{"id":"https://openalex.org/W4226313376","doi":"https://doi.org/10.23919/date54114.2022.9774714","title":"Gradient-based Bit Encoding Optimization for Noise-Robust Binary Memristive Crossbar","display_name":"Gradient-based Bit Encoding Optimization for Noise-Robust Binary Memristive Crossbar","publication_year":2022,"publication_date":"2022-03-14","ids":{"openalex":"https://openalex.org/W4226313376","doi":"https://doi.org/10.23919/date54114.2022.9774714"},"language":"en","primary_location":{"id":"doi:10.23919/date54114.2022.9774714","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date54114.2022.9774714","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082196231","display_name":"Youngeun Kim","orcid":"https://orcid.org/0000-0002-3542-7720"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]},{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Youngeun Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology,South Korea","Department of Electrical Engineering, Yale University, USA","Samsung Advanced Institute of Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology,South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, South Korea","institution_ids":["https://openalex.org/I2250650973","https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100441147","display_name":"Hyunsoo Kim","orcid":"https://orcid.org/0000-0002-5194-0372"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsoo Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology,South Korea","Samsung Advanced Institute of Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology,South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, South Korea","institution_ids":["https://openalex.org/I2250650973","https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069070016","display_name":"Seijoon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seijoon Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology,South Korea","Samsung Advanced Institute of Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology,South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, South Korea","institution_ids":["https://openalex.org/I2250650973","https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101464208","display_name":"Sang Joon Kim","orcid":"https://orcid.org/0000-0003-2286-3790"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Joon Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology,South Korea","Samsung Advanced Institute of Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology,South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, South Korea","institution_ids":["https://openalex.org/I2250650973","https://openalex.org/I4399598381"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050310538","display_name":"Priyadarshini Panda","orcid":"https://orcid.org/0000-0002-4167-6782"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Priyadarshini Panda","raw_affiliation_strings":["Yale University,Department of Electrical Engineering,USA","Department of Electrical Engineering, Yale University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yale University,Department of Electrical Engineering,USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, USA","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.652,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.80190698,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1111","last_page":"1114"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.803799033164978},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7458988428115845},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6990177035331726},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.6771446466445923},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6539791822433472},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.6180116534233093},{"id":"https://openalex.org/keywords/binary-code","display_name":"Binary code","score":0.44357383251190186},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44280755519866943},{"id":"https://openalex.org/keywords/artificial-noise","display_name":"Artificial noise","score":0.4383418560028076},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4231053292751312},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.42097729444503784},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3591086268424988},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2501658797264099},{"id":"https://openalex.org/keywords/physical-layer","display_name":"Physical layer","score":0.23801392316818237},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.14930567145347595},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.10870298743247986},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10808619856834412},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1003965437412262},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09713387489318848}],"concepts":[{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.803799033164978},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7458988428115845},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6990177035331726},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.6771446466445923},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6539791822433472},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.6180116534233093},{"id":"https://openalex.org/C63435697","wikidata":"https://www.wikidata.org/wiki/Q864135","display_name":"Binary code","level":3,"score":0.44357383251190186},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44280755519866943},{"id":"https://openalex.org/C2780909371","wikidata":"https://www.wikidata.org/wiki/Q4801092","display_name":"Artificial noise","level":4,"score":0.4383418560028076},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4231053292751312},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.42097729444503784},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3591086268424988},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2501658797264099},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.23801392316818237},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.14930567145347595},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.10870298743247986},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10808619856834412},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1003965437412262},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09713387489318848},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date54114.2022.9774714","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date54114.2022.9774714","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[{"id":"https://openalex.org/G3974418817","display_name":"CRII: SHF: Efficiency-Aware Robust Implementation of Neural Networks with Algorithm-Hardware Co-design","funder_award_id":"1947826","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1836465849","https://openalex.org/W1902934009","https://openalex.org/W2331737637","https://openalex.org/W2399958287","https://openalex.org/W2508602506","https://openalex.org/W2518281301","https://openalex.org/W2603636614","https://openalex.org/W2803163155","https://openalex.org/W2946522000","https://openalex.org/W2983353765","https://openalex.org/W3091835145","https://openalex.org/W3136522402","https://openalex.org/W3198405160","https://openalex.org/W6637373629","https://openalex.org/W6638667902","https://openalex.org/W6639703010"],"related_works":["https://openalex.org/W2145932742","https://openalex.org/W2554791727","https://openalex.org/W1874409533","https://openalex.org/W1981395029","https://openalex.org/W2108083791","https://openalex.org/W4250137794","https://openalex.org/W2063341228","https://openalex.org/W4236027474","https://openalex.org/W3141540147","https://openalex.org/W3061941318"],"abstract_inverted_index":{"Binary":[0],"memristive":[1],"crossbars":[2],"have":[3],"gained":[4],"huge":[5],"attention":[6],"as":[7,129],"an":[8],"energy-efficient":[9],"deep":[10],"learning":[11],"hardware":[12],"accelerator.":[13],"Nonetheless,":[14],"they":[15],"suffer":[16],"from":[17,42],"various":[18],"noises":[19],"due":[20],"to":[21,54,118],"the":[22,26,112,126,130,140,205],"analog":[23],"nature":[24],"of":[25,114,132,143,159,176],"crossbars.":[27],"To":[28],"overcome":[29],"such":[30],"limitations,":[31],"most":[32],"previous":[33],"works":[34],"train":[35],"weight":[36,113],"parameters":[37],"with":[38,116,190],"noise":[39,56,97,119,127,177,188,213],"data":[40,57],"obtained":[41],"a":[43,66,91,99,156,173],"crossbar.":[44],"These":[45],"methods":[46,84],"are,":[47],"however,":[48],"ineffective":[49],"because":[50],"it":[51],"is":[52,76],"difficult":[53],"collect":[55],"in":[58,98,211],"large-volume":[59],"manufacturing":[60],"environment":[61],"where":[62],"each":[63,162,170],"crossbar":[64,96],"has":[65,172],"large":[67],"device/circuit":[68],"level":[69,175],"variation.":[70],"Moreover,":[71],"we":[72,147],"argue":[73],"that":[74,125,169,202],"there":[75],"still":[77],"room":[78],"for":[79],"improvement":[80],"even":[81],"though":[82],"these":[83],"somewhat":[85],"improve":[86],"accuracy.":[87],"This":[88],"paper":[89],"explores":[90],"new":[92],"perspective":[93],"on":[94,165,197],"mitigating":[95],"more":[100],"generalized":[101],"way":[102],"by":[103,208],"manipulating":[104],"input":[105],"binary":[106,133],"bit":[107,134,183],"encoding":[108,135,184],"rather":[109],"than":[110],"training":[111],"networks":[115],"respect":[117],"data.":[120],"We":[121],"first":[122],"mathematically":[123],"show":[124,201],"decreases":[128],"number":[131,158],"pulses":[136,160],"increases":[137],"when":[138],"representing":[139],"same":[141],"amount":[142],"information.":[144],"In":[145],"addition,":[146],"propose":[148],"Gradient-based":[149],"Bit":[150],"Encoding":[151],"Optimization":[152],"(GBO)":[153],"which":[154],"optimizes":[155],"different":[157,174],"at":[161],"layer,":[163],"based":[164],"our":[166],"in-depth":[167],"analysis":[168],"layer":[171],"sensitivity.":[178],"The":[179],"proposed":[180],"heterogeneous":[181],"layer-wise":[182],"scheme":[185],"achieves":[186],"high":[187],"robustness":[189],"low":[191],"computational":[192],"cost.":[193],"Our":[194],"experimental":[195],"results":[196],"public":[198],"benchmark":[199],"datasets":[200],"GBO":[203],"improves":[204],"classification":[206],"accuracy":[207],"\u223c":[209],"5\u201340%":[210],"severe":[212],"scenarios.":[214]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}