{"id":"https://openalex.org/W2993683877","doi":"https://doi.org/10.23919/date48585.2020.9116189","title":"Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP","display_name":"Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W2993683877","doi":"https://doi.org/10.23919/date48585.2020.9116189","mag":"2993683877"},"language":"en","primary_location":{"id":"doi:10.23919/date48585.2020.9116189","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116189","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-02385120","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036236134","display_name":"Antonios Pavlidis","orcid":"https://orcid.org/0000-0003-1593-3367"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210159731","display_name":"LIP6","ror":"https://ror.org/05krcen59","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I39804081","https://openalex.org/I4210159245","https://openalex.org/I4210159731"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Antonios Pavlidis","raw_affiliation_strings":["CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I204730241","https://openalex.org/I39804081","https://openalex.org/I4210159731"]},{"raw_affiliation_string":"CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020645353","display_name":"Marie\u2010Minerve Lou\u00ebrat","orcid":"https://orcid.org/0000-0001-9669-1085"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210159731","display_name":"LIP6","ror":"https://ror.org/05krcen59","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I39804081","https://openalex.org/I4210159245","https://openalex.org/I4210159731"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Marie-Minerve Louerat","raw_affiliation_strings":["CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I204730241","https://openalex.org/I39804081","https://openalex.org/I4210159731"]},{"raw_affiliation_string":"CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010463916","display_name":"Eric Faehn","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Eric Faehn","raw_affiliation_strings":["ST Microelectronics, Crolles, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102750803","display_name":"Anand Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anand Kumar","raw_affiliation_strings":["ST Microelectronics, Greater Noida, India","ST-INDIA - STMicroelectronics [India] (Knowledge Park III, Greater Noida - India)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Greater Noida, India","institution_ids":["https://openalex.org/I4210094169"]},{"raw_affiliation_string":"ST-INDIA - STMicroelectronics [India] (Knowledge Park III, Greater Noida - India)","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210159731","display_name":"LIP6","ror":"https://ror.org/05krcen59","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I39804081","https://openalex.org/I4210159245","https://openalex.org/I4210159731"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Haralampos-G. Stratigopoulos","raw_affiliation_strings":["CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, LIP6, Sorbonne Universit\u00e9, Paris, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I204730241","https://openalex.org/I39804081","https://openalex.org/I4210159731"]},{"raw_affiliation_string":"CIAN - Circuits Int\u00e9gr\u00e9s Num\u00e9riques et Analogiques (France)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5777,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.8170986,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"282","last_page":"285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8835445642471313},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6962391138076782},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5583902597427368},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.5331823825836182},{"id":"https://openalex.org/keywords/symmetry","display_name":"Symmetry (geometry)","score":0.5018086433410645},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4449036717414856},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44298332929611206},{"id":"https://openalex.org/keywords/shaping","display_name":"Shaping","score":0.4394792914390564},{"id":"https://openalex.org/keywords/homogeneous-space","display_name":"Homogeneous space","score":0.4167948067188263},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3705734610557556},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2847113609313965},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24734222888946533},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18966877460479736},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1644919514656067},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.12170422077178955}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8835445642471313},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6962391138076782},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5583902597427368},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.5331823825836182},{"id":"https://openalex.org/C2779886137","wikidata":"https://www.wikidata.org/wiki/Q21030012","display_name":"Symmetry (geometry)","level":2,"score":0.5018086433410645},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4449036717414856},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44298332929611206},{"id":"https://openalex.org/C142311740","wikidata":"https://www.wikidata.org/wiki/Q1066177","display_name":"Shaping","level":2,"score":0.4394792914390564},{"id":"https://openalex.org/C96469262","wikidata":"https://www.wikidata.org/wiki/Q1324364","display_name":"Homogeneous space","level":2,"score":0.4167948067188263},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3705734610557556},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2847113609313965},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24734222888946533},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18966877460479736},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1644919514656067},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.12170422077178955},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/date48585.2020.9116189","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date48585.2020.9116189","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-02385120v1","is_oa":true,"landing_page_url":"https://hal.science/hal-02385120","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Design, Automation and Test in Europe Conference, Mar 2020, Grenoble, France. ⟨10.23919/DATE48585.2020.9116189⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-02385120v1","is_oa":true,"landing_page_url":"https://hal.science/hal-02385120","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Design, Automation and Test in Europe Conference, Mar 2020, Grenoble, France. ⟨10.23919/DATE48585.2020.9116189⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3041907546","display_name":"Electrical Diagnosis for IoT SoCs in Automotive","funder_award_id":"ANR-17-CE24-0014","funder_id":"https://openalex.org/F4320320883","funder_display_name":"Agence Nationale de la Recherche"}],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1557306901","https://openalex.org/W1930963782","https://openalex.org/W1985594279","https://openalex.org/W2005796799","https://openalex.org/W2121844340","https://openalex.org/W2148277175","https://openalex.org/W2149833715","https://openalex.org/W2167896761","https://openalex.org/W2461024140","https://openalex.org/W2532291985","https://openalex.org/W2553580748","https://openalex.org/W2781391663","https://openalex.org/W2900411301","https://openalex.org/W2911984140"],"related_works":["https://openalex.org/W2887402802","https://openalex.org/W2392203694","https://openalex.org/W4367591635","https://openalex.org/W2551040039","https://openalex.org/W3145354503","https://openalex.org/W2158029229","https://openalex.org/W2373277229","https://openalex.org/W814307891","https://openalex.org/W3039146237","https://openalex.org/W4225919318"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,55],"defect-oriented":[6],"Built-In":[7],"Self-Test":[8],"(BIST)":[9],"paradigm":[10],"for":[11],"analog":[12],"and":[13],"mixed-signal":[14],"(A/MS)":[15],"Integrated":[16],"Circuits":[17],"(ICs),":[18],"called":[19],"symmetry-based":[20],"BIST":[21],"(Sym-BIST).":[22],"SymBIST":[23,53],"exploits":[24],"inherent":[25],"symmetries":[26],"into":[27],"the":[28],"design":[29],"to":[30,48],"generate":[31],"invariances":[32,46],"that":[33],"should":[34],"hold":[35],"true":[36],"only":[37],"in":[38],"defect-free":[39],"operation.":[40],"Violation":[41],"of":[42,44],"any":[43],"these":[45],"points":[47],"defect":[49],"detection.":[50],"We":[51],"demonstrate":[52],"on":[54],"65nm":[56],"10-bit":[57],"Successive":[58],"Approximation":[59],"Register":[60],"(SAR)":[61],"Analog-to-Digital":[62],"Converter":[63],"(ADC)":[64],"IP":[65],"by":[66],"ST":[67],"Microelectronics.":[68]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}