{"id":"https://openalex.org/W2946458389","doi":"https://doi.org/10.23919/date.2019.8714841","title":"Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications","display_name":"Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946458389","doi":"https://doi.org/10.23919/date.2019.8714841","mag":"2946458389"},"language":"en","primary_location":{"id":"doi:10.23919/date.2019.8714841","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714841","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007365958","display_name":"Yuanjie Hu","orcid":"https://orcid.org/0000-0003-3886-8158"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanjie Hu","raw_affiliation_strings":["School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115883269","display_name":"Jie Song","orcid":"https://orcid.org/0000-0002-0846-7591"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Song","raw_affiliation_strings":["School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui Engineering Laboratory of IoT Security Technologies, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of Creative Informatics, Kyushu Institute of Technology, Fukuoka, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Creative Informatics, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072439444"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":0.8346,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.73537957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1679","last_page":"1684"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7473830580711365},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.6681817770004272},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6656039357185364},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6592819690704346},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.6172909736633301},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.5518395304679871},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5155189037322998},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5150997042655945},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4874263107776642},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4566667377948761},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40945345163345337},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33708739280700684},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.269458532333374},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2545080780982971},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.11094692349433899}],"concepts":[{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7473830580711365},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.6681817770004272},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6656039357185364},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6592819690704346},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.6172909736633301},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.5518395304679871},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5155189037322998},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5150997042655945},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4874263107776642},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4566667377948761},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40945345163345337},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33708739280700684},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.269458532333374},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2545080780982971},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.11094692349433899},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2019.8714841","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2019.8714841","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1011947702","https://openalex.org/W1600862615","https://openalex.org/W1820430086","https://openalex.org/W1899181454","https://openalex.org/W1964582992","https://openalex.org/W1969390180","https://openalex.org/W1971670074","https://openalex.org/W1980433502","https://openalex.org/W1990960030","https://openalex.org/W2015524290","https://openalex.org/W2023659251","https://openalex.org/W2033816298","https://openalex.org/W2034813406","https://openalex.org/W2048087107","https://openalex.org/W2056721615","https://openalex.org/W2118086666","https://openalex.org/W2122335215","https://openalex.org/W2252288845","https://openalex.org/W2277435279","https://openalex.org/W2293212301","https://openalex.org/W2344743430","https://openalex.org/W2550596389","https://openalex.org/W2558274594","https://openalex.org/W2558527383","https://openalex.org/W2578302800","https://openalex.org/W2769731910","https://openalex.org/W2808868355","https://openalex.org/W6640038052","https://openalex.org/W6746295572","https://openalex.org/W6752608715"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2123934961","https://openalex.org/W2765704306","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W2086616086","https://openalex.org/W764628369","https://openalex.org/W1502430142","https://openalex.org/W1490775144"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,35],"single-event":[4,9],"double-upset":[5],"(SEDU)":[6],"self-recoverable":[7,75],"and":[8,34,46],"transient":[10],"(SET)":[11],"pulse":[12,48,82],"filterable":[13,83],"latch":[14,25,52,62,76],"design":[15],"for":[16,50],"low":[17],"power":[18,66],"applications":[19],"in":[20],"22nm":[21],"CMOS":[22],"technology.":[23],"The":[24],"mainly":[26],"consists":[27],"of":[28],"eight":[29],"mutually":[30],"feeding":[31],"back":[32],"C-elements":[33],"Schmitt":[36],"trigger.":[37],"Simulation":[38],"results":[39],"have":[40],"demonstrated":[41],"both":[42],"the":[43,51,61,72],"SEDU":[44,74],"self-recoverability":[45],"SET":[47,81],"filterability":[49],"using":[53],"redundant":[54],"silicon":[55],"area.":[56],"Using":[57],"clock":[58],"gating":[59],"technology,":[60],"saves":[63],"about":[64],"54.85%":[65],"dissipation":[67],"on":[68],"average":[69],"compared":[70],"with":[71],"up-to-date":[73],"designs":[77],"which":[78],"are":[79],"not":[80],"at":[84],"all.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}