{"id":"https://openalex.org/W3183971401","doi":"https://doi.org/10.23919/date51398.2021.9473941","title":"Runtime Fault Injection Detection for FPGA-based DNN Execution Using Siamese Path Verification","display_name":"Runtime Fault Injection Detection for FPGA-based DNN Execution Using Siamese Path Verification","publication_year":2021,"publication_date":"2021-02-01","ids":{"openalex":"https://openalex.org/W3183971401","doi":"https://doi.org/10.23919/date51398.2021.9473941","mag":"3183971401"},"language":"en","primary_location":{"id":"doi:10.23919/date51398.2021.9473941","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date51398.2021.9473941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004580633","display_name":"Xianglong Feng","orcid":"https://orcid.org/0009-0004-1665-0320"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xianglong Feng","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065008304","display_name":"Mengmei Ye","orcid":"https://orcid.org/0000-0002-3434-1968"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mengmei Ye","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079396498","display_name":"Ke Xia","orcid":"https://orcid.org/0000-0002-3999-6031"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ke Xia","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101585930","display_name":"Sheng Wei","orcid":"https://orcid.org/0000-0002-6620-1863"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sheng Wei","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I102322142"],"apc_list":null,"apc_paid":null,"fwci":1.1804,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.77208021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"786","last_page":"789"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.813102126121521},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7641382217407227},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6678135395050049},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.634128987789154},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5871748924255371},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5134466886520386},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4212644100189209},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35970982909202576},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32816624641418457},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.11870825290679932},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0878787636756897}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.813102126121521},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7641382217407227},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6678135395050049},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.634128987789154},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5871748924255371},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5134466886520386},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4212644100189209},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35970982909202576},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32816624641418457},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11870825290679932},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0878787636756897},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date51398.2021.9473941","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date51398.2021.9473941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.75}],"awards":[{"id":"https://openalex.org/G5061676125","display_name":null,"funder_award_id":"CNS-1912593","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W842597827","https://openalex.org/W1832437964","https://openalex.org/W2049051873","https://openalex.org/W2157116240","https://openalex.org/W2464825514","https://openalex.org/W2588106711","https://openalex.org/W2727238169","https://openalex.org/W2771112233","https://openalex.org/W2896575297","https://openalex.org/W2903175372","https://openalex.org/W2973780393","https://openalex.org/W2990650295","https://openalex.org/W3041760264","https://openalex.org/W3102908045","https://openalex.org/W4242053016","https://openalex.org/W4242164861","https://openalex.org/W4245276998","https://openalex.org/W4288337628","https://openalex.org/W6827069628"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W2604133224","https://openalex.org/W3122756779","https://openalex.org/W2355315220","https://openalex.org/W4200391368","https://openalex.org/W2210979487","https://openalex.org/W2316202402","https://openalex.org/W1967938402","https://openalex.org/W2386041993","https://openalex.org/W1608572506"],"abstract_inverted_index":{"Deep":[0],"neural":[1],"networks":[2],"(DNNs)":[3],"have":[4],"been":[5],"deployed":[6],"on":[7,140],"FPGAs":[8],"to":[9,24,30,90,115],"achieve":[10],"improved":[11],"performance,":[12],"power":[13],"efficiency,":[14],"and":[15,43,107],"design":[16],"flexibility.":[17],"However,":[18,63],"the":[19,32,41,45,48,54,57,74,101,105,109,117,120,124,136,145,155],"FPGA-based":[20,96],"DNNs":[21],"are":[22],"vulnerable":[23],"fault":[25,92],"injection":[26,93],"attacks":[27,94],"that":[28,152],"aim":[29],"compromise":[31],"original":[33,125],"functionality.":[34],"The":[35,148],"existing":[36,65],"defense":[37],"methods":[38,66],"either":[39],"duplicate":[40],"models":[42,58],"check":[44,116],"consistency":[46],"of":[47,56,104,119],"results":[49,150],"at":[50],"runtime,":[51],"or":[52,71],"strengthen":[53],"robustness":[55],"by":[59],"adding":[60],"additional":[61],"neurons.":[62],"these":[64],"could":[67],"introduce":[68],"huge":[69],"overhead":[70],"require":[72],"retraining":[73,130],"models.":[75],"In":[76],"this":[77],"paper,":[78],"we":[79],"develop":[80],"a":[81],"runtime":[82],"verification":[83,88],"method,":[84],"namely":[85],"Siamese":[86],"path":[87],"(SPV),":[89],"detect":[91],"for":[95],"DNN":[97,106],"execution.":[98],"By":[99],"leveraging":[100],"computing":[102],"features":[103],"designing":[108],"weight":[110],"parameters,":[111],"SPV":[112,138,153],"adds":[113],"neurons":[114],"integrity":[118],"model":[121,129],"without":[122],"impacting":[123],"functionality":[126],"and,":[127],"therefore,":[128],"is":[131],"not":[132],"required.":[133],"We":[134],"evaluate":[135],"proposed":[137],"approach":[139],"Xilinx":[141],"Virtex-7":[142],"FPGA":[143],"using":[144],"MNIST":[146],"dataset.":[147],"evaluation":[149],"show":[151],"achieves":[154],"security":[156],"goal":[157],"with":[158],"low":[159],"overhead.":[160]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}