{"id":"https://openalex.org/W2946515628","doi":"https://doi.org/10.23919/date.2019.8714941","title":"Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash","display_name":"Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946515628","doi":"https://doi.org/10.23919/date.2019.8714941","mag":"2946515628"},"language":"en","primary_location":{"id":"doi:10.23919/date.2019.8714941","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100627440","display_name":"Weihua Liu","orcid":"https://orcid.org/0000-0002-0919-1101"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weihua Liu","raw_affiliation_strings":["Huazhong University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062125860","display_name":"Fei Wu","orcid":"https://orcid.org/0000-0001-9746-4714"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Wu","raw_affiliation_strings":["Huazhong University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100437761","display_name":"Meng Zhang","orcid":"https://orcid.org/0000-0002-6992-3722"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Zhang","raw_affiliation_strings":["Huazhong University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100365577","display_name":"Yifei Wang","orcid":"https://orcid.org/0000-0002-1314-8712"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifei Wang","raw_affiliation_strings":["Huazhong University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072973899","display_name":"Zhonghai Lu","orcid":"https://orcid.org/0000-0003-0061-3475"},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Zhonghai Lu","raw_affiliation_strings":["KTH Royal Institute of Technology, Sweden"],"affiliations":[{"raw_affiliation_string":"KTH Royal Institute of Technology, Sweden","institution_ids":["https://openalex.org/I86987016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050366940","display_name":"Xiangfeng Lu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiangfeng Lu","raw_affiliation_strings":["Beijing Memblaze Technology Co., Ltd, China"],"affiliations":[{"raw_affiliation_string":"Beijing Memblaze Technology Co., Ltd, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100329127","display_name":"Changsheng Xie","orcid":"https://orcid.org/0000-0003-1271-0571"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changsheng Xie","raw_affiliation_strings":["Huazhong University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100627440"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":4.0776,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.94420652,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"312","last_page":"315"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7850098609924316},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7841799259185791},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.7410850524902344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6015738844871521},{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.5485754609107971},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5456405878067017},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5411021709442139},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5372753739356995},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4661693871021271},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4359760880470276},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4308251738548279},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.36902835965156555},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2644592523574829},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23904147744178772},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16326192021369934},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13170036673545837},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.12548455595970154},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07724705338478088}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7850098609924316},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7841799259185791},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.7410850524902344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6015738844871521},{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.5485754609107971},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5456405878067017},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5411021709442139},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5372753739356995},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4661693871021271},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4359760880470276},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4308251738548279},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36902835965156555},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2644592523574829},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23904147744178772},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16326192021369934},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13170036673545837},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.12548455595970154},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07724705338478088},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C87717796","wikidata":"https://www.wikidata.org/wiki/Q146326","display_name":"Environmental engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2019.8714941","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1997039859","https://openalex.org/W2014536047","https://openalex.org/W2027409672","https://openalex.org/W2037664134","https://openalex.org/W2345514967","https://openalex.org/W2432108543","https://openalex.org/W2484830184","https://openalex.org/W2588471635","https://openalex.org/W2607299049","https://openalex.org/W2612517079","https://openalex.org/W2769396957","https://openalex.org/W2797923169","https://openalex.org/W2801529634","https://openalex.org/W6718219676","https://openalex.org/W6736332007"],"related_works":["https://openalex.org/W3097479263","https://openalex.org/W1832944333","https://openalex.org/W3108684791","https://openalex.org/W27380437","https://openalex.org/W2975816678","https://openalex.org/W4281728641","https://openalex.org/W2603759966","https://openalex.org/W2946515628","https://openalex.org/W2052765951","https://openalex.org/W3114779011"],"abstract_inverted_index":{"3D":[0,52,100],"charge":[1],"trap":[2],"(CT)":[3],"triple-level":[4],"cell":[5],"(TLC)":[6],"NAND":[7,55,103],"flash":[8],"gradually":[9],"becomes":[10],"a":[11,24,40,63],"mainstream":[12],"storage":[13,18],"component":[14],"due":[15],"to":[16,46,113,118],"high":[17,115],"capacity":[19],"and":[20,30,79],"performance,":[21],"but":[22],"introducing":[23],"concern":[25],"about":[26],"reliability.":[27,38],"Fault":[28],"tolerance":[29],"data":[31],"management":[32],"schemes":[33],"are":[34],"capable":[35],"of":[36,51,94],"improving":[37],"Designing":[39],"more":[41],"efficient":[42,116],"solution,":[43],"however,":[44],"needs":[45],"understand":[47],"the":[48,69,73,80,111,119],"reliability":[49,70,120],"characteristics":[50,71,97],"CT":[53,101],"TLC":[54,102],"flash.":[56,104],"To":[57],"facilitate":[58],"such":[59],"understanding,":[60],"by":[61],"exploiting":[62],"real-world":[64],"testing":[65],"platform,":[66],"we":[67],"investigate":[68],"including":[72],"raw":[74],"bit":[75],"error":[76],"rate":[77],"(RBER)":[78],"threshold":[81],"voltage":[82],"(Vth)":[83],"shifting":[84],"features":[85],"after":[86],"suffering":[87],"from":[88],"variable":[89],"disturbances.":[90],"We":[91,105],"give":[92],"analyses":[93],"why":[95],"these":[96,107],"exist":[98],"in":[99],"hope":[106],"observations":[108],"can":[109],"guide":[110],"designers":[112],"propose":[114],"solutions":[117],"problem.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}