{"id":"https://openalex.org/W2946673651","doi":"https://doi.org/10.23919/date.2019.8715079","title":"Exploration and Design of Low-Energy Logic Cells for 1 kHz Always-on Systems","display_name":"Exploration and Design of Low-Energy Logic Cells for 1 kHz Always-on Systems","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946673651","doi":"https://doi.org/10.23919/date.2019.8715079","mag":"2946673651"},"language":"en","primary_location":{"id":"doi:10.23919/date.2019.8715079","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8715079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/retrieve/d6496b7e-ba12-495f-b73b-b69aba37b043","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081436844","display_name":"Maxime Feyerick","orcid":"https://orcid.org/0000-0001-5485-8035"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Maxime Feyerick","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069921693","display_name":"Jaro De Roose","orcid":"https://orcid.org/0000-0002-5489-0120"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jaro De Roose","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012150553","display_name":"Marian Verhelst","orcid":"https://orcid.org/0000-0003-3495-9263"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Marian Verhelst","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Leuven (Heverlee), Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5081436844"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.121,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45000277,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1697","last_page":"1702"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5438253879547119},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5183083415031433},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.5011110305786133},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4758553206920624},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4259496331214905},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.42090386152267456},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4141343832015991},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3872394561767578},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3680928945541382},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.35979020595550537},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3501819968223572},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20899727940559387}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5438253879547119},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5183083415031433},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.5011110305786133},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4758553206920624},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4259496331214905},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.42090386152267456},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4141343832015991},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3872394561767578},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3680928945541382},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.35979020595550537},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3501819968223572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20899727940559387},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/date.2019.8715079","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8715079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/638224","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/638224","pdf_url":"https://lirias.kuleuven.be/retrieve/d6496b7e-ba12-495f-b73b-b69aba37b043","source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Firenze, Italy, 25-29 March 2019","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/638224","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/638224","pdf_url":"https://lirias.kuleuven.be/retrieve/d6496b7e-ba12-495f-b73b-b69aba37b043","source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Firenze, Italy, 25-29 March 2019","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2946673651.pdf","grobid_xml":"https://content.openalex.org/works/W2946673651.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1491885026","https://openalex.org/W1761143336","https://openalex.org/W1897403048","https://openalex.org/W1967171495","https://openalex.org/W1974982221","https://openalex.org/W2019198721","https://openalex.org/W2025012216","https://openalex.org/W2098194061","https://openalex.org/W2100995199","https://openalex.org/W2109195618","https://openalex.org/W2109769819","https://openalex.org/W2137616964","https://openalex.org/W2167052940","https://openalex.org/W2167848093","https://openalex.org/W2594344251","https://openalex.org/W3103339143","https://openalex.org/W3117609753"],"related_works":["https://openalex.org/W2806295079","https://openalex.org/W2924345281","https://openalex.org/W1980973127","https://openalex.org/W2159448561","https://openalex.org/W3023368799","https://openalex.org/W3080559572","https://openalex.org/W2130544382","https://openalex.org/W2171305391","https://openalex.org/W2067581760","https://openalex.org/W2544418033"],"abstract_inverted_index":{"A":[0],"standard":[1],"cell":[2],"library":[3,210,228],"targeting":[4],"always-on":[5,33,177],"operation":[6,23,31],"at":[7,12,158,211,229],"1":[8,187,213,218],"kHz":[9],"is":[10,35,54,83],"designed":[11],"circuit-level.":[13],"This":[14],"paper":[15,149],"proposes":[16],"a":[17,57,175,186,208],"design":[18],"methodology":[19],"to":[20,107,137,207,225],"achieve":[21,138],"robust":[22],"with":[24,162],"minimum":[25,28,62,96],"energy.":[26],"Such":[27],"energy":[29,97],"per":[30],"for":[32],"systems":[34,90],"achieved":[36,67],"by":[37],"one":[38],"specific":[39],"supply":[40],"and":[41,91,114,144,170,183],"threshold":[42],"voltage":[43,70],"V":[44,50,79,127,160,214,233],"<sub":[45,51,80,128],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[46,52,81,129],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">Th</sub>":[47,53,82,130],"combination.":[48],"As":[49],"discrete":[55],"in":[56,87,99,197],"practical":[58],"bulk":[59],"technology,":[60,78],"this":[61],"can":[63],"however":[64],"not":[65],"be":[66],"through":[68],"simple":[69],"tuning.":[71],"In":[72],"the":[73,95,124,139,148,163,226,230],"considered":[74],"90":[75],"nm":[76],"CMOS":[77],"too":[84],"low":[85],"resulting":[86,192],"leakage":[88,145],"dominated":[89],"preventing":[92],"from":[93],"attaining":[94],"point":[98],"subthreshold.":[100],"Three":[101],"circuit":[102],"techniques":[103],"are":[104,172],"optimally":[105],"combined":[106],"fight":[108],"leakage:":[109],"stacking,":[110],"reverse":[111],"body":[112],"biasing":[113],"optimal":[115],"transistor":[116],"dimensioning":[117],"relying":[118],"on":[119,126,174,185],"second":[120],"order":[121,219],"effects":[122],"of":[123,166,202,220],"dimensions":[125],".":[131],"They":[132],"jointly":[133],"allow":[134],"logic":[135,168],"gates":[136,169],"best":[140],"balance":[141],"between":[142],"dynamic":[143],"power.":[146],"Moreover,":[147],"presents":[150],"modified":[151],"flip-flop":[152],"topologies":[153],"that":[154],"also":[155],"reliably":[156],"operate":[157],"0.27":[159,232],"along":[161],"gates.":[164],"Benefits":[165],"improved":[167],"flip-flops":[171],"demonstrated":[173],"small":[176],"feature-extraction":[178],"system":[179,193],"calculating":[180],"running":[181],"average":[182],"variance":[184],"Ksample/s":[188],"data":[189],"stream.":[190],"The":[191],"consumes":[194],"162":[195],"pW":[196],"simulation,":[198],"or":[199,217],"two":[200],"orders":[201],"magnitude":[203,221],"less":[204,222],"when":[205,223],"compared":[206,224],"commercial":[209,227],"its":[212],"nominal":[215],"voltage,":[216],"same":[231],"operating":[234],"voltage.":[235]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-04-06T07:47:59.780226","created_date":"2025-10-10T00:00:00"}