{"id":"https://openalex.org/W2994017022","doi":"https://doi.org/10.23919/date48585.2020.9116558","title":"RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems","display_name":"RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W2994017022","doi":"https://doi.org/10.23919/date48585.2020.9116558","mag":"2994017022"},"language":"en","primary_location":{"id":"doi:10.23919/date48585.2020.9116558","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["arxiv","crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/1912.01561","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"M. Jenihhin","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S. Hamdioui","raw_affiliation_strings":["Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Krstic","raw_affiliation_strings":["IHP \u2014 Leibniz-Institut fur innovative Mikroelektronik, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2014 Leibniz-Institut fur innovative Mikroelektronik, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":null,"display_name":"P. Langendorfer","orcid":null},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Langendorfer","raw_affiliation_strings":["IHP \u2014 Leibniz-Institut fur innovative Mikroelektronik, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2014 Leibniz-Institut fur innovative Mikroelektronik, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091909742","display_name":"Christian Sauer","orcid":"https://orcid.org/0000-0003-0647-0938"},"institutions":[{"id":"https://openalex.org/I4210089203","display_name":"Cadence Design Systems (Germany)","ror":"https://ror.org/00d9ep044","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210089203","https://openalex.org/I66217453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Sauer","raw_affiliation_strings":["Cadence Design Systems GmbH, Germany"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems GmbH, Germany","institution_ids":["https://openalex.org/I4210089203"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052103941","display_name":"Anton Klotz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089203","display_name":"Cadence Design Systems (Germany)","ror":"https://ror.org/00d9ep044","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210089203","https://openalex.org/I66217453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Klotz","raw_affiliation_strings":["Cadence Design Systems GmbH, Germany"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems GmbH, Germany","institution_ids":["https://openalex.org/I4210089203"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114422898","display_name":"M. Huebner","orcid":"https://orcid.org/0000-0002-1162-8763"},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Huebner","raw_affiliation_strings":["BTU Cottbus-Senftenberg, Germany"],"affiliations":[{"raw_affiliation_string":"BTU Cottbus-Senftenberg, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042672326","display_name":"Joerg Nolte","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Nolte","raw_affiliation_strings":["BTU Cottbus-Senftenberg, Germany"],"affiliations":[{"raw_affiliation_string":"BTU Cottbus-Senftenberg, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109343429","display_name":"H.T. Vierhaus","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. T. Vierhaus","raw_affiliation_strings":["BTU Cottbus-Senftenberg, Germany"],"affiliations":[{"raw_affiliation_string":"BTU Cottbus-Senftenberg, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004074882","display_name":"Georgios Selimis","orcid":"https://orcid.org/0000-0002-0072-6712"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Selimis","raw_affiliation_strings":["Intrinsic ID B.V., The Netherlands"],"affiliations":[{"raw_affiliation_string":"Intrinsic ID B.V., The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010087541","display_name":"Dan Alexandrescu","orcid":"https://orcid.org/0000-0002-8294-7534"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Alexandrescu","raw_affiliation_strings":["IROC Technologies, France"],"affiliations":[{"raw_affiliation_string":"IROC Technologies, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"M. Taouil","raw_affiliation_strings":["Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050768584","display_name":"Geert-Jan Schrijen","orcid":"https://orcid.org/0000-0003-3492-2655"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. J. Schrijen","raw_affiliation_strings":["Intrinsic ID B.V., The Netherlands"],"affiliations":[{"raw_affiliation_string":"Intrinsic ID B.V., The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"J. Raik","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Sterpone","raw_affiliation_strings":["Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024501121","display_name":"Giovanni Squillero","orcid":"https://orcid.org/0000-0001-5784-6435"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Squillero","raw_affiliation_strings":["Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039434509","display_name":"Zoya Dyka","orcid":"https://orcid.org/0000-0002-6819-0467"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Z. Dyka","raw_affiliation_strings":["Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":18,"corresponding_author_ids":["https://openalex.org/A5059391257"],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01466234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"388","last_page":"393"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.6400641202926636},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6247848272323608},{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.589110255241394},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5869772434234619},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5451764464378357},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4560343027114868},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.44503745436668396},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3961738049983978},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3927075266838074},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3735845386981964},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3358295261859894},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25105100870132446}],"concepts":[{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.6400641202926636},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6247848272323608},{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.589110255241394},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5869772434234619},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5451764464378357},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4560343027114868},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.44503745436668396},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3961738049983978},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3927075266838074},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3735845386981964},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3358295261859894},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25105100870132446},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.23919/date48585.2020.9116558","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:1912.01561","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1912.01561","pdf_url":"https://arxiv.org/pdf/1912.01561","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"mag:2994017022","is_oa":true,"landing_page_url":"http://arxiv.org/pdf/1912.01561.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"arXiv (Cornell University)","raw_type":null},{"id":"doi:10.48550/arxiv.1912.01561","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.1912.01561","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:1912.01561","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1912.01561","pdf_url":"https://arxiv.org/pdf/1912.01561","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332999","display_name":"Horizon 2020 Framework Programme","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2994017022.pdf","grobid_xml":"https://content.openalex.org/works/W2994017022.grobid-xml"},"referenced_works_count":53,"referenced_works":["https://openalex.org/W124944822","https://openalex.org/W2125808184","https://openalex.org/W2563483851","https://openalex.org/W2745235995","https://openalex.org/W2770486545","https://openalex.org/W2795439294","https://openalex.org/W2889669377","https://openalex.org/W2895357411","https://openalex.org/W2896334750","https://openalex.org/W2900567726","https://openalex.org/W2906071848","https://openalex.org/W2912054624","https://openalex.org/W2914718767","https://openalex.org/W2943218858","https://openalex.org/W2943316405","https://openalex.org/W2943604793","https://openalex.org/W2944155698","https://openalex.org/W2947185665","https://openalex.org/W2947770260","https://openalex.org/W2951728061","https://openalex.org/W2952062508","https://openalex.org/W2964544643","https://openalex.org/W2964722739","https://openalex.org/W2964769220","https://openalex.org/W2966875859","https://openalex.org/W2968058868","https://openalex.org/W2968345245","https://openalex.org/W2969352854","https://openalex.org/W2971788426","https://openalex.org/W2977441577","https://openalex.org/W2977846154","https://openalex.org/W2978306198","https://openalex.org/W2978324993","https://openalex.org/W2979282337","https://openalex.org/W2981967535","https://openalex.org/W2982093475","https://openalex.org/W2990064067","https://openalex.org/W2990393443","https://openalex.org/W2991271649","https://openalex.org/W3002188374","https://openalex.org/W3002956010","https://openalex.org/W3009273370","https://openalex.org/W3036289923","https://openalex.org/W3098547603","https://openalex.org/W3102759955","https://openalex.org/W3103154468","https://openalex.org/W3104422765","https://openalex.org/W3153208136","https://openalex.org/W3208872316","https://openalex.org/W6768180562","https://openalex.org/W6795891184","https://openalex.org/W6802559334","https://openalex.org/W6840546251"],"related_works":["https://openalex.org/W1044860589","https://openalex.org/W1539271081","https://openalex.org/W3124357296","https://openalex.org/W2792282117","https://openalex.org/W3208026596","https://openalex.org/W225139114","https://openalex.org/W2965989144","https://openalex.org/W1553610813","https://openalex.org/W2103608178","https://openalex.org/W2187667228","https://openalex.org/W1518768772","https://openalex.org/W2045405410","https://openalex.org/W2981943019","https://openalex.org/W1991509731","https://openalex.org/W2899964759","https://openalex.org/W2330003458","https://openalex.org/W3172057381","https://openalex.org/W2528372755","https://openalex.org/W3083454875","https://openalex.org/W62250324"],"abstract_inverted_index":{"The":[0,44,69],"recent":[1],"trends":[2],"for":[3,54,90,97],"nanoelectronic":[4],"computing":[5],"systems":[6],"include":[7,71,94],"machine-to-machine":[8],"communication":[9],"in":[10],"the":[11,31,91],"era":[12],"of":[13,24,78,82,124],"Internet-of-Things":[14],"(IoT)":[15],"and":[16,27,57,67,75,101,108,115,121],"autonomous":[17],"systems,":[18],"complex":[19],"safety-critical":[20],"applications,":[21],"extreme":[22],"miniaturization":[23],"implementation":[25,123],"technologies":[26],"intensive":[28],"interaction":[29],"with":[30],"physical":[32],"world.":[33],"These":[34],"set":[35],"tough":[36],"requirements":[37],"on":[38,51],"mutually":[39],"dependent":[40],"extra-functional":[41],"design":[42,64],"aspects.":[43],"H2020":[45],"MSCAITN":[46],"project":[47],"RESCUE":[48],"is":[49],"focused":[50],"key":[52],"challenges":[53],"reliability,":[55],"security":[56,119],"quality,":[58],"as":[59,61],"well":[60],"related":[62],"electronic":[63],"automation":[65],"tools":[66],"methodologies.":[68],"objectives":[70],"both":[72],"research":[73,88],"advancements":[74],"cross-sectoral":[76],"training":[77],"a":[79],"new":[80],"generation":[81],"interdisciplinary":[83,86],"researchers.":[84],"Notable":[85],"collaborative":[87],"results":[89],"first":[92],"halfperiod":[93],"novel":[95],"approaches":[96],"test":[98],"generation,":[99],"soft-error":[100],"transient":[102],"faults":[103],"vulnerability":[104],"analysis,":[105],"cross-layer":[106],"fault-tolerance":[107],"error-resilience,":[109],"functional":[110],"safety":[111],"validation,":[112],"reliability":[113],"assessment":[114],"run-time":[116],"management,":[117],"HW":[118],"enhancement":[120],"initial":[122],"these":[125],"into":[126],"holistic":[127],"EDA":[128],"tools.":[129]},"counts_by_year":[],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}