{"id":"https://openalex.org/W2798490538","doi":"https://doi.org/10.23919/date.2018.8342022","title":"Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling","display_name":"Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2798490538","doi":"https://doi.org/10.23919/date.2018.8342022","mag":"2798490538"},"language":"en","primary_location":{"id":"doi:10.23919/date.2018.8342022","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342022","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012265083","display_name":"Mahroo Zandrahimi","orcid":"https://orcid.org/0000-0003-2496-6320"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Mahroo Zandrahimi","raw_affiliation_strings":["Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084340774","display_name":"Philippe Debaud","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Debaud","raw_affiliation_strings":["STMicroelectronics, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049770924","display_name":"Armand Castillejo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Armand Castillejo","raw_affiliation_strings":["STMicroelectronics, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021955713","display_name":"Zaid Al-Ars","orcid":"https://orcid.org/0000-0001-7670-8572"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Zaid Al-Ars","raw_affiliation_strings":["Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5012265083"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04473234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"289","last_page":"292"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6598023176193237},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6156133413314819},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6129893064498901},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5927303433418274},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5783279538154602},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.570214033126831},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4715818464756012},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32939887046813965},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1784936785697937},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11113488674163818},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10981497168540955}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6598023176193237},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6156133413314819},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6129893064498901},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5927303433418274},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5783279538154602},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.570214033126831},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4715818464756012},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32939887046813965},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1784936785697937},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11113488674163818},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10981497168540955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2018.8342022","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2018.8342022","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W246882494","https://openalex.org/W1977294468","https://openalex.org/W2036326004","https://openalex.org/W2061747074","https://openalex.org/W2079706534","https://openalex.org/W2095179792","https://openalex.org/W2095269804","https://openalex.org/W2097718610","https://openalex.org/W2114883494","https://openalex.org/W2133079932","https://openalex.org/W2143165581","https://openalex.org/W2163897659","https://openalex.org/W2167729301","https://openalex.org/W2345949743","https://openalex.org/W2397038956","https://openalex.org/W2419095497","https://openalex.org/W2615041942","https://openalex.org/W2788886401","https://openalex.org/W4235643797","https://openalex.org/W6670518604","https://openalex.org/W6683855316","https://openalex.org/W6684363790","https://openalex.org/W6717403170"],"related_works":["https://openalex.org/W141820298","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W4378770497","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2910573937","https://openalex.org/W4385571583","https://openalex.org/W4389519396","https://openalex.org/W2113438243"],"abstract_inverted_index":{"Adaptive":[0],"voltage":[1,99,146],"scaling":[2],"(AVS)":[3],"has":[4],"been":[5],"used":[6],"widely":[7],"to":[8,62,88],"compensate":[9],"for":[10,92,140,159],"process,":[11],"voltage,":[12],"and":[13,50,65],"temperature":[14],"variations":[15],"as":[16,18,40,125,127],"well":[17],"power":[19,151],"optimization":[20],"of":[21,98,106,142,161],"integrated":[22],"circuits.":[23],"The":[24,101,129],"current":[25],"industrial":[26],"state-of-the-art":[27],"AVS":[28,114],"approaches":[29,47],"using":[30,80,104,115],"Process":[31],"Monitoring":[32],"Boxes":[33],"(PMBs)":[34],"have":[35],"shown":[36],"several":[37],"limitations":[38],"such":[39],"huge":[41],"characterization":[42],"effort,":[43],"which":[44,59,85,148],"makes":[45],"these":[46],"very":[48],"expensive,":[49],"a":[51],"low":[52,126],"accuracy":[53,97],"that":[54,113,133,162],"results":[55,121,149],"in":[56,72,122,145,150],"extra":[57],"margins,":[58],"consequently":[60],"lead":[61],"yield":[63],"loss":[64],"performance":[66],"limitations.":[67],"To":[68],"overcome":[69],"those":[70],"limitations,":[71],"this":[73],"paper":[74,102,130],"we":[75],"propose":[76],"an":[77,123],"alternative":[78],"solution":[79],"transition":[81,116],"fault":[82,117],"test":[83],"patterns,":[84],"is":[86],"able":[87],"eliminate":[89],"the":[90,96,134,143,154],"need":[91],"PMBs,":[93],"while":[94,153],"improving":[95],"estimation.":[100],"shows,":[103],"simulation":[105],"ISCAS'99":[107],"benchmarks":[108],"with":[109],"28nm":[110],"FD-SOI":[111],"library,":[112],"testing":[118],"(TF-based":[119],"AVS)":[120],"error":[124],"5.33%.":[128],"also":[131],"shows":[132],"PMB":[135],"approach":[136,156],"can":[137,157],"only":[138],"account":[139,158],"85%":[141],"uncertainty":[144],"measurements,":[147],"waste,":[152],"TF-based":[155],"99%":[160],"uncertainty.":[163]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}