{"id":"https://openalex.org/W2798594638","doi":"https://doi.org/10.23919/date.2018.8342081","title":"ETISS-ML: A multi-level instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques","display_name":"ETISS-ML: A multi-level instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2798594638","doi":"https://doi.org/10.23919/date.2018.8342081","mag":"2798594638"},"language":"en","primary_location":{"id":"doi:10.23919/date.2018.8342081","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011419637","display_name":"Daniel Mueller-Gritschneder","orcid":"https://orcid.org/0000-0003-0903-631X"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Daniel Mueller-Gritschneder","raw_affiliation_strings":["Chair of Electronic Design Automation, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Electronic Design Automation, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042774650","display_name":"Martin Dittrich","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Dittrich","raw_affiliation_strings":["Chair of Electronic Design Automation, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Electronic Design Automation, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077240057","display_name":"Josef Weinzierl","orcid":"https://orcid.org/0000-0001-5634-3297"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Josef Weinzierl","raw_affiliation_strings":["Chair of Electronic Design Automation, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Electronic Design Automation, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016708751","display_name":"Eric Cheng","orcid":"https://orcid.org/0000-0001-8130-2550"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric Cheng","raw_affiliation_strings":["Stanford University, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Stanford University, USA"],"affiliations":[{"raw_affiliation_string":"Stanford University, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017567485","display_name":"Ulf Schlichtmann","orcid":"https://orcid.org/0000-0003-4431-7619"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulf Schlichtmann","raw_affiliation_strings":["Chair of Electronic Design Automation, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Electronic Design Automation, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5011419637"],"corresponding_institution_ids":["https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":0.7725,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.73055176,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"609","last_page":"612"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.771343469619751},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7679657936096191},{"id":"https://openalex.org/keywords/systemc","display_name":"SystemC","score":0.7283759713172913},{"id":"https://openalex.org/keywords/fault-simulator","display_name":"Fault Simulator","score":0.6893570423126221},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5930153131484985},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5905386805534363},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.5252953171730042},{"id":"https://openalex.org/keywords/computer-architecture-simulator","display_name":"Computer architecture simulator","score":0.5170474648475647},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5098316073417664},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.4107770621776581},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3161531686782837},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2924206256866455},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.18554964661598206},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.15983319282531738},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.14887884259223938},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12989109754562378},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.11152869462966919},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.10615459084510803},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.09018081426620483}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.771343469619751},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7679657936096191},{"id":"https://openalex.org/C2776928060","wikidata":"https://www.wikidata.org/wiki/Q1753563","display_name":"SystemC","level":2,"score":0.7283759713172913},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.6893570423126221},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5930153131484985},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5905386805534363},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.5252953171730042},{"id":"https://openalex.org/C201203610","wikidata":"https://www.wikidata.org/wiki/Q5157524","display_name":"Computer architecture simulator","level":2,"score":0.5170474648475647},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5098316073417664},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.4107770621776581},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3161531686782837},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2924206256866455},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.18554964661598206},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.15983319282531738},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.14887884259223938},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12989109754562378},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.11152869462966919},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10615459084510803},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.09018081426620483},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2018.8342081","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1487950196","https://openalex.org/W1972649107","https://openalex.org/W2016591508","https://openalex.org/W2026833966","https://openalex.org/W2052887509","https://openalex.org/W2098280085","https://openalex.org/W2130189691","https://openalex.org/W2134755427","https://openalex.org/W2159889776","https://openalex.org/W2337485678","https://openalex.org/W2792118436","https://openalex.org/W4250247110"],"related_works":["https://openalex.org/W2012037356","https://openalex.org/W4388214509","https://openalex.org/W4239974880","https://openalex.org/W392998718","https://openalex.org/W4255183762","https://openalex.org/W2116891547","https://openalex.org/W780874748","https://openalex.org/W1996575484","https://openalex.org/W2015298532","https://openalex.org/W1969724412"],"abstract_inverted_index":{"ETISS":[0],"is":[1,122],"an":[2,77,96],"instruction":[3],"set":[4],"simulator":[5],"(ISS)":[6],"for":[7,105,117,137],"Virtual":[8],"Prototypes":[9],"(VPs)":[10],"modeled":[11],"with":[12,58,62],"SystemC/TLM.":[13],"In":[14],"this":[15],"paper,":[16],"we":[17,75],"propose":[18,76],"the":[19,39,45,82,85],"extension":[20],"ETISS-ML,":[21],"which":[22,108],"enables":[23,95],"a":[24,48,63,111,125,129,134],"multi-level":[25],"simulation":[26,56,60,87,91,119],"that":[27],"switches":[28],"between":[29],"ISS-level":[30],"and":[31,98],"register":[32],"transfer":[33],"level":[34],"(RTL)":[35],"to":[36,68,71,79],"accurately":[37],"evaluate":[38],"impact":[40],"of":[41,47,84,93,101,114,128],"soft":[42],"errors":[43],"in":[44],"pipeline":[46],"RISC":[49],"processor.":[50],"ETISS-ML":[51,94],"achieves":[52],"close-to-RTL-accurate":[53],"fault":[54,115],"injection":[55],"results":[57],"close-to-ISS":[59],"performance":[61,92],"speed":[64],"up":[65,67],"gain":[66],"100x":[69],"compared":[70],"RTL.":[72],"For":[73],"this,":[74],"approach":[78],"dynamically":[80],"determine":[81],"length":[83],"RTL":[86],"period.":[88],"The":[89],"high":[90],"ultra-efficient":[97],"accurate":[99],"evaluation":[100],"cross-layer":[102],"resiliency":[103],"techniques":[104],"embedded":[106],"applications,":[107],"requires":[109],"running":[110],"large":[112],"number":[113],"injections":[116],"long":[118],"scenarios.":[120],"This":[121],"demonstrated":[123],"on":[124],"case":[126],"study":[127],"Microcontroller":[130],"Unit":[131],"(MCU)":[132],"executing":[133],"control":[135],"algorithm":[136],"adaptive":[138],"cruise":[139],"control.":[140]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}