{"id":"https://openalex.org/W2799221469","doi":"https://doi.org/10.23919/date.2018.8342035","title":"Trident: A comprehensive timing error resilient technique against choke points at NTC","display_name":"Trident: A comprehensive timing error resilient technique against choke points at NTC","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2799221469","doi":"https://doi.org/10.23919/date.2018.8342035","mag":"2799221469"},"language":"en","primary_location":{"id":"doi:10.23919/date.2018.8342035","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342035","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047332825","display_name":"Aatreyi Bal","orcid":"https://orcid.org/0000-0002-0649-1766"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Aatreyi Bal","raw_affiliation_strings":["Electrical and Computer Engineering, Utah State University"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Utah State University","institution_ids":["https://openalex.org/I121980950"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068885938","display_name":"Sanghamitra Roy","orcid":"https://orcid.org/0000-0002-3927-1612"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanghamitra Roy","raw_affiliation_strings":["Electrical and Computer Engineering, Utah State University"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Utah State University","institution_ids":["https://openalex.org/I121980950"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101594477","display_name":"Koushik Chakraborty","orcid":"https://orcid.org/0000-0003-0228-2737"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koushik Chakraborty","raw_affiliation_strings":["Electrical and Computer Engineering, Utah State University"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Utah State University","institution_ids":["https://openalex.org/I121980950"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5047332825"],"corresponding_institution_ids":["https://openalex.org/I121980950"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03374777,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"355","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/choke","display_name":"Choke","score":0.9950993061065674},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.633354902267456},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.625167965888977},{"id":"https://openalex.org/keywords/trident","display_name":"Trident","score":0.5860713124275208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5351555943489075},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5015015602111816},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.495658278465271},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.47576063871383667},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3578574061393738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.338994562625885},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3030328154563904},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16645431518554688},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1409866213798523},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1002034842967987}],"concepts":[{"id":"https://openalex.org/C29049376","wikidata":"https://www.wikidata.org/wiki/Q864746","display_name":"Choke","level":2,"score":0.9950993061065674},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.633354902267456},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.625167965888977},{"id":"https://openalex.org/C2777909563","wikidata":"https://www.wikidata.org/wiki/Q271628","display_name":"Trident","level":2,"score":0.5860713124275208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5351555943489075},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5015015602111816},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.495658278465271},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.47576063871383667},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3578574061393738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.338994562625885},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3030328154563904},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16645431518554688},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1409866213798523},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1002034842967987},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/date.2018.8342035","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342035","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalcommons.usu.edu:ece_facpub-1248","is_oa":false,"landing_page_url":"https://digitalcommons.usu.edu/ece_facpub/244","pdf_url":null,"source":{"id":"https://openalex.org/S4377196327","display_name":"Digital Commons - USU (Utah State University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I121980950","host_organization_name":"Utah State University","host_organization_lineage":["https://openalex.org/I121980950"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical and Computer Engineering Faculty Publications","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1999684621","https://openalex.org/W2050315555","https://openalex.org/W2059774354","https://openalex.org/W2068840304","https://openalex.org/W2081624924","https://openalex.org/W2103670614","https://openalex.org/W2103873102","https://openalex.org/W2135407913","https://openalex.org/W2150283124","https://openalex.org/W2160401437","https://openalex.org/W2166964417","https://openalex.org/W2178304595","https://openalex.org/W2582148560","https://openalex.org/W2613369427","https://openalex.org/W3147703296","https://openalex.org/W4229806106","https://openalex.org/W4234883153","https://openalex.org/W4236432903","https://openalex.org/W4237599521","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Near":[0],"Threshold":[1],"Computing":[2],"(NTC)":[3],"systems":[4],"have":[5],"been":[6],"inherently":[7],"plagued":[8],"with":[9,101],"heightened":[10],"process":[11],"variation":[12],"(PV)":[13],"sensitivity.":[14,24],"Choke":[15],"points":[16],"are":[17,60],"an":[18,41],"intriguing":[19],"manifestation":[20],"of":[21,32],"this":[22,26],"PV":[23],"In":[25],"paper,":[27],"we":[28,71],"explore":[29],"the":[30,49],"probability":[31],"minimum":[33,67],"timing":[34,56,68],"violations,":[35],"caused":[36],"by":[37],"choke":[38,64,81],"points,":[39,82],"in":[40,62],"NTC":[42],"system":[43,50],"and,":[44],"their":[45],"non-trivial":[46],"impacts":[47],"on":[48],"reliability.":[51],"We":[52],"show":[53],"that":[54],"conventional":[55],"error":[57,75],"mitigation":[58,76],"techniques":[59],"inefficient":[61],"tackling":[63],"point":[65],"induced":[66],"violations.":[69],"Consequently,":[70],"propose":[72],"a":[73,87,92],"comprehensive":[74],"technique,":[77],"Trident,":[78],"to":[79],"tackle":[80],"at":[83,99],"NTC.":[84],"Trident":[85],"offers":[86],"1.37x":[88],"performance":[89],"improvement":[90],"and":[91],"1.1x":[93],"energy":[94],"efficiency":[95],"gain":[96],"over":[97],"Razor":[98],"NTC,":[100],"minimal":[102],"overheads.":[103]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}