{"id":"https://openalex.org/W2799226296","doi":"https://doi.org/10.23919/date.2018.8342040","title":"Characterization of possibly detected faults by accurately computing their detection probability","display_name":"Characterization of possibly detected faults by accurately computing their detection probability","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2799226296","doi":"https://doi.org/10.23919/date.2018.8342040","mag":"2799226296"},"language":"en","primary_location":{"id":"doi:10.23919/date.2018.8342040","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342040","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051610933","display_name":"Jan Burchard","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jan Burchard","raw_affiliation_strings":["Mentor Graphics, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Hamburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070176716","display_name":"Dominik Erb","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dominik Erb","raw_affiliation_strings":["Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernd Becker","raw_affiliation_strings":["University of Freiburg, Freiburg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Freiburg, Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5051610933"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7881,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69179268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"2018","issue":null,"first_page":"385","last_page":"390"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7045027017593384},{"id":"https://openalex.org/keywords/weighting","display_name":"Weighting","score":0.6596038937568665},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6448642015457153},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6272771954536438},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6264668107032776},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5806486010551453},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5676791667938232},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5581884384155273},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5051959156990051},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.48694908618927},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.48226791620254517},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.43026915192604065},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.4298025965690613},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4232189357280731},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4194890856742859},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2922326326370239},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24326810240745544},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2202821671962738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20538541674613953},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17223381996154785},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.11613789200782776}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7045027017593384},{"id":"https://openalex.org/C183115368","wikidata":"https://www.wikidata.org/wiki/Q856577","display_name":"Weighting","level":2,"score":0.6596038937568665},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6448642015457153},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6272771954536438},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6264668107032776},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5806486010551453},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5676791667938232},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5581884384155273},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5051959156990051},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.48694908618927},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.48226791620254517},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.43026915192604065},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.4298025965690613},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4232189357280731},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4194890856742859},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2922326326370239},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24326810240745544},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2202821671962738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20538541674613953},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17223381996154785},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.11613789200782776},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.23919/date.2018.8342040","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342040","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:freidok.uni-freiburg.de:271141","is_oa":false,"landing_page_url":"https://freidok.uni-freiburg.de/data/271141","pdf_url":null,"source":{"id":"https://openalex.org/S4306401057","display_name":"FreiDok plus (Universit\u00e4tsbibliothek Freiburg)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I161046081","host_organization_name":"University of Freiburg","host_organization_lineage":["https://openalex.org/I161046081"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings of the 2018 Design, Automation & Test in Europe (DATE) : 19-23 March 2018, Dresden, Germany. - Piscataway, NJ, 2018. - 385-390, ISBN: 978-3-9819263-0-9","raw_type":"article_in_conference_proceedings"},{"id":"mag:3209038890","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=201802242820786633","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W179198942","https://openalex.org/W1537730723","https://openalex.org/W2008990681","https://openalex.org/W2012087965","https://openalex.org/W2046817879","https://openalex.org/W2089455823","https://openalex.org/W2097350515","https://openalex.org/W2107645502","https://openalex.org/W2108420455","https://openalex.org/W2111994103","https://openalex.org/W2124618076","https://openalex.org/W2133527541","https://openalex.org/W2135303226","https://openalex.org/W2135613306","https://openalex.org/W2149107969","https://openalex.org/W2160444875","https://openalex.org/W2173124859","https://openalex.org/W2232506718","https://openalex.org/W2544673751","https://openalex.org/W2560025973","https://openalex.org/W2609538613","https://openalex.org/W4235871368","https://openalex.org/W6607267866","https://openalex.org/W6653729481","https://openalex.org/W6679878532"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2068571131","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W1555400249","https://openalex.org/W2952274626","https://openalex.org/W2913077774","https://openalex.org/W3147038789"],"abstract_inverted_index":{"With":[0],"ever":[1],"more":[2,27,260],"complex":[3],"and":[4,8,10,21,96,209,245],"larger":[5,190],"VLSI":[6],"devices":[7],"higher":[9,11],"reliability":[12],"requirements,":[13],"high":[14,267],"quality":[15],"test":[16,120,141],"with":[17,104,117,219,232,280],"a":[18,46,58,69,105,145,220,253,259,266],"large":[19],"fault":[20,59,102,137,285],"defect":[22],"coverage":[23,103],"is":[24,66,122,243,265],"becoming":[25],"even":[26],"relevant.":[28],"At":[29],"the":[30,73,100,110,118,140,159,166,183,199,205,227,230,240,270,283],"same":[31],"time,":[32,161],"when":[33],"unspecified":[34],"or":[35,77,217,278],"unknown":[36],"input":[37],"values":[38],"(X":[39],"values)":[40],"have":[41],"to":[42,71,82,92,113,130,163,276,282],"be":[43,61,80,93,250,275],"considered":[44,91,119],"in":[45],"pattern,":[47],"commercial":[48,177],"ATPG":[49],"tools":[50],"are":[51,90,214],"sometimes":[52],"not":[53,123,248],"capable":[54],"of":[55,134,152,204,222,226,229],"determining":[56],"whether":[57],"can":[60,196],"tested":[62],"-":[63],"but":[64,257],"there":[65,264],"at":[67,83],"least":[68,84],"chance":[70],"detect":[72,114],"fault,":[74],"as":[75,109,172,187,189],"0/X":[76],"1/X":[78],"could":[79,128,273],"propagated":[81],"one":[85],"output.":[86],"Consequently,":[87],"these":[88,115],"faults":[89,116,170,208,212],"possibly":[94,173,206],"detected":[95,174,207],"often":[97],"counted":[98],"towards":[99],"overall":[101],"weighting":[106,255],"factor.":[107],"However,":[108],"actual":[111],"probability":[112,168,201,221,242],"pattern":[121],"taken":[124],"into":[125],"account,":[126],"this":[127,150],"lead":[129],"an":[131,233],"over-or":[132],"underestimation":[133],"their":[135],"real":[136,284],"coverage,":[138],"falsifying":[139],"results.":[142],"We":[143],"introduce":[144],"#SAT-based":[146],"characterization":[147],"algorithm":[148,156,195],"for":[149,158,169,182,202],"class":[151],"faults.":[153],"This":[154],"new":[155],"is,":[157],"first":[160],"able":[162],"accurately":[164,197],"compute":[165],"detection":[167,200,241],"marked":[171],"by":[175,252],"state-of-the-art":[176],"tools.":[178],"Our":[179],"experimental":[180],"results":[181,272],"largest":[184],"ITC'99":[185],"benchmarks":[186],"well":[188],"industrial-circuits":[191],"show":[192,238],"that":[193,213,239,269],"our":[194],"determine":[198],"most":[203],"also":[210],"identify":[211],"completely":[215],"untestable":[216],"found":[218],"100":[223],"%":[224],"irrespective":[225],"assignment":[228],"inputs":[231],"X":[234],"value.":[235],"Furthermore,":[236],"they":[237],"circuit-dependent":[244],"consequently":[246],"should":[247],"just":[249],"estimated":[251],"simple":[254],"factor":[256],"requires":[258],"in-depth":[261],"evaluation.":[262],"Otherwise,":[263],"risk":[268],"achieved":[271],"clearly":[274],"optimistic":[277],"pessimistic":[279],"regard":[281],"coverage.":[286]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}