{"id":"https://openalex.org/W2912858670","doi":"https://doi.org/10.23919/date.2019.8715271","title":"Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study","display_name":"Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2912858670","doi":"https://doi.org/10.23919/date.2019.8715271","mag":"2912858670"},"language":"en","primary_location":{"id":"doi:10.23919/date.2019.8715271","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8715271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/1902.01494","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055282803","display_name":"Eshan Singh","orcid":"https://orcid.org/0000-0001-8851-4724"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Eshan Singh","raw_affiliation_strings":["Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039610957","display_name":"Keerthikumara Devarajegowda","orcid":"https://orcid.org/0000-0003-3498-0708"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Keerthikumara Devarajegowda","raw_affiliation_strings":["Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004620952","display_name":"Sebastian Simon","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Simon","raw_affiliation_strings":["Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057106778","display_name":"Ralf Schnieder","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ralf Schnieder","raw_affiliation_strings":["Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089507481","display_name":"Karthik Ganesan","orcid":"https://orcid.org/0000-0002-7559-0928"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karthik Ganesan","raw_affiliation_strings":["Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056116323","display_name":"Mohammad Rahmani Fadiheh","orcid":"https://orcid.org/0000-0003-0214-2486"},"institutions":[{"id":"https://openalex.org/I153267046","display_name":"University of Kaiserslautern","ror":"https://ror.org/04zrf7b53","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mohammad Fadiheh","raw_affiliation_strings":["Technische Universit\u00e4t Kaiserslautern, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t Kaiserslautern, Germany","institution_ids":["https://openalex.org/I153267046"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047920654","display_name":"Dominik Stoffel","orcid":"https://orcid.org/0000-0002-8180-9738"},"institutions":[{"id":"https://openalex.org/I153267046","display_name":"University of Kaiserslautern","ror":"https://ror.org/04zrf7b53","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dominik Stoffel","raw_affiliation_strings":["Technische Universit\u00e4t Kaiserslautern, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t Kaiserslautern, Germany","institution_ids":["https://openalex.org/I153267046"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066184879","display_name":"Wolfgang Kunz","orcid":"https://orcid.org/0000-0002-6612-2946"},"institutions":[{"id":"https://openalex.org/I153267046","display_name":"University of Kaiserslautern","ror":"https://ror.org/04zrf7b53","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Kunz","raw_affiliation_strings":["Technische Universit\u00e4t Kaiserslautern, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t Kaiserslautern, Germany","institution_ids":["https://openalex.org/I153267046"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026961968","display_name":"Clark Barrett","orcid":"https://orcid.org/0000-0002-9522-3084"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Clark Barrett","raw_affiliation_strings":["Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046956677","display_name":"Wolfgang Ecker","orcid":"https://orcid.org/0000-0002-9362-8096"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Ecker","raw_affiliation_strings":["Technische Universit\u00e4t M\u00fcnchen, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5055282803"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":0.7231,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.70743037,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1000","last_page":"1005"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.7758035659790039},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7631325721740723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5600787401199341},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.555666446685791},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4700889587402344},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3607980012893677},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2771960496902466},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2241753339767456},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2034766674041748},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.06739300489425659}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.7758035659790039},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7631325721740723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5600787401199341},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.555666446685791},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4700889587402344},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3607980012893677},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2771960496902466},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2241753339767456},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2034766674041748},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.06739300489425659}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/date.2019.8715271","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8715271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:1902.01494","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1902.01494","pdf_url":"https://arxiv.org/pdf/1902.01494","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:1902.01494","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1902.01494","pdf_url":"https://arxiv.org/pdf/1902.01494","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320315684","display_name":"Stanford SystemX Alliance","ror":null},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1819209966","https://openalex.org/W1981504678","https://openalex.org/W2012262513","https://openalex.org/W2051315183","https://openalex.org/W2099823733","https://openalex.org/W2181725979","https://openalex.org/W2476747876","https://openalex.org/W2735921621","https://openalex.org/W2798765367","https://openalex.org/W2883613460","https://openalex.org/W2945053208","https://openalex.org/W2963311060","https://openalex.org/W2963739369","https://openalex.org/W2964039708","https://openalex.org/W4205212523","https://openalex.org/W4232984623","https://openalex.org/W4243931767","https://openalex.org/W4287116575","https://openalex.org/W6663804166","https://openalex.org/W6686260155","https://openalex.org/W6741134279","https://openalex.org/W6747544890","https://openalex.org/W6750229743","https://openalex.org/W6753443810","https://openalex.org/W6798127585"],"related_works":["https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W2771395446","https://openalex.org/W2131084560","https://openalex.org/W3112038843","https://openalex.org/W2088310429","https://openalex.org/W3094215878","https://openalex.org/W3209836052","https://openalex.org/W3091627987","https://openalex.org/W2147310439"],"abstract_inverted_index":{"We":[0],"present":[1],"an":[2,48],"industrial":[3,49,82,110,122,152,173],"case":[4],"study":[5,30,63],"that":[6,42,77,102],"demonstrates":[7],"the":[8,75,81,109,121,151,172],"practicality":[9],"and":[10,52,92],"effectiveness":[11],"of":[12,61,89,181],"Symbolic":[13,68,96,145,166,198],"Quick":[14,177],"Error":[15],"Detection":[16],"(Symbolic":[17],"QED)":[18],"in":[19,74],"detecting":[20],"logic":[21,40,72,100],"design":[22,128,141],"flaws":[23],"(logic":[24],"bugs)":[25],"during":[26],"pre-silicon":[27],"verification.":[28],"Our":[29],"focuses":[31],"on":[32],"several":[33],"microcontroller":[34],"core":[35],"designs":[36,76,162],"(~1,800":[37],"flip-flops,":[38],"~70,000":[39],"gates)":[41],"have":[43],"been":[44],"extensively":[45],"verified":[46],"using":[47,150,171,197],"verification":[50,83,91,111,123,136,153,158,174],"flow":[51,84],"used":[53],"for":[54,138,144,160,165,194],"various":[55,87],"commercial":[56],"automotive":[57],"products.":[58],"The":[59],"results":[60],"our":[62],"are":[64],"as":[65,106],"follows:":[66],"1.":[67],"QED":[69,97,125,146,167],"detected":[70,79,98,107,119],"all":[71],"bugs":[73,101,115],"were":[78,103,116],"by":[80,108,120],"(which":[85],"includes":[86],"flavors":[88],"simulation-based":[90],"formal":[93],"verification).":[94],"2.":[95],"additional":[99,114],"not":[104],"recorded":[105],"flow.":[112],"(These":[113],"also":[117],"perhaps":[118],"flow.)3.Symbolic":[124],"enables":[126],"significant":[127],"productivity":[129],"improvements:":[130],"(a)":[131],"8X":[132],"improved":[133,157],"(i.e.,":[134],"reduced)":[135],"effort":[137,159],"a":[139],"new":[140],"(8":[142],"person-weeks":[143],"vs.":[147,168],"17":[148],"person-months":[149,170],"flow).":[154,175],"(b)":[155],"60X":[156],"subsequent":[161],"(2":[163],"person-days":[164],"4-7":[169],"(c)":[176],"bug":[178],"detection":[179],"(runtime":[180],"20":[182],"seconds":[183],"or":[184,191],"less),":[185],"together":[186],"with":[187],"short":[188],"counterexamples":[189],"(10":[190],"fewer":[192],"instructions)":[193],"quick":[195],"debug,":[196],"QED.":[199]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2019-02-21T00:00:00"}