{"id":"https://openalex.org/W2798984676","doi":"https://doi.org/10.23919/date.2018.8342153","title":"HiMap: A hierarchical mapping approach for enhancing lifetime reliability of dark silicon manycore systems","display_name":"HiMap: A hierarchical mapping approach for enhancing lifetime reliability of dark silicon manycore systems","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2798984676","doi":"https://doi.org/10.23919/date.2018.8342153","mag":"2798984676"},"language":"en","primary_location":{"id":"doi:10.23919/date.2018.8342153","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025980781","display_name":"Vijeta Rathore","orcid":"https://orcid.org/0000-0001-5439-1885"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Vijeta Rathore","raw_affiliation_strings":["School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033371948","display_name":"Vivek Chaturvedi","orcid":"https://orcid.org/0000-0003-1358-0107"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Vivek Chaturvedi","raw_affiliation_strings":["School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060848060","display_name":"Amit Kumar Singh","orcid":"https://orcid.org/0000-0003-2056-0569"},"institutions":[{"id":"https://openalex.org/I110002522","display_name":"University of Essex","ror":"https://ror.org/02nkf1q06","country_code":"GB","type":"education","lineage":["https://openalex.org/I110002522"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Amit K. Singh","raw_affiliation_strings":["School of Computer Science and Electronic Engineering, University of Essex, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Electronic Engineering, University of Essex, UK","institution_ids":["https://openalex.org/I110002522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070475093","display_name":"Thambipillai Srikanthan","orcid":"https://orcid.org/0000-0003-3664-4345"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Thambipillai Srikanthan","raw_affiliation_strings":["School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071182983","display_name":"R Rohith","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"R Rohith","raw_affiliation_strings":["School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002694277","display_name":"Siew-Kei Lam","orcid":"https://orcid.org/0000-0002-8346-2635"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Siew-Kei Lam","raw_affiliation_strings":["School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Nanyang Technological University (NTU), Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039260689","display_name":"Muhammad Shaflque","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Muhammad Shaflque","raw_affiliation_strings":["Institute of Computer Engineering, Vienna University of Technology (TU Wien), Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Vienna University of Technology (TU Wien), Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"991","last_page":"996"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7840760946273804},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.626899003982544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5366193056106567},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.5032545924186707},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5010712146759033},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4880892038345337},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4621463716030121},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44295814633369446},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.43964657187461853},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4314050078392029},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.3715277910232544},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3639047145843506},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.35931456089019775},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23482999205589294},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.18716314435005188},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1740322709083557},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17263418436050415},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10276207327842712},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07365667819976807}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7840760946273804},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.626899003982544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5366193056106567},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.5032545924186707},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5010712146759033},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4880892038345337},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4621463716030121},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44295814633369446},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.43964657187461853},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4314050078392029},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3715277910232544},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3639047145843506},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.35931456089019775},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23482999205589294},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.18716314435005188},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1740322709083557},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17263418436050415},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10276207327842712},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07365667819976807},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2018.8342153","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W634823175","https://openalex.org/W1684672183","https://openalex.org/W1967125811","https://openalex.org/W1980072970","https://openalex.org/W2000767630","https://openalex.org/W2025746628","https://openalex.org/W2031853729","https://openalex.org/W2033443176","https://openalex.org/W2036656837","https://openalex.org/W2082973036","https://openalex.org/W2095958987","https://openalex.org/W2110555369","https://openalex.org/W2129960401","https://openalex.org/W2150608324","https://openalex.org/W2161350011","https://openalex.org/W2166940427","https://openalex.org/W2168157060","https://openalex.org/W2170382128","https://openalex.org/W2346987300","https://openalex.org/W2347205803","https://openalex.org/W2394679455","https://openalex.org/W2529191132","https://openalex.org/W2620877545","https://openalex.org/W2803052637","https://openalex.org/W4238956459","https://openalex.org/W4243767447","https://openalex.org/W4251535115","https://openalex.org/W6637628939","https://openalex.org/W6728369208"],"related_works":["https://openalex.org/W1992148151","https://openalex.org/W2015799581","https://openalex.org/W2075934899","https://openalex.org/W2379235224","https://openalex.org/W2374792105","https://openalex.org/W2359614193","https://openalex.org/W2355501997","https://openalex.org/W2019501673","https://openalex.org/W2365083683","https://openalex.org/W2375209908"],"abstract_inverted_index":{"Technology":[0],"scaling":[1],"into":[2],"the":[3,40,93,104,108,111,119,142,152],"nano-scale":[4],"CMOS":[5],"regime":[6],"has":[7,18],"resulted":[8],"in":[9,92],"increased":[10],"leakage":[11],"and":[12,27,63,70,87,95,126],"roadblock":[13],"on":[14],"voltage":[15],"scaling,":[16],"which":[17],"led":[19],"to":[20,52,114,138,151],"several":[21],"issues":[22],"like":[23],"high":[24],"power":[25],"density":[26],"elevated":[28],"on-chip":[29],"temperature.":[30],"This":[31,43],"consequently":[32],"aggravates":[33],"device":[34],"aging,":[35],"compromising":[36],"lifetime":[37,54,134],"reliability":[38,55,135],"of":[39,56,74,82,107,144,147],"manycore":[41,57],"systems.":[42,128],"paper":[44],"proposes":[45],"HiMap,":[46],"a":[47,80],"dynamic":[48],"hierarchical":[49],"mapping":[50],"approach":[51],"maximize":[53],"systems":[58],"while":[59,102],"satisfying":[60],"performance,":[61],"power,":[62],"thermal":[64,100],"constraints.":[65],"HiMap":[66,123],"is":[67],"process":[68],"variation-":[69],"aging-aware.":[71],"It":[72],"comprises":[73],"two":[75],"levels:":[76],"(1)":[77],"it":[78,89],"identifies":[79],"region":[81,94],"cores":[83,98],"suitable":[84],"for":[85,99,124],"mapping,":[86],"(2)":[88],"maps":[90],"threads":[91],"intersperses":[96],"dark":[97],"mitigation":[101],"considering":[103],"current":[105],"health":[106],"cores.":[109],"Both":[110],"levels":[112],"strive":[113],"reduce":[115],"aging":[116],"variance":[117],"across":[118],"chip.":[120],"We":[121],"evaluated":[122],"64-core":[125],"256-core":[127],"Results":[129],"demonstrate":[130],"an":[131],"improved":[132],"system":[133],"by":[136],"up":[137],"2":[139],"years":[140,146],"at":[141],"end":[143],"3.25":[145],"use,":[148],"as":[149],"compared":[150],"state-of-the-art.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}