{"id":"https://openalex.org/W3036450648","doi":"https://doi.org/10.23919/date48585.2020.9116226","title":"An On-Chip Learning Accelerator for Spiking Neural Networks using STT-RAM Crossbar Arrays","display_name":"An On-Chip Learning Accelerator for Spiking Neural Networks using STT-RAM Crossbar Arrays","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W3036450648","doi":"https://doi.org/10.23919/date48585.2020.9116226","mag":"3036450648"},"language":"en","primary_location":{"id":"doi:10.23919/date48585.2020.9116226","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023663011","display_name":"Shruti Kulkarni","orcid":"https://orcid.org/0000-0001-6894-9851"},"institutions":[{"id":"https://openalex.org/I118118575","display_name":"New Jersey Institute of Technology","ror":"https://ror.org/05e74xb87","country_code":"US","type":"education","lineage":["https://openalex.org/I118118575"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shruti R. Kulkarni","raw_affiliation_strings":["New Jersey Institute of Technology,Department of Electrical and Computer Engineering,Newark,NJ,USA,07102"],"affiliations":[{"raw_affiliation_string":"New Jersey Institute of Technology,Department of Electrical and Computer Engineering,Newark,NJ,USA,07102","institution_ids":["https://openalex.org/I118118575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074272474","display_name":"Shihui Yin","orcid":"https://orcid.org/0000-0001-7186-0946"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shihui Yin","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA,85287"],"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA,85287","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007690955","display_name":"Jae-sun Seo","orcid":"https://orcid.org/0000-0002-4551-7789"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jae-sun Seo","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA,85287"],"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA,85287","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048595299","display_name":"Bipin Rajendran","orcid":"https://orcid.org/0000-0002-2960-6909"},"institutions":[{"id":"https://openalex.org/I183935753","display_name":"King's College London","ror":"https://ror.org/0220mzb33","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I183935753"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bipin Rajendran","raw_affiliation_strings":["King’s College London, Strand,Department of Engineering,London,UK,WC2R 2LS"],"affiliations":[{"raw_affiliation_string":"King’s College London, Strand,Department of Engineering,London,UK,WC2R 2LS","institution_ids":["https://openalex.org/I183935753"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5023663011"],"corresponding_institution_ids":["https://openalex.org/I118118575"],"apc_list":null,"apc_paid":null,"fwci":0.411,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.60599396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1019","last_page":"1024"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.8010159730911255},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7520845532417297},{"id":"https://openalex.org/keywords/spiking-neural-network","display_name":"Spiking neural network","score":0.7154173851013184},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5888872742652893},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5370563268661499},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.48320305347442627},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.44717171788215637},{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.4376524090766907},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.42799803614616394},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.42191022634506226},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3716547191143036},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32694578170776367},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3241115212440491},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.18013045191764832},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16832560300827026},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1292746663093567},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12362462282180786},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08753859996795654}],"concepts":[{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.8010159730911255},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7520845532417297},{"id":"https://openalex.org/C11731999","wikidata":"https://www.wikidata.org/wiki/Q9067355","display_name":"Spiking neural network","level":3,"score":0.7154173851013184},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5888872742652893},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5370563268661499},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.48320305347442627},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.44717171788215637},{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.4376524090766907},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.42799803614616394},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.42191022634506226},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3716547191143036},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32694578170776367},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3241115212440491},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.18013045191764832},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16832560300827026},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1292746663093567},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12362462282180786},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08753859996795654},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/date48585.2020.9116226","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:kclpure.kcl.ac.uk:publications/c97a8408-a7d2-4961-ac07-a8fdf62fda1f","is_oa":false,"landing_page_url":"http://www.scopus.com/inward/record.url?scp=85087411502&partnerID=8YFLogxK","pdf_url":null,"source":{"id":"https://openalex.org/S4306400216","display_name":"Research Portal (King's College London)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I183935753","host_organization_name":"King's College London","host_organization_lineage":["https://openalex.org/I183935753"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Kulkarni, S R, Yin, S, Seo, J S & Rajendran, B 2020, An On-Chip Learning Accelerator for Spiking Neural Networks using STT-RAM Crossbar Arrays. in G Di Natale, C Bolchini & E-I Vatajelu (eds), Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020., 9116226, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, Institute of Electrical and Electronics Engineers Inc., pp. 1019-1024, 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, Grenoble, France, 9/03/2020. https://doi.org/10.23919/DATE48585.2020.9116226","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W1999085092","https://openalex.org/W2055371516","https://openalex.org/W2075960179","https://openalex.org/W2085273892","https://openalex.org/W2087461437","https://openalex.org/W2138913040","https://openalex.org/W2156728623","https://openalex.org/W2193413348","https://openalex.org/W2242818861","https://openalex.org/W2267635276","https://openalex.org/W2286365479","https://openalex.org/W2290824897","https://openalex.org/W2300242332","https://openalex.org/W2307193480","https://openalex.org/W2318186648","https://openalex.org/W2345010043","https://openalex.org/W2513853720","https://openalex.org/W2566022994","https://openalex.org/W2594836184","https://openalex.org/W2612445135","https://openalex.org/W2675031852","https://openalex.org/W2751084147","https://openalex.org/W2754071796","https://openalex.org/W2769049661","https://openalex.org/W2783525259","https://openalex.org/W2794141774","https://openalex.org/W2796472956","https://openalex.org/W2801986726","https://openalex.org/W2806738056","https://openalex.org/W2889797931","https://openalex.org/W2903086273","https://openalex.org/W2946955515","https://openalex.org/W2951247785","https://openalex.org/W2953235111","https://openalex.org/W2963817554","https://openalex.org/W2964350391","https://openalex.org/W2966081953","https://openalex.org/W3000884231","https://openalex.org/W3024621361","https://openalex.org/W3026883080","https://openalex.org/W3102630195","https://openalex.org/W3142548120","https://openalex.org/W4249654426","https://openalex.org/W4295262505","https://openalex.org/W4297775537","https://openalex.org/W6687566353","https://openalex.org/W6690026940","https://openalex.org/W6693397755","https://openalex.org/W6694260854","https://openalex.org/W6696004547","https://openalex.org/W6698200048","https://openalex.org/W6731398821","https://openalex.org/W6737664043","https://openalex.org/W6750132547","https://openalex.org/W6753770798","https://openalex.org/W6762484958","https://openalex.org/W6777931879"],"related_works":["https://openalex.org/W4308098692","https://openalex.org/W4308575307","https://openalex.org/W4385411400","https://openalex.org/W3217323523","https://openalex.org/W4315464822","https://openalex.org/W1968537616","https://openalex.org/W3092023946","https://openalex.org/W4376624478","https://openalex.org/W3000884231","https://openalex.org/W3036450648"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"present":[4],"a":[5,11,91,151],"scheme":[6],"for":[7,19,78,114,125,155],"implementing":[8],"learning":[9,153],"on":[10],"digital":[12,112],"non-volatile":[13,30],"memory":[14,62,102],"(NVM)":[15],"based":[16,131,147],"hardware":[17],"accelerator":[18],"Spiking":[20],"Neural":[21],"Networks":[22],"(SNNs).":[23],"Our":[24,95,129],"design":[25,67,132],"estimates":[26],"across":[27],"three":[28],"prominent":[29],"memories":[31],"-":[32],"Phase":[33],"Change":[34],"Memory":[35],"(PCM),":[36],"Resistive":[37],"RAM":[38,44],"(RRAM),":[39],"and":[40,68,80,105,110,123,161],"Spin":[41],"Transfer":[42],"Torque":[43],"(STT-RAM)":[45],"show":[46],"that":[47],"the":[48,59,66,69,74,88,101,111,115],"STT-RAM":[49,75,85,130],"arrays":[50],"enable":[51],"at":[52],"least":[53],"2\u00d7":[54],"higher":[55,135],"throughput":[56],"compared":[57,143],"to":[58,144],"other":[60],"two":[61],"technologies.":[63],"We":[64],"discuss":[65],"signal":[70],"communication":[71],"framework":[72],"through":[73],"crossbar":[76,103],"array":[77,89,104],"training":[79],"inference":[81],"in":[82,87],"SNNs.":[83],"Each":[84],"cell":[86],"stores":[90],"single":[92],"bit":[93],"value.":[94],"neurosynaptic":[96],"computational":[97],"core":[98],"consists":[99],"of":[100],"its":[106],"read/write":[107],"peripheral":[108],"circuitry":[109],"logic":[113],"spiking":[116],"neurons,":[117],"weight":[118],"update":[119],"computations,":[120],"spike":[121,127],"router,":[122],"decoder":[124],"incoming":[126],"packets.":[128],"shows":[133],"~20\u00d7":[134],"performance":[136],"per":[137,140],"unit":[138,141],"Watt":[139],"area":[142,160],"conventional":[145],"SRAM":[146],"design,":[148],"making":[149],"it":[150],"promising":[152],"platform":[154],"realizing":[156],"systems":[157],"with":[158],"significant":[159],"power":[162],"limitations.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}