{"id":"https://openalex.org/W2945244340","doi":"https://doi.org/10.23919/date.2019.8714916","title":"An Energy Efficient Non-Volatile Flip-Flop based on CoMET Technology","display_name":"An Energy Efficient Non-Volatile Flip-Flop based on CoMET Technology","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2945244340","doi":"https://doi.org/10.23919/date.2019.8714916","mag":"2945244340"},"language":"en","primary_location":{"id":"doi:10.23919/date.2019.8714916","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714916","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067589457","display_name":"Robert Perricone","orcid":null},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Robert Perricone","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033594696","display_name":"Zhaoxin Liang","orcid":"https://orcid.org/0000-0002-7578-3244"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhaoxin Liang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047869221","display_name":"Meghna G. Mankalale","orcid":"https://orcid.org/0000-0002-6757-9649"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Meghna G. Mankalale","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003032564","display_name":"Michael Niemier","orcid":"https://orcid.org/0000-0001-7776-4306"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Niemier","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin S. Sapatnekar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062474441","display_name":"Jian\u2010Ping Wang","orcid":"https://orcid.org/0000-0003-2815-6624"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jian-Ping Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100600905","display_name":"Xiaobo Sharon Hu","orcid":"https://orcid.org/0000-0002-6636-9738"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"X. Sharon Hu","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5067589457"],"corresponding_institution_ids":["https://openalex.org/I107639228"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.44025233,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"390","last_page":"395"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8237299919128418},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5653181672096252},{"id":"https://openalex.org/keywords/spintronics","display_name":"Spintronics","score":0.5205700993537903},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.505244791507721},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.48538386821746826},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.48209694027900696},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.42505908012390137},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4006291329860687},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2480274736881256},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14281043410301208}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8237299919128418},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5653181672096252},{"id":"https://openalex.org/C207999682","wikidata":"https://www.wikidata.org/wiki/Q258659","display_name":"Spintronics","level":3,"score":0.5205700993537903},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.505244791507721},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48538386821746826},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.48209694027900696},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42505908012390137},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4006291329860687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2480274736881256},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14281043410301208},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2019.8714916","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714916","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1971991103","https://openalex.org/W1972841535","https://openalex.org/W1979196065","https://openalex.org/W1981443800","https://openalex.org/W1996573165","https://openalex.org/W1998549161","https://openalex.org/W2004119304","https://openalex.org/W2005242923","https://openalex.org/W2009053018","https://openalex.org/W2017043534","https://openalex.org/W2023605844","https://openalex.org/W2026527606","https://openalex.org/W2040475153","https://openalex.org/W2048518241","https://openalex.org/W2063219138","https://openalex.org/W2064905902","https://openalex.org/W2115598106","https://openalex.org/W2121290756","https://openalex.org/W2142805504","https://openalex.org/W2150528147","https://openalex.org/W2165966886","https://openalex.org/W2342443613","https://openalex.org/W2513641764","https://openalex.org/W2542222318","https://openalex.org/W2557869018","https://openalex.org/W2612333299","https://openalex.org/W2613996477","https://openalex.org/W2615444103","https://openalex.org/W2620977911","https://openalex.org/W2963771263"],"related_works":["https://openalex.org/W2186918296","https://openalex.org/W2145661639","https://openalex.org/W2348304493","https://openalex.org/W2340848590","https://openalex.org/W2039480911","https://openalex.org/W2897659251","https://openalex.org/W2342285913","https://openalex.org/W2316989536","https://openalex.org/W2170979950","https://openalex.org/W2039299085"],"abstract_inverted_index":{"As":[0],"we":[1,128],"approach":[2],"the":[3,15,85,111,115],"limits":[4,77],"of":[5,141,147],"CMOS":[6,37,89],"scaling,":[7],"researchers":[8],"are":[9],"developing":[10],"\"beyond-CMOS\"":[11],"technologies":[12,23],"to":[13,32,58,83,118,144,166],"sustain":[14],"technological":[16],"benefits":[17,35,51],"associated":[18],"with":[19],"device":[20,92,123],"scaling.":[21],"Spin-tronic":[22],"have":[24,101],"emerged":[25],"as":[26,39,95,110],"a":[27,130],"promising":[28],"beyond-CMOS":[29],"technology":[30,137],"due":[31],"their":[33,78],"inherent":[34],"over":[36],"such":[38,94,109],"high":[40],"integration":[41],"density,":[42],"low":[43,155],"leakage":[44],"power,":[45],"radiation":[46],"hardness,":[47],"and":[48,72,90,114],"non-volatility.":[49],"These":[50],"make":[52],"spintronic":[53,64],"devices":[54,65],"an":[55,81],"attractive":[56,165],"successor":[57],"CMOS-especially":[59],"for":[60,173],"memory":[61],"circuits.":[62],"However,":[63],"generally":[66],"suffer":[67],"from":[68],"slower":[69],"switching":[70],"speeds":[71],"higher":[73],"write":[74,150,156],"energy,":[75],"which":[76,104],"usability.":[79],"In":[80,125],"effort":[82],"close":[84],"energy-delay":[86],"gap":[87],"between":[88],"spintronics,":[91],"concepts":[93],"CoMET":[96,136,162],"(Composite-Input":[97],"Magnetoelectric-base":[98],"Logic":[99],"Technology)":[100],"been":[102],"introduced,":[103],"collectively":[105],"leverage":[106],"material":[107],"phenomena":[108],"spin-Hall":[112],"effect":[113,117],"magnetoelectric":[116],"enable":[119],"fast,":[120],"energy":[121,151,157,174],"efficient":[122],"operation.":[124],"this":[126],"work,":[127],"propose":[129],"non-volatile":[131,176],"flip-flop":[132],"(NVFF)":[133],"based":[134],"on":[135],"that":[138,168],"is":[139],"capable":[140],"achieving":[142],"up":[143],"two":[145],"orders":[146],"magnitude":[148],"less":[149],"than":[152],"CMOS.":[153],"This":[154],"(\u22482":[158],"aJ)":[159],"makes":[160],"our":[161],"NVFF":[163],"especially":[164],"architectures":[167],"require":[169],"frequent":[170],"backup":[171],"operations-e.g.,":[172],"harvesting":[175],"processors.":[177]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}