{"id":"https://openalex.org/W4379115926","doi":"https://doi.org/10.23919/date56975.2023.10136961","title":"Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection","display_name":"Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379115926","doi":"https://doi.org/10.23919/date56975.2023.10136961"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10136961","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10136961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078514187","display_name":"Zahra Paria Najafi-Haghi","orcid":"https://orcid.org/0000-0003-4341-5014"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Zahra Paria Najafi-Haghi","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003101843","display_name":"Hanieh Jafarzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hanieh Jafarzadeh","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hussam Amrouch","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0619779,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5318801999092102},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5146670937538147},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4554064869880676},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.44302403926849365},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.4287180006504059},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.424377977848053},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.369635671377182},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3305577337741852},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12340232729911804},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0735701322555542}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5318801999092102},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5146670937538147},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4554064869880676},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.44302403926849365},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.4287180006504059},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.424377977848053},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.369635671377182},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3305577337741852},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12340232729911804},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0735701322555542},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10136961","is_oa":false,"landing_page_url":"http://dx.doi.org/10.23919/date56975.2023.10136961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W246882494","https://openalex.org/W2017337590","https://openalex.org/W2067701383","https://openalex.org/W2904275531","https://openalex.org/W2998216295","https://openalex.org/W3024722044","https://openalex.org/W3040443268","https://openalex.org/W3089206893","https://openalex.org/W4200318003","https://openalex.org/W4243072198","https://openalex.org/W4283773151","https://openalex.org/W4312712232","https://openalex.org/W7066667914"],"related_works":["https://openalex.org/W3097847178","https://openalex.org/W609904040","https://openalex.org/W3125204845","https://openalex.org/W2021581299","https://openalex.org/W2483563543","https://openalex.org/W2250707195","https://openalex.org/W2963970486","https://openalex.org/W2160391603","https://openalex.org/W2048286674","https://openalex.org/W1499924000"],"abstract_inverted_index":{"Resistive":[0],"open":[1],"defects":[2,22,46],"in":[3],"FinFET":[4],"circuits":[5,67],"are":[6,23,32,62],"reliability":[7,42],"threats":[8],"and":[9,122],"should":[10,47],"be":[11,48],"ruled":[12],"out":[13],"before":[14],"deployment.":[15],"The":[16,82],"performance":[17],"variations":[18,30],"due":[19],"to":[20,25,38,64,89],"these":[21],"similar":[24],"the":[26,43,73,91,110],"effect":[27,44],"of":[28,45,93],"process":[29,51],"which":[31,107],"mostly":[33],"benign.":[34],"In":[35],"order":[36],"not":[37],"sacrifice":[39],"yield":[40],"for":[41],"distinguished":[49],"from":[50],"variations.":[52],"It":[53,113],"has":[54],"been":[55],"shown":[56,115],"that":[57,116],"machine":[58],"learning":[59],"(ML)":[60],"schemes":[61],"able":[63],"classify":[65],"defective":[66],"with":[68,124],"high":[69],"accuracy":[70],"based":[71],"on":[72],"maximum":[74],"frequencies$F_{max}$obtained":[75],"under":[76],"multiple":[77],"supply":[78,97],"voltages$V_{dd}":[79],"\\in":[80],"V_{op}$.":[81],"paper":[83],"at":[84],"hand":[85],"presents":[86],"a":[87,99],"method":[88],"minimize":[90],"number":[92,127],"required":[94],"measurements.":[95],"Each":[96],"voltage$V_{dd}$defines":[98],"feature$F_{max}(V_{dd})$.":[100],"A":[101],"feature":[102],"selection":[103],"technique":[104],"is":[105,114],"presented,":[106],"uses":[108],"also":[109],"already":[111],"available$F_{max}$measurements.":[112],"ML-based":[117],"techniques":[118],"can":[119],"work":[120],"efficiently":[121],"accurately":[123],"this":[125],"reduced":[126],"of$F_{max}(V_{dd})$measurements.":[128]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}