{"id":"https://openalex.org/W2613996477","doi":"https://doi.org/10.23919/date.2017.7927131","title":"Nonvolatile processors: Why is it trending?","display_name":"Nonvolatile processors: Why is it trending?","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2613996477","doi":"https://doi.org/10.23919/date.2017.7927131","mag":"2613996477"},"language":"en","primary_location":{"id":"doi:10.23919/date.2017.7927131","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE), 2017","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101419036","display_name":"Fang Su","orcid":"https://orcid.org/0000-0001-5897-7998"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fang Su","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science and Technology (TNList)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science and Technology (TNList)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006570986","display_name":"Kaisheng Ma","orcid":"https://orcid.org/0000-0001-9226-3366"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaisheng Ma","raw_affiliation_strings":["The Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100764674","display_name":"Xueqing Li","orcid":"https://orcid.org/0000-0002-8051-3345"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xueqing Li","raw_affiliation_strings":["The Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070455837","display_name":"Tongda Wu","orcid":"https://orcid.org/0000-0003-1339-884X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tongda Wu","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science and Technology (TNList)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science and Technology (TNList)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045721867","display_name":"Yongpan Liu","orcid":"https://orcid.org/0000-0002-4892-2309"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yongpan Liu","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science and Technology (TNList)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science and Technology (TNList)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101919131","display_name":"Vijaykrishnan Narayanan","orcid":"https://orcid.org/0000-0001-6266-6068"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijaykrishnan Narayanan","raw_affiliation_strings":["The Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"966","last_page":"971"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7151363492012024},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7081689834594727},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.6364248394966125},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.59971684217453},{"id":"https://openalex.org/keywords/power-budget","display_name":"Power budget","score":0.543434739112854},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5384952425956726},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5319752097129822},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5112705230712891},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5085417032241821},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.47955843806266785},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.47003692388534546},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.44820621609687805},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4250166714191437},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.42465198040008545},{"id":"https://openalex.org/keywords/edge-device","display_name":"Edge device","score":0.41288474202156067},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3093419075012207},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2342502474784851},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17308610677719116},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15158343315124512},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.14553064107894897},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1419561505317688},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.1392720639705658},{"id":"https://openalex.org/keywords/cloud-computing","display_name":"Cloud computing","score":0.07798489928245544}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7151363492012024},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7081689834594727},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.6364248394966125},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.59971684217453},{"id":"https://openalex.org/C149768029","wikidata":"https://www.wikidata.org/wiki/Q1509342","display_name":"Power budget","level":4,"score":0.543434739112854},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5384952425956726},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5319752097129822},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5112705230712891},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5085417032241821},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.47955843806266785},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.47003692388534546},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.44820621609687805},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4250166714191437},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.42465198040008545},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.41288474202156067},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3093419075012207},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2342502474784851},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17308610677719116},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15158343315124512},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.14553064107894897},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1419561505317688},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.1392720639705658},{"id":"https://openalex.org/C79974875","wikidata":"https://www.wikidata.org/wiki/Q483639","display_name":"Cloud computing","level":2,"score":0.07798489928245544},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2017.7927131","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE), 2017","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8399999737739563}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W1563362697","https://openalex.org/W1598995842","https://openalex.org/W1930556231","https://openalex.org/W1964376276","https://openalex.org/W1966939297","https://openalex.org/W1970987019","https://openalex.org/W1972848977","https://openalex.org/W1998549161","https://openalex.org/W2004823737","https://openalex.org/W2009053018","https://openalex.org/W2016599619","https://openalex.org/W2016922062","https://openalex.org/W2019240782","https://openalex.org/W2024335183","https://openalex.org/W2025674646","https://openalex.org/W2048187540","https://openalex.org/W2051108935","https://openalex.org/W2059833876","https://openalex.org/W2063457354","https://openalex.org/W2074616074","https://openalex.org/W2075490291","https://openalex.org/W2081768052","https://openalex.org/W2086892761","https://openalex.org/W2088209560","https://openalex.org/W2088846964","https://openalex.org/W2094860564","https://openalex.org/W2102570074","https://openalex.org/W2105103777","https://openalex.org/W2108395864","https://openalex.org/W2110276925","https://openalex.org/W2111619626","https://openalex.org/W2113825280","https://openalex.org/W2121497251","https://openalex.org/W2124516187","https://openalex.org/W2129589778","https://openalex.org/W2144292363","https://openalex.org/W2150049803","https://openalex.org/W2151603769","https://openalex.org/W2162289027","https://openalex.org/W2180460518","https://openalex.org/W2284880819","https://openalex.org/W2290702954","https://openalex.org/W2292257019","https://openalex.org/W2293090515","https://openalex.org/W2339472167","https://openalex.org/W2340265561","https://openalex.org/W2404199137","https://openalex.org/W2433248078","https://openalex.org/W2436300686","https://openalex.org/W2515432102","https://openalex.org/W2526202524","https://openalex.org/W2540107796","https://openalex.org/W2542222318","https://openalex.org/W2548301520","https://openalex.org/W2555030058","https://openalex.org/W2555486667","https://openalex.org/W4235860902","https://openalex.org/W4244040908","https://openalex.org/W4247880795","https://openalex.org/W4248413383","https://openalex.org/W6662239458","https://openalex.org/W6681253812","https://openalex.org/W6696777881","https://openalex.org/W6730343916"],"related_works":["https://openalex.org/W4311097251","https://openalex.org/W3014521742","https://openalex.org/W2625093826","https://openalex.org/W2921026492","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4361251261","https://openalex.org/W3031181660","https://openalex.org/W4306968100","https://openalex.org/W4285201139"],"abstract_inverted_index":{"Energy":[0],"harvesting":[1],"has":[2],"become":[3],"a":[4,60],"promising":[5],"solution":[6],"to":[7,48,76],"power":[8,18,54],"up":[9],"Internet-of-Things":[10],"(IoT)":[11],"devices.":[12,69],"In":[13,70],"this":[14,71,104],"scenario,":[15],"the":[16,39,46,64,77,80,92],"constrained":[17],"budget":[19],"and":[20,30,82,96],"frequent":[21],"absence":[22],"of":[23,41,63,79,94],"ambient":[24],"energy":[25],"cause":[26],"severe":[27],"reliability":[28],"issues":[29],"performance":[31,93],"degradation":[32],"on":[33,90],"conventional":[34],"CMOS":[35],"computing":[36],"circuits.":[37],"Fortunately,":[38],"advent":[40],"nonvolatile":[42],"processor":[43],"(NVP)":[44],"opens":[45],"possibility":[47],"compute":[49],"continuously":[50],"using":[51],"an":[52],"intermittent":[53],"supply.":[55],"It":[56],"is":[57],"considered":[58],"as":[59],"key":[61],"component":[62],"next":[65],"generation":[66],"IoT":[67],"edge":[68],"work,":[72],"we":[73],"provide":[74],"insights":[75],"evolution":[78],"NVP":[81,95],"its":[83],"application":[84],"in":[85,103],"real":[86],"world":[87],"scenarios.":[88],"Efforts":[89],"improving":[91],"future":[97],"research":[98],"prospects":[99],"are":[100],"also":[101],"discussed":[102],"paper.":[105]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}
