{"id":"https://openalex.org/W4379116031","doi":"https://doi.org/10.23919/date56975.2023.10136894","title":"MA-Opt: Reinforcement Learning-based Analog Circuit Optimization using Multi-Actors","display_name":"MA-Opt: Reinforcement Learning-based Analog Circuit Optimization using Multi-Actors","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4379116031","doi":"https://doi.org/10.23919/date56975.2023.10136894"},"language":"en","primary_location":{"id":"doi:10.23919/date56975.2023.10136894","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10136894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088408990","display_name":"Youngchang Choi","orcid":"https://orcid.org/0000-0003-4856-182X"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Youngchang Choi","raw_affiliation_strings":["POSTECH,Department of EE,Pohang,South Korea","Department of EE, POSTECH, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"POSTECH,Department of EE,Pohang,South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of EE, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114032941","display_name":"Minjeong Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minjeong Choi","raw_affiliation_strings":["POSTECH,Department of EE,Pohang,South Korea","Department of EE, POSTECH, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"POSTECH,Department of EE,Pohang,South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of EE, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004278314","display_name":"Kyongsu Lee","orcid":"https://orcid.org/0000-0002-0534-6452"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyongsu Lee","raw_affiliation_strings":["POSTECH,Department of EE,Pohang,South Korea","Department of EE, POSTECH, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"POSTECH,Department of EE,Pohang,South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of EE, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044543389","display_name":"Seokhyeong Kang","orcid":"https://orcid.org/0000-0003-3015-1806"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokhyeong Kang","raw_affiliation_strings":["POSTECH,Department of EE,Pohang,South Korea","Department of EE, POSTECH, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"POSTECH,Department of EE,Pohang,South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of EE, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5088408990"],"corresponding_institution_ids":["https://openalex.org/I123900574"],"apc_list":null,"apc_paid":null,"fwci":0.8023,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71241341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11975","display_name":"Evolutionary Algorithms and Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reinforcement-learning","display_name":"Reinforcement learning","score":0.7508701086044312},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7070391774177551},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5898679494857788},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.5290797352790833},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5105346441268921},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4860673248767853},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.47477030754089355},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4338036775588989},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35656046867370605},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29409143328666687},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1647898256778717},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.15081527829170227},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12731337547302246}],"concepts":[{"id":"https://openalex.org/C97541855","wikidata":"https://www.wikidata.org/wiki/Q830687","display_name":"Reinforcement learning","level":2,"score":0.7508701086044312},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7070391774177551},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5898679494857788},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.5290797352790833},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5105346441268921},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4860673248767853},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.47477030754089355},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4338036775588989},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35656046867370605},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29409143328666687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1647898256778717},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.15081527829170227},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12731337547302246},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date56975.2023.10136894","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date56975.2023.10136894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1490633101","https://openalex.org/W1658008008","https://openalex.org/W2065183815","https://openalex.org/W2070334657","https://openalex.org/W2074590526","https://openalex.org/W2106476087","https://openalex.org/W2131241448","https://openalex.org/W2156737235","https://openalex.org/W2161359911","https://openalex.org/W2293251717","https://openalex.org/W2804987245","https://openalex.org/W2945689147","https://openalex.org/W2963864421","https://openalex.org/W2964043796","https://openalex.org/W3036532492","https://openalex.org/W3092618035","https://openalex.org/W3203408580","https://openalex.org/W4249230816","https://openalex.org/W4252419006","https://openalex.org/W6636881020","https://openalex.org/W6678911119","https://openalex.org/W6683185311","https://openalex.org/W6683195989","https://openalex.org/W6684921986","https://openalex.org/W6692846177","https://openalex.org/W6751513613","https://openalex.org/W6752368272"],"related_works":["https://openalex.org/W3214257365","https://openalex.org/W4327500672","https://openalex.org/W2545603903","https://openalex.org/W2734663060","https://openalex.org/W2066877376","https://openalex.org/W2306682566","https://openalex.org/W4318224782","https://openalex.org/W2122222688","https://openalex.org/W1933057227","https://openalex.org/W4313341368"],"abstract_inverted_index":{"Analog":[0],"circuit":[1,28,47,71],"design":[2,11,17,84],"requires":[3],"significant":[4],"human":[5],"efforts":[6],"and":[7,108,134],"expertise;":[8],"therefore,":[9],"electronic":[10],"automation":[12],"(EDA)":[13],"tools":[14],"for":[15,104],"analog":[16,27,106],"are":[18],"needed.":[19],"This":[20],"study":[21],"presents":[22],"MA-Opt":[23,35,101,149,161],"that":[24,55],"is":[25,39,63],"an":[26],"optimizer":[29],"using":[30,36,125],"reinforcement":[31],"learning":[32],"(RL)-inspired":[33],"framework.":[34],"multiple":[37,67,126],"actors":[38,68,127],"proposed":[40,64,99],"to":[41,65,79,155],"provide":[42],"various":[43],"predictions":[44],"of":[45,60,97,115,124,142,165],"optimized":[46,83,91],"designs":[48],"in":[49,85],"parallel.":[50],"Sharing":[51],"a":[52,76,89,129],"specific":[53],"memory":[54],"affects":[56],"the":[57,81,95,98,109,122,135,139,171],"loss":[58],"function":[59],"network":[61],"training":[62],"exploit":[66],"effectively,":[69],"accelerating":[70],"optimization.":[72],"Moreover,":[73],"we":[74],"devise":[75],"novel":[77],"method":[78],"tune":[80],"most":[82],"previous":[86],"simulations":[87],"into":[88],"more":[90],"design.":[92],"To":[93],"demonstrate":[94],"efficiency":[96],"framework,":[100],"was":[102],"simulated":[103],"three":[105],"circuits":[107],"results":[110,120],"were":[111],"compared":[112],"with":[113,128],"those":[114],"other":[116],"methods.":[117],"The":[118],"experimental":[119],"indicated":[121],"strength":[123],"shared":[130],"elite":[131],"solution":[132],"set":[133],"near-sampling":[136],"method.":[137],"Within":[138],"same":[140,172],"number":[141],"simulations,":[143],"while":[144],"satisfying":[145],"all":[146],"given":[147],"constraints,":[148],"obtained":[150,162],"minimum":[151],"target":[152],"metrics":[153],"up":[154],"24%":[156],"better":[157,163],"than":[158,168],"DNN-Opt.":[159],"Furthermore,":[160],"Figure":[164],"Merits":[166],"(FoMs)":[167],"DNN-Opt":[169],"at":[170],"runtime.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}