","orcid":"https://orcid.org/0000-0003-3142-1812"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honghui Tang","raw_affiliation_strings":["School of Microelectronics, Tianjin University,Tianjin,China","School of Microelectronics, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Tianjin University,Tianjin,China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"School of Microelectronics, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100409523"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":1.147,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.82201023,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9531028270721436},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6824455857276917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6665603518486023},{"id":"https://openalex.org/keywords/universal-memory","display_name":"Universal memory","score":0.6164653301239014},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5952242016792297},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5679007768630981},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5256696343421936},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5114549398422241},{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.4900716543197632},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.41361546516418457},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4125930368900299},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34029507637023926},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3217872977256775},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.30117011070251465},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22590956091880798},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.19393959641456604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14336726069450378},{"id":"https://openalex.org/keywords/memory-management","display_name":"Memory management","score":0.1367417275905609},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09927630424499512},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07967954874038696}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9531028270721436},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6824455857276917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6665603518486023},{"id":"https://openalex.org/C195053848","wikidata":"https://www.wikidata.org/wiki/Q7894141","display_name":"Universal memory","level":5,"score":0.6164653301239014},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5952242016792297},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5679007768630981},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5256696343421936},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5114549398422241},{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.4900716543197632},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.41361546516418457},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4125930368900299},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34029507637023926},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3217872977256775},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.30117011070251465},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22590956091880798},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.19393959641456604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14336726069450378},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.1367417275905609},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09927630424499512},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07967954874038696},{"id":"https://openalex.org/C63511323","wikidata":"https://www.wikidata.org/wiki/Q908936","display_name":"Interleaved memory","level":4,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10137146","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10137146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2751658612","https://openalex.org/W2794463658","https://openalex.org/W2951529663","https://openalex.org/W2973956618","https://openalex.org/W3010117922","https://openalex.org/W3013309564","https://openalex.org/W3036082311","https://openalex.org/W3042003498","https://openalex.org/W3134003455","https://openalex.org/W3135904517","https://openalex.org/W3156681584","https://openalex.org/W3177924429","https://openalex.org/W3202012974","https://openalex.org/W4256477176","https://openalex.org/W6743926752","https://openalex.org/W6798218651"],"related_works":["https://openalex.org/W4289655774","https://openalex.org/W2078659455","https://openalex.org/W2169710001","https://openalex.org/W3192351184","https://openalex.org/W4210447066","https://openalex.org/W4379116099","https://openalex.org/W3173618896","https://openalex.org/W2525798501","https://openalex.org/W2599303646","https://openalex.org/W2769871490"],"abstract_inverted_index":{"Electromagnetic":[0],"fault":[1,42,98,110,124],"injection":[2],"(EMFI)":[3],"attack":[4],"has":[5,21],"posed":[6],"serious":[7],"threats":[8],"to":[9,58,67,77],"the":[10,23,36,40,60,90,97,103,108,123],"security":[11],"of":[12,26,35,44,56,62,65,115,122,129],"integrated":[13],"circuits.":[14],"Memory":[15],"storing":[16],"sensitive":[17,76],"codes":[18],"and":[19,39,82,95],"data":[20],"become":[22],"first":[24],"choice":[25],"attacking":[27],"targets.":[28],"This":[29],"work":[30],"performs":[31],"a":[32,54],"thorough":[33],"characterization":[34],"induced":[37,91],"faults":[38,92],"associated":[41],"model":[43],"EMFI":[45,78,132],"attacks":[46],"on":[47],"DRAM.":[48],"Specifically,":[49],"we":[50,88,101],"firstly":[51],"carry":[52],"out":[53],"set":[55],"experiments":[57],"analyse":[59],"sensitivity":[61],"various":[63],"types":[64],"memory":[66],"EMFI.":[68,118],"The":[69,119],"analysis":[70],"shows":[71],"that":[72,106],"DRAM":[73,94,116,130],"is":[74],"more":[75],"than":[79],"EEPROM,":[80],"Flash,":[81],"SRAM":[83],"in":[84,93],"this":[85],"experiment.":[86],"Then,":[87],"classify":[89],"formulate":[96],"models.":[99],"Finally,":[100],"find":[102],"underlying":[104],"reasons":[105],"explain":[107],"observed":[109],"models":[111,125],"by":[112],"circuit-level":[113],"simulation":[114],"under":[117],"in-depth":[120],"understanding":[121],"will":[126],"guide":[127],"design":[128],"against":[131],"attacks.":[133]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}