{"id":"https://openalex.org/W4379116047","doi":"https://doi.org/10.23919/date56975.2023.10136923","title":"Cross Layer Design for the Predictive Assessment of Technology-Enabled Architectures","display_name":"Cross Layer Design for the Predictive Assessment of Technology-Enabled Architectures","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379116047","doi":"https://doi.org/10.23919/date56975.2023.10136923"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10136923","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10136923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-04982729v1/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003032564","display_name":"Michael Niemier","orcid":"https://orcid.org/0000-0001-7776-4306"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M. Niemier","raw_affiliation_strings":["University of Notre Dame,Notre Dame,IN,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Notre Dame,Notre Dame,IN,USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100600905","display_name":"Xiaobo Sharon Hu","orcid":"https://orcid.org/0000-0002-6636-9738"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"X.S. Hu","raw_affiliation_strings":["University of Notre Dame,Notre Dame,IN,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Notre Dame,Notre Dame,IN,USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115602439","display_name":"Haibo Liu","orcid":"https://orcid.org/0000-0002-4213-2883"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Liu","raw_affiliation_strings":["University of Notre Dame,Notre Dame,IN,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Notre Dame,Notre Dame,IN,USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111621479","display_name":"Monir Sharifi","orcid":null},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Sharifi","raw_affiliation_strings":["University of Notre Dame,Notre Dame,IN,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Notre Dame,Notre Dame,IN,USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057554410","display_name":"Ian O\u2019Connor","orcid":"https://orcid.org/0000-0002-6238-9600"},"institutions":[{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ian O\u2019Connor","raw_affiliation_strings":["Ećole Centrale de Lyon,Lyon,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ećole Centrale de Lyon,Lyon,France","institution_ids":["https://openalex.org/I112936343"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074236306","display_name":"David Atienza","orcid":"https://orcid.org/0000-0001-9536-4947"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"David Atienza","raw_affiliation_strings":["École Poly technique FÉdÉrale de Lausanne,Lausanne,Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"École Poly technique FÉdÉrale de Lausanne,Lausanne,Switzerland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044467469","display_name":"Giovanni Ansaloni","orcid":"https://orcid.org/0000-0002-8940-3775"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Giovanni Ansaloni","raw_affiliation_strings":["École Poly technique FÉdÉrale de Lausanne,Lausanne,Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"École Poly technique FÉdÉrale de Lausanne,Lausanne,Switzerland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100334065","display_name":"Can Li","orcid":"https://orcid.org/0000-0003-3795-2008"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I4210142478","display_name":"HKU-Pasteur Research Pole","ror":"https://ror.org/03wwjjr94","country_code":"HK","type":"facility","lineage":["https://openalex.org/I4210142478"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["CN","HK"],"is_corresponding":false,"raw_author_name":"Can Li","raw_affiliation_strings":["The University of Hong Kong,Hong Kong","HKU - The University of Hong Kong (Pokfulam, Hong Kong - R.A.S. chinoise de Hong Kong)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Hong Kong,Hong Kong","institution_ids":["https://openalex.org/I177725633","https://openalex.org/I889458895"]},{"raw_affiliation_string":"HKU - The University of Hong Kong (Pokfulam, Hong Kong - R.A.S. chinoise de Hong Kong)","institution_ids":["https://openalex.org/I4210142478","https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049163544","display_name":"Asif Islam Khan","orcid":"https://orcid.org/0000-0003-4369-106X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Asif Khan","raw_affiliation_strings":["Georgia Institute of Technology,Atlanta,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,Atlanta,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011236497","display_name":"Daniel C. Ralph","orcid":"https://orcid.org/0000-0002-3026-0335"},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel C. Ralph","raw_affiliation_strings":["Cornell University,Ithaca,NY,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cornell University,Ithaca,NY,USA","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5003032564"],"corresponding_institution_ids":["https://openalex.org/I107639228"],"apc_list":null,"apc_paid":null,"fwci":0.2529,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.51667148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7313991785049438},{"id":"https://openalex.org/keywords/construct","display_name":"Construct (python library)","score":0.5942555665969849},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.5112957954406738},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5080487728118896},{"id":"https://openalex.org/keywords/design-space-exploration","display_name":"Design space exploration","score":0.4128553867340088},{"id":"https://openalex.org/keywords/data-science","display_name":"Data science","score":0.40590769052505493},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.34019166231155396},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3388424515724182},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3242186903953552},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1493084728717804},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.13160651922225952}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7313991785049438},{"id":"https://openalex.org/C2780801425","wikidata":"https://www.wikidata.org/wiki/Q5164392","display_name":"Construct (python library)","level":2,"score":0.5942555665969849},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.5112957954406738},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5080487728118896},{"id":"https://openalex.org/C2776221188","wikidata":"https://www.wikidata.org/wiki/Q21072556","display_name":"Design space exploration","level":2,"score":0.4128553867340088},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.40590769052505493},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.34019166231155396},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3388424515724182},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3242186903953552},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1493084728717804},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.13160651922225952},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.23919/date56975.2023.10136923","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10136923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-04982729v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04982729","pdf_url":"https://hal.science/hal-04982729v1/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Apr 2023, Antwerp, France. pp.1-10, ⟨10.23919/DATE56975.2023.10136923⟩","raw_type":"Conference papers"},{"id":"pmh:oai:infoscience.epfl.ch:304662","is_oa":true,"landing_page_url":"https://infoscience.epfl.ch/handle/20.500.14299/200270","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"WoS","raw_type":"conference proceedings"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-04982729v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04982729","pdf_url":"https://hal.science/hal-04982729v1/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Apr 2023, Antwerp, France. pp.1-10, ⟨10.23919/DATE56975.2023.10136923⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6700000166893005,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4379116047.pdf","grobid_xml":"https://content.openalex.org/works/W4379116047.grobid-xml"},"referenced_works_count":53,"referenced_works":["https://openalex.org/W1988257143","https://openalex.org/W2010202670","https://openalex.org/W2034062945","https://openalex.org/W2120635877","https://openalex.org/W2147657366","https://openalex.org/W2285660444","https://openalex.org/W2338061419","https://openalex.org/W2352050502","https://openalex.org/W2472819217","https://openalex.org/W2490345425","https://openalex.org/W2536491920","https://openalex.org/W2562276894","https://openalex.org/W2626667124","https://openalex.org/W2787759178","https://openalex.org/W2885334747","https://openalex.org/W2946111674","https://openalex.org/W2959627720","https://openalex.org/W2988640543","https://openalex.org/W3000277453","https://openalex.org/W3014426053","https://openalex.org/W3037586905","https://openalex.org/W3048581975","https://openalex.org/W3098380984","https://openalex.org/W3098780461","https://openalex.org/W3109708494","https://openalex.org/W3111419387","https://openalex.org/W3159441626","https://openalex.org/W3161571687","https://openalex.org/W3164011397","https://openalex.org/W3189995700","https://openalex.org/W3198539992","https://openalex.org/W3200825586","https://openalex.org/W3213648074","https://openalex.org/W4225777549","https://openalex.org/W4225916833","https://openalex.org/W4249654426","https://openalex.org/W4280636702","https://openalex.org/W4289823466","https://openalex.org/W4292779060","https://openalex.org/W4293025135","https://openalex.org/W4307044055","https://openalex.org/W4308885556","https://openalex.org/W4311978413","https://openalex.org/W4312327301","https://openalex.org/W4312968147","https://openalex.org/W4318685708","https://openalex.org/W4318686084","https://openalex.org/W6652940909","https://openalex.org/W6703338847","https://openalex.org/W6720057410","https://openalex.org/W6778883912","https://openalex.org/W6795578421","https://openalex.org/W6801190807"],"related_works":["https://openalex.org/W2038503502","https://openalex.org/W2111062328","https://openalex.org/W1994609733","https://openalex.org/W2075808029","https://openalex.org/W2108386578","https://openalex.org/W1572417577","https://openalex.org/W1979259943","https://openalex.org/W2000001288","https://openalex.org/W3139655666","https://openalex.org/W2118185763"],"abstract_inverted_index":{"There":[0],"is":[1,168],"great":[2],"interest":[3],"in":[4,198],"\u201cend-to-end\u201d":[5],"analysis":[6],"that":[7,74,116],"captures":[8],"how":[9,56,86],"innovation":[10],"at":[11,23,58,90],"the":[12,24,59,94,121,144,152,159,170,183],"materials,":[13],"device,":[14],"and/or":[15,81],"archi-tectural":[16],"levels":[17,92],"will":[18,84,117],"impact":[19,63],"figures":[20,64],"of":[21,31,65,93,133,147,158,162,169,186],"merit":[22,66],"application-level.":[25],"However,":[26],"there":[27],"are":[28],"numerous":[29],"combinations":[30],"devices":[32],"and":[33,37,46,71,196],"architectures":[34,149],"to":[35,43,54,102,119,125,129,150,173,179],"study,":[36],"we":[38,139],"must":[39],"establish":[40],"systematic":[41],"ways":[42,124],"accurately":[44],"explore":[45],"cull":[47],"a":[48,187],"vast":[49],"design":[50,95,113],"space.":[51,200],"We":[52,83,192],"aim":[53],"capture":[55],"innovations":[57],"materials/device-level":[60],"may":[61,75],"ultimately":[62],"associated":[67],"with":[68,88],"both":[69],"existing":[70],"emerging":[72],"technologies":[73,128],"be":[76],"employed":[77],"for":[78],"either":[79],"logic":[80],"memory.":[82],"highlight":[85,193],"collaborations":[87],"researchers":[89],"these":[91],"hierarchy":[96],"-":[97,108],"as":[98,100],"well":[99],"efforts":[101,195],"help":[103,118],"construct":[104],"well-calibrated":[105,175],"device":[106],"models":[107],"can":[109,140],"in-turn":[110],"support":[111,130],"architectural":[112],"space":[114],"explorations":[115],"identify":[120,151],"most":[122,153],"promising":[123,154],"use":[126],"new":[127],"application-level":[131],"workloads":[132],"interest.":[134],"For":[135],"given":[136,188],"compute":[137],"workloads,":[138],"then":[141],"quantitatively":[142],"assess":[143,182],"potential":[145,184],"benefits":[146],"technology-driven":[148],"paths":[155],"forward.":[156],"Because":[157],"large":[160],"number":[161],"potentially":[163],"interesting":[164],"device-architecture":[165],"combinations,":[166],"it":[167],"utmost":[171],"importance":[172],"develop":[174],"analytical":[176],"modeling":[177],"tools":[178],"more":[180],"rapidly":[181],"value":[185],"(likely":[189],"heterogeneous)":[190],"solution.":[191],"recent":[194],"needs":[197],"this":[199]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}